Search

Jimmy Nguyen

Examiner (ID: 7143)

Most Active Art Unit
2829
Art Unit(s)
2858, 2829
Total Applications
440
Issued Applications
398
Pending Applications
9
Abandoned Applications
33

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4415752 [patent_doc_number] => 06229325 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-05-08 [patent_title] => 'Method and apparatus for burn-in and test of field emission displays' [patent_app_type] => 1 [patent_app_number] => 9/258265 [patent_app_country] => US [patent_app_date] => 1999-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 4612 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/229/06229325.pdf [firstpage_image] =>[orig_patent_app_number] => 258265 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/258265
Method and apparatus for burn-in and test of field emission displays Feb 25, 1999 Issued
Array ( [id] => 4368070 [patent_doc_number] => 06255828 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-03 [patent_title] => 'Interface for cable testing' [patent_app_type] => 1 [patent_app_number] => 9/253553 [patent_app_country] => US [patent_app_date] => 1999-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 13 [patent_no_of_words] => 4108 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/255/06255828.pdf [firstpage_image] =>[orig_patent_app_number] => 253553 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/253553
Interface for cable testing Feb 18, 1999 Issued
Array ( [id] => 4389939 [patent_doc_number] => 06278284 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-21 [patent_title] => 'Testing IC socket' [patent_app_type] => 1 [patent_app_number] => 9/250260 [patent_app_country] => US [patent_app_date] => 1999-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 20 [patent_no_of_words] => 5166 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/278/06278284.pdf [firstpage_image] =>[orig_patent_app_number] => 250260 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/250260
Testing IC socket Feb 15, 1999 Issued
Array ( [id] => 7635931 [patent_doc_number] => 06380729 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-30 [patent_title] => 'Testing integrated circuit dice' [patent_app_type] => B1 [patent_app_number] => 09/251269 [patent_app_country] => US [patent_app_date] => 1999-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 14300 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 13 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/380/06380729.pdf [firstpage_image] =>[orig_patent_app_number] => 09251269 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/251269
Testing integrated circuit dice Feb 15, 1999 Issued
Array ( [id] => 4414817 [patent_doc_number] => 06300765 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-09 [patent_title] => 'System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances' [patent_app_type] => 1 [patent_app_number] => 9/246469 [patent_app_country] => US [patent_app_date] => 1999-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4376 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/300/06300765.pdf [firstpage_image] =>[orig_patent_app_number] => 246469 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/246469
System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances Feb 8, 1999 Issued
Array ( [id] => 1537466 [patent_doc_number] => 06337577 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-01-08 [patent_title] => 'Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources' [patent_app_type] => B1 [patent_app_number] => 09/244373 [patent_app_country] => US [patent_app_date] => 1999-02-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 18 [patent_no_of_words] => 6852 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/337/06337577.pdf [firstpage_image] =>[orig_patent_app_number] => 09244373 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/244373
Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources Feb 3, 1999 Issued
Array ( [id] => 4191419 [patent_doc_number] => 06150833 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-21 [patent_title] => 'LCD panel power-up test fixture and method of using' [patent_app_type] => 1 [patent_app_number] => 9/243952 [patent_app_country] => US [patent_app_date] => 1999-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 20 [patent_no_of_words] => 6192 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/150/06150833.pdf [firstpage_image] =>[orig_patent_app_number] => 243952 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/243952
LCD panel power-up test fixture and method of using Feb 2, 1999 Issued
Array ( [id] => 4280038 [patent_doc_number] => 06323669 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-27 [patent_title] => 'Apparatus and method for a contact test between an integrated circuit device an a socket' [patent_app_type] => 1 [patent_app_number] => 9/241659 [patent_app_country] => US [patent_app_date] => 1999-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2983 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 164 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/323/06323669.pdf [firstpage_image] =>[orig_patent_app_number] => 241659 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/241659
Apparatus and method for a contact test between an integrated circuit device an a socket Feb 1, 1999 Issued
Array ( [id] => 4366756 [patent_doc_number] => 06191604 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-20 [patent_title] => 'Integrated circuit testing device' [patent_app_type] => 1 [patent_app_number] => 9/238172 [patent_app_country] => US [patent_app_date] => 1999-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 7776 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/191/06191604.pdf [firstpage_image] =>[orig_patent_app_number] => 238172 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/238172
Integrated circuit testing device Jan 27, 1999 Issued
Array ( [id] => 6029481 [patent_doc_number] => 20020017916 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-02-14 [patent_title] => 'TERMPERATURE-CONTROLLED SEMICONDUCTOR WAFER CHUCK SYSTEM' [patent_app_type] => new [patent_app_number] => 09/238009 [patent_app_country] => US [patent_app_date] => 1999-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 8677 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0017/20020017916.pdf [firstpage_image] =>[orig_patent_app_number] => 09238009 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/238009
Temperature-controlled semiconductor wafer chuck system Jan 25, 1999 Issued
Array ( [id] => 1448564 [patent_doc_number] => 06369590 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-09 [patent_title] => 'Apparatus and method using photoelectric effect for testing electrical traces' [patent_app_type] => B1 [patent_app_number] => 09/231410 [patent_app_country] => US [patent_app_date] => 1999-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1731 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/369/06369590.pdf [firstpage_image] =>[orig_patent_app_number] => 09231410 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/231410
Apparatus and method using photoelectric effect for testing electrical traces Jan 13, 1999 Issued
Array ( [id] => 4164804 [patent_doc_number] => 06114848 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-09-05 [patent_title] => 'Direct-measurement provision of safe backdrive levels' [patent_app_type] => 1 [patent_app_number] => 9/231001 [patent_app_country] => US [patent_app_date] => 1999-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4935 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 276 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/114/06114848.pdf [firstpage_image] =>[orig_patent_app_number] => 231001 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/231001
Direct-measurement provision of safe backdrive levels Jan 13, 1999 Issued
Array ( [id] => 4403024 [patent_doc_number] => 06297657 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-02 [patent_title] => 'Temperature compensated vertical pin probing device' [patent_app_type] => 1 [patent_app_number] => 9/228016 [patent_app_country] => US [patent_app_date] => 1999-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 3308 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/297/06297657.pdf [firstpage_image] =>[orig_patent_app_number] => 228016 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/228016
Temperature compensated vertical pin probing device Jan 10, 1999 Issued
Array ( [id] => 4091149 [patent_doc_number] => 06163162 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-19 [patent_title] => 'Temperature compensated vertical pin probing device' [patent_app_type] => 1 [patent_app_number] => 9/228017 [patent_app_country] => US [patent_app_date] => 1999-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 2675 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 213 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/163/06163162.pdf [firstpage_image] =>[orig_patent_app_number] => 228017 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/228017
Temperature compensated vertical pin probing device Jan 10, 1999 Issued
Array ( [id] => 4412554 [patent_doc_number] => 06232787 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-05-15 [patent_title] => 'Microstructure defect detection' [patent_app_type] => 1 [patent_app_number] => 9/226962 [patent_app_country] => US [patent_app_date] => 1999-01-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 8861 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/232/06232787.pdf [firstpage_image] =>[orig_patent_app_number] => 226962 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/226962
Microstructure defect detection Jan 7, 1999 Issued
Array ( [id] => 4346276 [patent_doc_number] => 06333879 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-12-25 [patent_title] => 'Semiconductor device operable in a plurality of test operation modes' [patent_app_type] => 1 [patent_app_number] => 9/226155 [patent_app_country] => US [patent_app_date] => 1999-01-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 39 [patent_no_of_words] => 16182 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/333/06333879.pdf [firstpage_image] =>[orig_patent_app_number] => 226155 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/226155
Semiconductor device operable in a plurality of test operation modes Jan 6, 1999 Issued
Array ( [id] => 4096520 [patent_doc_number] => 06133727 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-17 [patent_title] => 'Method for verifying semiconductor device tester' [patent_app_type] => 1 [patent_app_number] => 9/225614 [patent_app_country] => US [patent_app_date] => 1999-01-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 1 [patent_no_of_words] => 3263 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/133/06133727.pdf [firstpage_image] =>[orig_patent_app_number] => 225614 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/225614
Method for verifying semiconductor device tester Jan 4, 1999 Issued
Array ( [id] => 4302325 [patent_doc_number] => 06181153 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-30 [patent_title] => 'Method and system for detecting faults in a flip-chip package' [patent_app_type] => 1 [patent_app_number] => 9/225174 [patent_app_country] => US [patent_app_date] => 1999-01-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3192 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/181/06181153.pdf [firstpage_image] =>[orig_patent_app_number] => 225174 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/225174
Method and system for detecting faults in a flip-chip package Jan 3, 1999 Issued
Array ( [id] => 1448573 [patent_doc_number] => 06369594 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-09 [patent_title] => 'Test clip for electrical testing of an electronic component' [patent_app_type] => B1 [patent_app_number] => 09/224969 [patent_app_country] => US [patent_app_date] => 1999-01-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 4340 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/369/06369594.pdf [firstpage_image] =>[orig_patent_app_number] => 09224969 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/224969
Test clip for electrical testing of an electronic component Jan 3, 1999 Issued
Array ( [id] => 1452877 [patent_doc_number] => 06456099 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-09-24 [patent_title] => 'Special contact points for accessing internal circuitry of an integrated circuit' [patent_app_type] => B1 [patent_app_number] => 09/224169 [patent_app_country] => US [patent_app_date] => 1998-12-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 34 [patent_no_of_words] => 9652 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 174 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/456/06456099.pdf [firstpage_image] =>[orig_patent_app_number] => 09224169 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/224169
Special contact points for accessing internal circuitry of an integrated circuit Dec 30, 1998 Issued
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