Search

John A. Rivell

Examiner (ID: 3565)

Most Active Art Unit
3753
Art Unit(s)
3407, 2899, 3401, 3727, 3753
Total Applications
3262
Issued Applications
2624
Pending Applications
168
Abandoned Applications
470

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18989046 [patent_doc_number] => 20240061015 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-22 [patent_title] => LOW PROFILE ELECTRONIC TESTING SYSTEM WITH FLEXIBLE TEST PCB FORMAT [patent_app_type] => utility [patent_app_number] => 18/451962 [patent_app_country] => US [patent_app_date] => 2023-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11827 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -32 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18451962 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/451962
LOW PROFILE ELECTRONIC TESTING SYSTEM WITH FLEXIBLE TEST PCB FORMAT Aug 17, 2023 Pending
Array ( [id] => 20549856 [patent_doc_number] => 12560642 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-02-24 [patent_title] => System and method for testing optical receivers [patent_app_type] => utility [patent_app_number] => 18/227127 [patent_app_country] => US [patent_app_date] => 2023-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3439 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 251 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18227127 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/227127
System and method for testing optical receivers Jul 26, 2023 Issued
Array ( [id] => 19685227 [patent_doc_number] => 20250003772 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-02 [patent_title] => LOW POWER CAPACITOR SENSOR ARRAY [patent_app_type] => utility [patent_app_number] => 18/350043 [patent_app_country] => US [patent_app_date] => 2023-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7186 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 435 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18350043 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/350043
Low power capacitor sensor array Jul 10, 2023 Issued
Array ( [id] => 19481037 [patent_doc_number] => 20240329079 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-03 [patent_title] => TEST FIXTURE AND EARLY WARNING SYSTEM [patent_app_type] => utility [patent_app_number] => 18/213857 [patent_app_country] => US [patent_app_date] => 2023-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6127 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18213857 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/213857
TEST FIXTURE AND EARLY WARNING SYSTEM Jun 24, 2023 Pending
Array ( [id] => 18940933 [patent_doc_number] => 20240036072 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-01 [patent_title] => TEST PROBES AND TEST SOCKET FOR USE WITH THE SAME [patent_app_type] => utility [patent_app_number] => 18/212927 [patent_app_country] => US [patent_app_date] => 2023-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4938 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 192 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18212927 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/212927
TEST PROBES AND TEST SOCKET FOR USE WITH THE SAME Jun 21, 2023 Pending
Array ( [id] => 20017270 [patent_doc_number] => 20250155492 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-05-15 [patent_title] => MULTI-WAFER INSPECTION SYSTEM [patent_app_type] => utility [patent_app_number] => 18/834044 [patent_app_country] => US [patent_app_date] => 2023-06-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8149 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18834044 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/834044
MULTI-WAFER INSPECTION SYSTEM Jun 15, 2023 Pending
Array ( [id] => 18818855 [patent_doc_number] => 20230393195 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-07 [patent_title] => Terahertz Plasmonics for Testing Very Large-Scale Integrated Circuits under Bias [patent_app_type] => utility [patent_app_number] => 18/207701 [patent_app_country] => US [patent_app_date] => 2023-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5957 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18207701 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/207701
Terahertz plasmonics for testing very large-scale integrated circuits under bias Jun 8, 2023 Issued
Array ( [id] => 18818834 [patent_doc_number] => 20230393174 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-07 [patent_title] => Abbreviated Loopback Attenuation [patent_app_type] => utility [patent_app_number] => 18/205735 [patent_app_country] => US [patent_app_date] => 2023-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2232 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18205735 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/205735
Abbreviated Loopback Attenuation Jun 4, 2023 Pending
Array ( [id] => 20358383 [patent_doc_number] => 12474374 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-11-18 [patent_title] => Probe head and vertical probe card comprising the same [patent_app_type] => utility [patent_app_number] => 18/203898 [patent_app_country] => US [patent_app_date] => 2023-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 0 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 251 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18203898 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/203898
Probe head and vertical probe card comprising the same May 30, 2023 Issued
Array ( [id] => 19573142 [patent_doc_number] => 20240377434 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-14 [patent_title] => MEMS PROBE MODULE STRUCTURE [patent_app_type] => utility [patent_app_number] => 18/196665 [patent_app_country] => US [patent_app_date] => 2023-05-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2455 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -4 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18196665 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/196665
MEMS PROBE MODULE STRUCTURE May 11, 2023 Pending
Array ( [id] => 18755351 [patent_doc_number] => 20230358784 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-09 [patent_title] => METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 18/312604 [patent_app_country] => US [patent_app_date] => 2023-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4760 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18312604 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/312604
METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE May 4, 2023 Pending
Array ( [id] => 20439730 [patent_doc_number] => 12510563 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-12-30 [patent_title] => Pogo pin cooling system and electronic device testing apparatus having the system [patent_app_type] => utility [patent_app_number] => 18/307866 [patent_app_country] => US [patent_app_date] => 2023-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 11 [patent_no_of_words] => 0 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 357 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18307866 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/307866
Pogo pin cooling system and electronic device testing apparatus having the system Apr 26, 2023 Issued
Array ( [id] => 18553304 [patent_doc_number] => 20230251316 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-10 [patent_title] => BATTERY PROBE SET [patent_app_type] => utility [patent_app_number] => 18/137706 [patent_app_country] => US [patent_app_date] => 2023-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5522 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18137706 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/137706
Battery probe set Apr 20, 2023 Issued
Array ( [id] => 18538763 [patent_doc_number] => 20230243869 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-03 [patent_title] => SYSTEM AND METHOD FOR ATTENUATING AND/OR TERMINATING RF CIRCUIT [patent_app_type] => utility [patent_app_number] => 18/132238 [patent_app_country] => US [patent_app_date] => 2023-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3839 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18132238 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/132238
System and method for attenuating and/or terminating RF circuit Apr 6, 2023 Issued
Array ( [id] => 18740967 [patent_doc_number] => 20230349947 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-02 [patent_title] => PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES [patent_app_type] => utility [patent_app_number] => 18/295728 [patent_app_country] => US [patent_app_date] => 2023-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 40920 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 399 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295728 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/295728
PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES Apr 3, 2023 Abandoned
Array ( [id] => 18538764 [patent_doc_number] => 20230243870 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-03 [patent_title] => PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES [patent_app_type] => utility [patent_app_number] => 18/295712 [patent_app_country] => US [patent_app_date] => 2023-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 40959 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 404 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295712 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/295712
PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES Apr 3, 2023 Abandoned
Array ( [id] => 18676849 [patent_doc_number] => 20230314482 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-05 [patent_title] => Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes [patent_app_type] => utility [patent_app_number] => 18/295738 [patent_app_country] => US [patent_app_date] => 2023-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 40376 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 493 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295738 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/295738
Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes Apr 3, 2023 Abandoned
Array ( [id] => 18676841 [patent_doc_number] => 20230314474 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-05 [patent_title] => PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES [patent_app_type] => utility [patent_app_number] => 18/295755 [patent_app_country] => US [patent_app_date] => 2023-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 43745 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -23 [patent_words_short_claim] => 296 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295755 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/295755
PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES Apr 3, 2023 Abandoned
Array ( [id] => 18755352 [patent_doc_number] => 20230358785 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-09 [patent_title] => PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES [patent_app_type] => utility [patent_app_number] => 18/295716 [patent_app_country] => US [patent_app_date] => 2023-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 40941 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -23 [patent_words_short_claim] => 404 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295716 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/295716
PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES Apr 3, 2023 Abandoned
Array ( [id] => 18538765 [patent_doc_number] => 20230243871 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-03 [patent_title] => PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES [patent_app_type] => utility [patent_app_number] => 18/295721 [patent_app_country] => US [patent_app_date] => 2023-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 41604 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 398 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295721 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/295721
PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES Apr 3, 2023 Abandoned
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