
John A. Rivell
Examiner (ID: 3565)
| Most Active Art Unit | 3753 |
| Art Unit(s) | 3407, 2899, 3401, 3727, 3753 |
| Total Applications | 3262 |
| Issued Applications | 2624 |
| Pending Applications | 168 |
| Abandoned Applications | 470 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 18989046
[patent_doc_number] => 20240061015
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-02-22
[patent_title] => LOW PROFILE ELECTRONIC TESTING SYSTEM WITH FLEXIBLE TEST PCB FORMAT
[patent_app_type] => utility
[patent_app_number] => 18/451962
[patent_app_country] => US
[patent_app_date] => 2023-08-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 11827
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -32
[patent_words_short_claim] => 110
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18451962
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/451962 | LOW PROFILE ELECTRONIC TESTING SYSTEM WITH FLEXIBLE TEST PCB FORMAT | Aug 17, 2023 | Pending |
Array
(
[id] => 20549856
[patent_doc_number] => 12560642
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2026-02-24
[patent_title] => System and method for testing optical receivers
[patent_app_type] => utility
[patent_app_number] => 18/227127
[patent_app_country] => US
[patent_app_date] => 2023-07-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 3439
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 251
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18227127
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/227127 | System and method for testing optical receivers | Jul 26, 2023 | Issued |
Array
(
[id] => 19685227
[patent_doc_number] => 20250003772
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-01-02
[patent_title] => LOW POWER CAPACITOR SENSOR ARRAY
[patent_app_type] => utility
[patent_app_number] => 18/350043
[patent_app_country] => US
[patent_app_date] => 2023-07-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7186
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 435
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18350043
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/350043 | Low power capacitor sensor array | Jul 10, 2023 | Issued |
Array
(
[id] => 19481037
[patent_doc_number] => 20240329079
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-03
[patent_title] => TEST FIXTURE AND EARLY WARNING SYSTEM
[patent_app_type] => utility
[patent_app_number] => 18/213857
[patent_app_country] => US
[patent_app_date] => 2023-06-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6127
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 68
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18213857
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/213857 | TEST FIXTURE AND EARLY WARNING SYSTEM | Jun 24, 2023 | Pending |
Array
(
[id] => 18940933
[patent_doc_number] => 20240036072
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-02-01
[patent_title] => TEST PROBES AND TEST SOCKET FOR USE WITH THE SAME
[patent_app_type] => utility
[patent_app_number] => 18/212927
[patent_app_country] => US
[patent_app_date] => 2023-06-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4938
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -11
[patent_words_short_claim] => 192
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18212927
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/212927 | TEST PROBES AND TEST SOCKET FOR USE WITH THE SAME | Jun 21, 2023 | Pending |
Array
(
[id] => 20017270
[patent_doc_number] => 20250155492
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-05-15
[patent_title] => MULTI-WAFER INSPECTION SYSTEM
[patent_app_type] => utility
[patent_app_number] => 18/834044
[patent_app_country] => US
[patent_app_date] => 2023-06-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8149
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 125
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18834044
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/834044 | MULTI-WAFER INSPECTION SYSTEM | Jun 15, 2023 | Pending |
Array
(
[id] => 18818855
[patent_doc_number] => 20230393195
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-12-07
[patent_title] => Terahertz Plasmonics for Testing Very Large-Scale Integrated Circuits under Bias
[patent_app_type] => utility
[patent_app_number] => 18/207701
[patent_app_country] => US
[patent_app_date] => 2023-06-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5957
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -19
[patent_words_short_claim] => 81
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18207701
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/207701 | Terahertz plasmonics for testing very large-scale integrated circuits under bias | Jun 8, 2023 | Issued |
Array
(
[id] => 18818834
[patent_doc_number] => 20230393174
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-12-07
[patent_title] => Abbreviated Loopback Attenuation
[patent_app_type] => utility
[patent_app_number] => 18/205735
[patent_app_country] => US
[patent_app_date] => 2023-06-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2232
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -13
[patent_words_short_claim] => 99
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18205735
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/205735 | Abbreviated Loopback Attenuation | Jun 4, 2023 | Pending |
Array
(
[id] => 20358383
[patent_doc_number] => 12474374
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-11-18
[patent_title] => Probe head and vertical probe card comprising the same
[patent_app_type] => utility
[patent_app_number] => 18/203898
[patent_app_country] => US
[patent_app_date] => 2023-05-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 10
[patent_no_of_words] => 0
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 251
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18203898
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/203898 | Probe head and vertical probe card comprising the same | May 30, 2023 | Issued |
Array
(
[id] => 19573142
[patent_doc_number] => 20240377434
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-11-14
[patent_title] => MEMS PROBE MODULE STRUCTURE
[patent_app_type] => utility
[patent_app_number] => 18/196665
[patent_app_country] => US
[patent_app_date] => 2023-05-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2455
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -4
[patent_words_short_claim] => 151
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18196665
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/196665 | MEMS PROBE MODULE STRUCTURE | May 11, 2023 | Pending |
Array
(
[id] => 18755351
[patent_doc_number] => 20230358784
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-11-09
[patent_title] => METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE
[patent_app_type] => utility
[patent_app_number] => 18/312604
[patent_app_country] => US
[patent_app_date] => 2023-05-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4760
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -16
[patent_words_short_claim] => 165
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18312604
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/312604 | METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE | May 4, 2023 | Pending |
Array
(
[id] => 20439730
[patent_doc_number] => 12510563
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-12-30
[patent_title] => Pogo pin cooling system and electronic device testing apparatus having the system
[patent_app_type] => utility
[patent_app_number] => 18/307866
[patent_app_country] => US
[patent_app_date] => 2023-04-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 11
[patent_no_of_words] => 0
[patent_no_of_claims] => 1
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 357
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18307866
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/307866 | Pogo pin cooling system and electronic device testing apparatus having the system | Apr 26, 2023 | Issued |
Array
(
[id] => 18553304
[patent_doc_number] => 20230251316
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-08-10
[patent_title] => BATTERY PROBE SET
[patent_app_type] => utility
[patent_app_number] => 18/137706
[patent_app_country] => US
[patent_app_date] => 2023-04-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5522
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18137706
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/137706 | Battery probe set | Apr 20, 2023 | Issued |
Array
(
[id] => 18538763
[patent_doc_number] => 20230243869
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-08-03
[patent_title] => SYSTEM AND METHOD FOR ATTENUATING AND/OR TERMINATING RF CIRCUIT
[patent_app_type] => utility
[patent_app_number] => 18/132238
[patent_app_country] => US
[patent_app_date] => 2023-04-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3839
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -15
[patent_words_short_claim] => 51
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18132238
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/132238 | System and method for attenuating and/or terminating RF circuit | Apr 6, 2023 | Issued |
Array
(
[id] => 18740967
[patent_doc_number] => 20230349947
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-11-02
[patent_title] => PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES
[patent_app_type] => utility
[patent_app_number] => 18/295728
[patent_app_country] => US
[patent_app_date] => 2023-04-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 40920
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -13
[patent_words_short_claim] => 399
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295728
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/295728 | PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES | Apr 3, 2023 | Abandoned |
Array
(
[id] => 18538764
[patent_doc_number] => 20230243870
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-08-03
[patent_title] => PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES
[patent_app_type] => utility
[patent_app_number] => 18/295712
[patent_app_country] => US
[patent_app_date] => 2023-04-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 40959
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 404
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295712
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/295712 | PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES | Apr 3, 2023 | Abandoned |
Array
(
[id] => 18676849
[patent_doc_number] => 20230314482
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-10-05
[patent_title] => Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes
[patent_app_type] => utility
[patent_app_number] => 18/295738
[patent_app_country] => US
[patent_app_date] => 2023-04-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 40376
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -15
[patent_words_short_claim] => 493
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295738
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/295738 | Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes | Apr 3, 2023 | Abandoned |
Array
(
[id] => 18676841
[patent_doc_number] => 20230314474
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-10-05
[patent_title] => PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES
[patent_app_type] => utility
[patent_app_number] => 18/295755
[patent_app_country] => US
[patent_app_date] => 2023-04-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 43745
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -23
[patent_words_short_claim] => 296
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295755
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/295755 | PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES | Apr 3, 2023 | Abandoned |
Array
(
[id] => 18755352
[patent_doc_number] => 20230358785
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-11-09
[patent_title] => PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES
[patent_app_type] => utility
[patent_app_number] => 18/295716
[patent_app_country] => US
[patent_app_date] => 2023-04-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 40941
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -23
[patent_words_short_claim] => 404
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295716
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/295716 | PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES | Apr 3, 2023 | Abandoned |
Array
(
[id] => 18538765
[patent_doc_number] => 20230243871
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-08-03
[patent_title] => PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES
[patent_app_type] => utility
[patent_app_number] => 18/295721
[patent_app_country] => US
[patent_app_date] => 2023-04-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 41604
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 398
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295721
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/295721 | PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES | Apr 3, 2023 | Abandoned |