Search

John A. Rivell

Examiner (ID: 3565)

Most Active Art Unit
3753
Art Unit(s)
3407, 2899, 3401, 3727, 3753
Total Applications
3262
Issued Applications
2624
Pending Applications
168
Abandoned Applications
470

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 11800740 [patent_doc_number] => 09541606 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-01-10 [patent_title] => 'Fault detection system and associated method' [patent_app_type] => utility [patent_app_number] => 13/716969 [patent_app_country] => US [patent_app_date] => 2012-12-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 4678 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 217 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13716969 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/716969
Fault detection system and associated method Dec 16, 2012 Issued
Array ( [id] => 9145927 [patent_doc_number] => 20130300450 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-11-14 [patent_title] => 'TEST DEVICE AND TEST SYSTEM OF SEMICONDUCTOR DEVICE AND TEST METHOD FOR TESTING SEMICONDUCTOR DEVICE' [patent_app_type] => utility [patent_app_number] => 13/716527 [patent_app_country] => US [patent_app_date] => 2012-12-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4743 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13716527 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/716527
Test device and test system of semiconductor device and test method for testing semiconductor device Dec 16, 2012 Issued
Array ( [id] => 10526068 [patent_doc_number] => 09252593 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-02-02 [patent_title] => 'Three dimensional integrated circuit electrostatic discharge protection and prevention test interface' [patent_app_type] => utility [patent_app_number] => 13/716272 [patent_app_country] => US [patent_app_date] => 2012-12-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 24 [patent_no_of_words] => 7547 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13716272 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/716272
Three dimensional integrated circuit electrostatic discharge protection and prevention test interface Dec 16, 2012 Issued
Array ( [id] => 8818967 [patent_doc_number] => 20130120012 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-05-16 [patent_title] => 'TESTING INTEGRATED CIRCUITS USING FEW TEST PROBES' [patent_app_type] => utility [patent_app_number] => 13/716018 [patent_app_country] => US [patent_app_date] => 2012-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 10272 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13716018 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/716018
Testing integrated circuits using few test probes Dec 13, 2012 Issued
Array ( [id] => 9533770 [patent_doc_number] => 20140158416 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-06-12 [patent_title] => 'ACTUATION MECHANISMS FOR ELECTRICAL INTERCONNECTIONS' [patent_app_type] => utility [patent_app_number] => 13/707032 [patent_app_country] => US [patent_app_date] => 2012-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3874 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13707032 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/707032
Actuation mechanisms for electrical interconnections Dec 5, 2012 Issued
Array ( [id] => 10461225 [patent_doc_number] => 20150346240 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-12-03 [patent_title] => 'ISOLATED AND SELF-CALIBRATING VOLTAGE MEASUREMENT SENSOR' [patent_app_type] => utility [patent_app_number] => 14/649816 [patent_app_country] => US [patent_app_date] => 2012-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 8293 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14649816 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/649816
Isolated and self-calibrating voltage measurement sensor Dec 4, 2012 Issued
Array ( [id] => 8777835 [patent_doc_number] => 20130099810 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-04-25 [patent_title] => 'Electrically Conductive Kelvin Contacts For Microcircuit Tester' [patent_app_type] => utility [patent_app_number] => 13/651116 [patent_app_country] => US [patent_app_date] => 2012-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 42 [patent_figures_cnt] => 42 [patent_no_of_words] => 16747 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13651116 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/651116
Electrically conductive Kelvin contacts for microcircuit tester Oct 11, 2012 Issued
Array ( [id] => 9381462 [patent_doc_number] => 20140084943 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-03-27 [patent_title] => 'STRAIN MONITORING SYSTEM AND APPARATUS' [patent_app_type] => utility [patent_app_number] => 13/624510 [patent_app_country] => US [patent_app_date] => 2012-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 11787 [patent_no_of_claims] => 54 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13624510 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/624510
STRAIN MONITORING SYSTEM AND APPARATUS Sep 20, 2012 Abandoned
Array ( [id] => 8635241 [patent_doc_number] => 20130027044 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-01-31 [patent_title] => 'IMAGING USING DIRECTIONAL RESISTIVITY MEASUREMENTS' [patent_app_type] => utility [patent_app_number] => 13/622905 [patent_app_country] => US [patent_app_date] => 2012-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 6057 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 18 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13622905 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/622905
Imaging using directional resistivity measurements Sep 18, 2012 Issued
Array ( [id] => 8564168 [patent_doc_number] => 20120326739 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-12-27 [patent_title] => 'SELF-ISOLATING MIXED DESIGN-RULE INTEGRATED YIELD MONITOR' [patent_app_type] => utility [patent_app_number] => 13/602741 [patent_app_country] => US [patent_app_date] => 2012-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5945 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13602741 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/602741
Self-isolating mixed design-rule integrated yield monitor Sep 3, 2012 Issued
Array ( [id] => 8500186 [patent_doc_number] => 20120299595 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-11-29 [patent_title] => 'HIGH RESOLUTION RESISTIVITY EARTH IMAGER' [patent_app_type] => utility [patent_app_number] => 13/565533 [patent_app_country] => US [patent_app_date] => 2012-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2503 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13565533 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/565533
HIGH RESOLUTION RESISTIVITY EARTH IMAGER Aug 1, 2012 Abandoned
Array ( [id] => 8481298 [patent_doc_number] => 20120280704 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-11-08 [patent_title] => 'SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE' [patent_app_type] => utility [patent_app_number] => 13/554722 [patent_app_country] => US [patent_app_date] => 2012-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 43 [patent_figures_cnt] => 43 [patent_no_of_words] => 20965 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13554722 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/554722
System for testing an integrated circuit of a device and its method of use Jul 19, 2012 Issued
Array ( [id] => 10362883 [patent_doc_number] => 20150247888 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-09-03 [patent_title] => 'SPARK TESTING APPARATUS' [patent_app_type] => utility [patent_app_number] => 14/415654 [patent_app_country] => US [patent_app_date] => 2012-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2319 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14415654 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/415654
SPARK TESTING APPARATUS Jul 18, 2012 Abandoned
Array ( [id] => 8587615 [patent_doc_number] => 20130006436 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-01-03 [patent_title] => 'Smart Electrical Drop Wire-Forms and Electrical Power Management System' [patent_app_type] => utility [patent_app_number] => 13/549365 [patent_app_country] => US [patent_app_date] => 2012-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 7813 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13549365 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/549365
Smart Electrical Drop Wire-Forms and Electrical Power Management System Jul 12, 2012 Abandoned
Array ( [id] => 10071775 [patent_doc_number] => 09110127 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2015-08-18 [patent_title] => 'Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductor' [patent_app_type] => utility [patent_app_number] => 13/541541 [patent_app_country] => US [patent_app_date] => 2012-07-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 19 [patent_no_of_words] => 12589 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13541541 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/541541
Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductor Jul 2, 2012 Issued
Array ( [id] => 9137266 [patent_doc_number] => 20130297981 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-11-07 [patent_title] => 'LOW COST HIGH THROUGHPUT TSV/MICROBUMP PROBE' [patent_app_type] => utility [patent_app_number] => 13/537528 [patent_app_country] => US [patent_app_date] => 2012-06-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4801 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13537528 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/537528
LOW COST HIGH THROUGHPUT TSV/MICROBUMP PROBE Jun 28, 2012 Abandoned
Array ( [id] => 8507190 [patent_doc_number] => 20120306598 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-12-06 [patent_title] => 'SCALABLE WIDEBAND PROBES, FIXTURES, AND SOCKETS FOR HIGH SPEED IC TESTING AND INTERCONNECTS' [patent_app_type] => utility [patent_app_number] => 13/477520 [patent_app_country] => US [patent_app_date] => 2012-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 39 [patent_figures_cnt] => 39 [patent_no_of_words] => 23032 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13477520 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/477520
SCALABLE WIDEBAND PROBES, FIXTURES, AND SOCKETS FOR HIGH SPEED IC TESTING AND INTERCONNECTS May 21, 2012 Abandoned
Array ( [id] => 11763858 [patent_doc_number] => 09372275 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-06-21 [patent_title] => 'Receiver coil assembly with air and ferromagnetic cored sensors for geophysical surveying' [patent_app_type] => utility [patent_app_number] => 13/474576 [patent_app_country] => US [patent_app_date] => 2012-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 14 [patent_no_of_words] => 9832 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13474576 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/474576
Receiver coil assembly with air and ferromagnetic cored sensors for geophysical surveying May 16, 2012 Issued
Array ( [id] => 9566486 [patent_doc_number] => 20140184199 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-07-03 [patent_title] => 'METHOD AND SYSTEM FOR CALIBRATING A SHUNT RESISTOR' [patent_app_type] => utility [patent_app_number] => 14/125404 [patent_app_country] => US [patent_app_date] => 2012-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 4967 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14125404 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/125404
Method and system for calibrating a shunt resistor May 15, 2012 Issued
Array ( [id] => 9945070 [patent_doc_number] => 08994378 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2015-03-31 [patent_title] => 'Acquisition system and method for towed electromagnetic sensor cable and source' [patent_app_type] => utility [patent_app_number] => 13/467261 [patent_app_country] => US [patent_app_date] => 2012-05-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3950 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13467261 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/467261
Acquisition system and method for towed electromagnetic sensor cable and source May 8, 2012 Issued
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