John J. Guarriello

Array ( [id] => 7623156 [patent_doc_number] => 06687009 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-02-03 [patent_title] => 'Method and apparatus for high resolution monitoring of optical signals' [patent_app_type] => B2 [patent_app_number] => 10/266574 [patent_app_country] => US [patent_app_date] => 2002-10-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 13 [patent_no_of_words] => 9947 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 11 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/687/06687009.pdf [firstpage_image] =>[orig_patent_app_number] => 10266574 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6719383 [patent_doc_number] => 20030053071 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-03-20 [patent_title] => 'Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry' [patent_app_type] => new [patent_app_number] => 10/251729 [patent_app_country] => US [patent_app_date] => 2002-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7720 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 64 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0053/20030053071.pdf [firstpage_image] =>[orig_patent_app_number] => 10251729 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6748862 [patent_doc_number] => 20030043382 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-03-06 [patent_title] => 'Apparatus and method for determining the active dopant profile in a semiconductor wafer' [patent_app_type] => new [patent_app_number] => 10/223952 [patent_app_country] => US [patent_app_date] => 2002-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 19540 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0043/20030043382.pdf [firstpage_image] =>[orig_patent_app_number] => 10223952 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1321892 [patent_doc_number] => 06608681 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-08-19 [patent_title] => 'Exposure method and apparatus' [patent_app_type] => B2 [patent_app_number] => 10/186687 [patent_app_country] => US [patent_app_date] => 2002-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 67 [patent_no_of_words] => 26057 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/608/06608681.pdf [firstpage_image] =>[orig_patent_app_number] => 10186687 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6642029 [patent_doc_number] => 20030007158 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-01-09 [patent_title] => 'Method and apparatus to reduce effects of sheared wavefronts on interferometric phase measurements' [patent_app_type] => new [patent_app_number] => 10/179556 [patent_app_country] => US [patent_app_date] => 2002-06-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 8072 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0007/20030007158.pdf [firstpage_image] =>[orig_patent_app_number] => 10179556 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6108731 [patent_doc_number] => 20020171843 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-11-21 [patent_title] => 'PHASE-BASED WAVELENGTH MEASUREMENT APPARATUS' [patent_app_type] => new [patent_app_number] => 10/135748 [patent_app_country] => US [patent_app_date] => 2002-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4506 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0171/20020171843.pdf [firstpage_image] =>[orig_patent_app_number] => 10135748 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1284095 [patent_doc_number] => 06646743 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-11-11 [patent_title] => 'Method and device for the spectral analysis of light' [patent_app_type] => B2 [patent_app_number] => 10/092521 [patent_app_country] => US [patent_app_date] => 2002-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2883 [patent_no_of_claims] => 51 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/646/06646743.pdf [firstpage_image] =>[orig_patent_app_number] => 10092521 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6590152 [patent_doc_number] => 20020085211 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-07-04 [patent_title] => 'Apparatus and method for determining the active dopant profile in a semiconductor wafer' [patent_app_type] => new [patent_app_number] => 09/994441 [patent_app_country] => US [patent_app_date] => 2001-11-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 21256 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0085/20020085211.pdf [firstpage_image] =>[orig_patent_app_number] => 09994441 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1498703 [patent_doc_number] => 06404504 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-06-11 [patent_title] => 'Method and apparatus for measuring flying height of the slider and in-situ monitoring a slider-disk interface' [patent_app_type] => B2 [patent_app_number] => 09/951724 [patent_app_country] => US [patent_app_date] => 2001-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 13 [patent_no_of_words] => 4809 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/404/06404504.pdf [firstpage_image] =>[orig_patent_app_number] => 09951724 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1469585 [patent_doc_number] => 06459487 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-01 [patent_title] => 'System and method for fabricating components of precise optical path length' [patent_app_type] => B1 [patent_app_number] => 09/944126 [patent_app_country] => US [patent_app_date] => 2001-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 4950 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/459/06459487.pdf [firstpage_image] =>[orig_patent_app_number] => 09944126 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6222802 [patent_doc_number] => 20020003628 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-01-10 [patent_title] => 'Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry' [patent_app_type] => new [patent_app_number] => 09/906542 [patent_app_country] => US [patent_app_date] => 2001-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7676 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 50 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0003/20020003628.pdf [firstpage_image] =>[orig_patent_app_number] => 09906542 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6986504 [patent_doc_number] => 20010036336 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-11-01 [patent_title] => 'Method and apparatus for adjusting flux emitted from branched light guides' [patent_app_type] => new [patent_app_number] => 09/874840 [patent_app_country] => US [patent_app_date] => 2001-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3745 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0036/20010036336.pdf [firstpage_image] =>[orig_patent_app_number] => 09874840 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6895577 [patent_doc_number] => 20010026367 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-10-04 [patent_title] => 'Method and apparatus for inspecting optical device' [patent_app_type] => new [patent_app_number] => 09/842226 [patent_app_country] => US [patent_app_date] => 2001-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 10140 [patent_no_of_claims] => 68 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0026/20010026367.pdf [firstpage_image] =>[orig_patent_app_number] => 09842226 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6902069 [patent_doc_number] => 20010000978 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-05-10 [patent_title] => 'Method and apparatus for recording three-dimensional distribution of light backscattering potential in transparent and semi-transparent structures' [patent_app_type] => new-utility [patent_app_number] => 09/755917 [patent_app_country] => US [patent_app_date] => 2001-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6625 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0000/20010000978.pdf [firstpage_image] =>[orig_patent_app_number] => 09755917 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1589491 [patent_doc_number] => 06359693 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-03-19 [patent_title] => 'Double pass double etalon spectrometer' [patent_app_type] => B2 [patent_app_number] => 09/737181 [patent_app_country] => US [patent_app_date] => 2000-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 14 [patent_no_of_words] => 4368 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/359/06359693.pdf [firstpage_image] =>[orig_patent_app_number] => 09737181 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1463161 [patent_doc_number] => 06392751 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-21 [patent_title] => 'Optimized interferometrically modulated array source' [patent_app_type] => B1 [patent_app_number] => 09/723959 [patent_app_country] => US [patent_app_date] => 2000-11-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 13 [patent_no_of_words] => 5409 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/392/06392751.pdf [firstpage_image] =>[orig_patent_app_number] => 09723959 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1536212 [patent_doc_number] => 06411388 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-06-25 [patent_title] => 'System and method for frequency domain interferometric second harmonic spectroscopy' [patent_app_type] => B1 [patent_app_number] => 09/722998 [patent_app_country] => US [patent_app_date] => 2000-11-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 3599 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/411/06411388.pdf [firstpage_image] =>[orig_patent_app_number] => 09722998 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1392045 [patent_doc_number] => 06559938 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-05-06 [patent_title] => 'Backside contamination inspection device' [patent_app_type] => B1 [patent_app_number] => 09/714042 [patent_app_country] => US [patent_app_date] => 2000-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3431 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 17 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/559/06559938.pdf [firstpage_image] =>[orig_patent_app_number] => 09714042 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1453726 [patent_doc_number] => 06456384 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-09-24 [patent_title] => 'Moir interferometer with overlapping illumination and imaging systems' [patent_app_type] => B1 [patent_app_number] => 09/710660 [patent_app_country] => US [patent_app_date] => 2000-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4114 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/456/06456384.pdf [firstpage_image] =>[orig_patent_app_number] => 09710660 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1598971 [patent_doc_number] => 06384919 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-07 [patent_title] => 'Fiber optic seismic sensor' [patent_app_type] => B1 [patent_app_number] => 09/697999 [patent_app_country] => US [patent_app_date] => 2000-10-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3112 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 326 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/384/06384919.pdf [firstpage_image] =>[orig_patent_app_number] => 09697999 [rel_patent_id] =>[rel_patent_doc_number] =>)