Search

John W. Shepperd

Examiner (ID: 12016)

Most Active Art Unit
2602
Art Unit(s)
2505, 2309, 2107, 2102, 3504, 2514, 2602, 2403
Total Applications
1208
Issued Applications
1081
Pending Applications
8
Abandoned Applications
119

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6378709 [patent_doc_number] => 20100301892 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-12-02 [patent_title] => 'Electrostatic discharge withstand voltage evaluating device and electrostatic discharge withstand voltage evaluating method' [patent_app_type] => utility [patent_app_number] => 12/311857 [patent_app_country] => US [patent_app_date] => 2007-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 11633 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0301/20100301892.pdf [firstpage_image] =>[orig_patent_app_number] => 12311857 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/311857
Electrostatic discharge withstand voltage evaluating device and electrostatic discharge withstand voltage evaluating method Oct 16, 2007 Issued
Array ( [id] => 5426288 [patent_doc_number] => 20090085598 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-02 [patent_title] => 'INTEGRATED CIRCUIT TEST SYSTEM AND METHOD WITH TEST DRIVER SHARING' [patent_app_type] => utility [patent_app_number] => 11/863920 [patent_app_country] => US [patent_app_date] => 2007-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3703 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0085/20090085598.pdf [firstpage_image] =>[orig_patent_app_number] => 11863920 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/863920
INTEGRATED CIRCUIT TEST SYSTEM AND METHOD WITH TEST DRIVER SHARING Sep 27, 2007 Abandoned
Array ( [id] => 4897313 [patent_doc_number] => 20080116926 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-22 [patent_title] => 'SEMICONDUCTOR PROBE HAVING RESISTIVE TIP AND METHOD OF FABRICATING THE SAME' [patent_app_type] => utility [patent_app_number] => 11/861417 [patent_app_country] => US [patent_app_date] => 2007-09-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3995 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0116/20080116926.pdf [firstpage_image] =>[orig_patent_app_number] => 11861417 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/861417
Semiconductor probe having resistive tip and method of fabricating the same Sep 25, 2007 Issued
Array ( [id] => 4539578 [patent_doc_number] => 07888955 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-02-15 [patent_title] => 'Method and apparatus for testing devices using serially controlled resources' [patent_app_type] => utility [patent_app_number] => 11/861223 [patent_app_country] => US [patent_app_date] => 2007-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 5665 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/888/07888955.pdf [firstpage_image] =>[orig_patent_app_number] => 11861223 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/861223
Method and apparatus for testing devices using serially controlled resources Sep 24, 2007 Issued
Array ( [id] => 4749720 [patent_doc_number] => 20080157791 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-03 [patent_title] => 'STIFFENER ASSEMBLY FOR USE WITH TESTING DEVICES' [patent_app_type] => utility [patent_app_number] => 11/860406 [patent_app_country] => US [patent_app_date] => 2007-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7887 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0157/20080157791.pdf [firstpage_image] =>[orig_patent_app_number] => 11860406 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/860406
Stiffener assembly for use with testing devices Sep 23, 2007 Issued
Array ( [id] => 114193 [patent_doc_number] => 07714569 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-05-11 [patent_title] => 'Adaptor for electrical connector' [patent_app_type] => utility [patent_app_number] => 11/858123 [patent_app_country] => US [patent_app_date] => 2007-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1795 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/714/07714569.pdf [firstpage_image] =>[orig_patent_app_number] => 11858123 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/858123
Adaptor for electrical connector Sep 19, 2007 Issued
Array ( [id] => 4877473 [patent_doc_number] => 20080150856 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-26 [patent_title] => 'LIQUID CRYSTAL DISPLAY, CONNECTOR AND METHOD OF TESTING THE LIQUID CRYSTAL DISPLAY' [patent_app_type] => utility [patent_app_number] => 11/850415 [patent_app_country] => US [patent_app_date] => 2007-09-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7833 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0150/20080150856.pdf [firstpage_image] =>[orig_patent_app_number] => 11850415 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/850415
Liquid crystal display, connector and method of testing the liquid crystal display Sep 4, 2007 Issued
Array ( [id] => 4769252 [patent_doc_number] => 20080054910 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-06 [patent_title] => 'Test apparatus for testing operation of a printed circuit board' [patent_app_type] => utility [patent_app_number] => 11/896623 [patent_app_country] => US [patent_app_date] => 2007-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3565 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0054/20080054910.pdf [firstpage_image] =>[orig_patent_app_number] => 11896623 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/896623
Test apparatus for testing operation of a printed circuit board Sep 3, 2007 Issued
Array ( [id] => 4715937 [patent_doc_number] => 20080238459 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-02 [patent_title] => 'Testing apparatus and method' [patent_app_type] => utility [patent_app_number] => 11/896218 [patent_app_country] => US [patent_app_date] => 2007-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1698 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0238/20080238459.pdf [firstpage_image] =>[orig_patent_app_number] => 11896218 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/896218
Testing apparatus and method Aug 29, 2007 Abandoned
Array ( [id] => 6579214 [patent_doc_number] => 20100097056 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-22 [patent_title] => 'METHOD AND APPARATUS FOR NANO-SCALE SQUID' [patent_app_type] => utility [patent_app_number] => 12/310397 [patent_app_country] => US [patent_app_date] => 2007-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5946 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0097/20100097056.pdf [firstpage_image] =>[orig_patent_app_number] => 12310397 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/310397
METHOD AND APPARATUS FOR NANO-SCALE SQUID Aug 26, 2007 Abandoned
Array ( [id] => 9167464 [patent_doc_number] => 08593147 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-11-26 [patent_title] => 'Resistivity logging with reduced dip artifacts' [patent_app_type] => utility [patent_app_number] => 12/373558 [patent_app_country] => US [patent_app_date] => 2007-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 3574 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12373558 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/373558
Resistivity logging with reduced dip artifacts Aug 7, 2007 Issued
Array ( [id] => 7978957 [patent_doc_number] => 08072226 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-12-06 [patent_title] => 'Nanostructure sensors' [patent_app_type] => utility [patent_app_number] => 11/995916 [patent_app_country] => US [patent_app_date] => 2007-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 13 [patent_no_of_words] => 7800 [patent_no_of_claims] => 46 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/072/08072226.pdf [firstpage_image] =>[orig_patent_app_number] => 11995916 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/995916
Nanostructure sensors Aug 5, 2007 Issued
Array ( [id] => 4702275 [patent_doc_number] => 20080061797 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-13 [patent_title] => 'SYSTEM FOR TESTING POWER SUPPLY PERFORMANCE' [patent_app_type] => utility [patent_app_number] => 11/834018 [patent_app_country] => US [patent_app_date] => 2007-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1397 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0061/20080061797.pdf [firstpage_image] =>[orig_patent_app_number] => 11834018 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/834018
System for testing power supply performance Aug 5, 2007 Issued
Array ( [id] => 4686033 [patent_doc_number] => 20080030214 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-07 [patent_title] => 'Probe head assembly for use in testing multiple wafer die' [patent_app_type] => utility [patent_app_number] => 11/890222 [patent_app_country] => US [patent_app_date] => 2007-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4913 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0030/20080030214.pdf [firstpage_image] =>[orig_patent_app_number] => 11890222 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/890222
Probe head assembly for use in testing multiple wafer die Aug 2, 2007 Issued
Array ( [id] => 4864296 [patent_doc_number] => 20080143355 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-19 [patent_title] => 'Method and System for Testing or Measuring Electrical Elements' [patent_app_type] => utility [patent_app_number] => 11/831218 [patent_app_country] => US [patent_app_date] => 2007-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6845 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0143/20080143355.pdf [firstpage_image] =>[orig_patent_app_number] => 11831218 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/831218
Method and System for Testing or Measuring Electrical Elements Jul 30, 2007 Abandoned
Array ( [id] => 178438 [patent_doc_number] => 07656148 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-02-02 [patent_title] => 'Over-power detector' [patent_app_type] => utility [patent_app_number] => 11/881923 [patent_app_country] => US [patent_app_date] => 2007-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 13 [patent_no_of_words] => 4790 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/656/07656148.pdf [firstpage_image] =>[orig_patent_app_number] => 11881923 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/881923
Over-power detector Jul 29, 2007 Issued
Array ( [id] => 4537555 [patent_doc_number] => 07872488 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-01-18 [patent_title] => 'Tester for testing semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/828024 [patent_app_country] => US [patent_app_date] => 2007-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3895 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/872/07872488.pdf [firstpage_image] =>[orig_patent_app_number] => 11828024 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/828024
Tester for testing semiconductor device Jul 24, 2007 Issued
Array ( [id] => 4731664 [patent_doc_number] => 20080048642 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-28 [patent_title] => 'Current sensor' [patent_app_type] => utility [patent_app_number] => 11/878324 [patent_app_country] => US [patent_app_date] => 2007-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3946 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20080048642.pdf [firstpage_image] =>[orig_patent_app_number] => 11878324 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/878324
Current sensor Jul 23, 2007 Issued
Array ( [id] => 5016251 [patent_doc_number] => 20070259460 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-11-08 [patent_title] => 'SEMICONDUCTOR WAFER EXAMINATION METHOD AND SEMICONDUCTOR CHIP MANUFACTURING METHOD' [patent_app_type] => utility [patent_app_number] => 11/775437 [patent_app_country] => US [patent_app_date] => 2007-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2720 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0259/20070259460.pdf [firstpage_image] =>[orig_patent_app_number] => 11775437 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/775437
Semiconductor wafer examination method and semiconductor chip manufacturing method Jul 9, 2007 Issued
Array ( [id] => 5225122 [patent_doc_number] => 20070254388 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-11-01 [patent_title] => 'SEMICONDUCTOR WAFER EXAMINATION METHOD AND SEMICONDUCTOR CHIP MANUFACTURING METHOD' [patent_app_type] => utility [patent_app_number] => 11/775309 [patent_app_country] => US [patent_app_date] => 2007-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2719 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0254/20070254388.pdf [firstpage_image] =>[orig_patent_app_number] => 11775309 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/775309
SEMICONDUCTOR WAFER EXAMINATION METHOD AND SEMICONDUCTOR CHIP MANUFACTURING METHOD Jul 9, 2007 Abandoned
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