John W. Shepperd

Array ( [id] => 8410888 [patent_doc_number] => 08274287 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-09-25 [patent_title] => 'Metallic debris detection sensor' [patent_app_type] => utility [patent_app_number] => 12/300500 [patent_app_country] => US [patent_app_date] => 2007-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 3199 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12300500 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4855976 [patent_doc_number] => 20080264826 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-30 [patent_title] => 'Test plate for electronic handler' [patent_app_type] => utility [patent_app_number] => 11/741921 [patent_app_country] => US [patent_app_date] => 2007-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1487 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0264/20080264826.pdf [firstpage_image] =>[orig_patent_app_number] => 11741921 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5208593 [patent_doc_number] => 20070247177 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-10-25 [patent_title] => 'Test Apparatus For Semiconductor Elements On A Semiconductor Wafer, And A Test Method Using The Test Apparatus' [patent_app_type] => utility [patent_app_number] => 11/736422 [patent_app_country] => US [patent_app_date] => 2007-04-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5054 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0247/20070247177.pdf [firstpage_image] =>[orig_patent_app_number] => 11736422 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5365230 [patent_doc_number] => 20090302789 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-12-10 [patent_title] => 'Method for Identification of the Sensor Assignment within an Electrical Machine' [patent_app_type] => utility [patent_app_number] => 12/227297 [patent_app_country] => US [patent_app_date] => 2007-04-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3546 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0302/20090302789.pdf [firstpage_image] =>[orig_patent_app_number] => 12227297 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 323121 [patent_doc_number] => 07518355 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-04-14 [patent_title] => 'Package level voltage sensing of a power gated die' [patent_app_type] => utility [patent_app_number] => 11/694424 [patent_app_country] => US [patent_app_date] => 2007-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1834 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/518/07518355.pdf [firstpage_image] =>[orig_patent_app_number] => 11694424 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4737644 [patent_doc_number] => 20080231296 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-25 [patent_title] => 'Test Apparatus for the Testing of Electronic Components' [patent_app_type] => utility [patent_app_number] => 12/090419 [patent_app_country] => US [patent_app_date] => 2007-03-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3610 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0231/20080231296.pdf [firstpage_image] =>[orig_patent_app_number] => 12090419 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4986353 [patent_doc_number] => 20070152691 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-05 [patent_title] => 'WAFER CHUCK' [patent_app_type] => utility [patent_app_number] => 11/682703 [patent_app_country] => US [patent_app_date] => 2007-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4252 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0152/20070152691.pdf [firstpage_image] =>[orig_patent_app_number] => 11682703 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7978923 [patent_doc_number] => 08072209 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-12-06 [patent_title] => 'Position sensor with variable direction of magnetization and method of production' [patent_app_type] => utility [patent_app_number] => 12/281207 [patent_app_country] => US [patent_app_date] => 2007-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 26 [patent_no_of_words] => 4037 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/072/08072209.pdf [firstpage_image] =>[orig_patent_app_number] => 12281207 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4731668 [patent_doc_number] => 20080048646 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-28 [patent_title] => 'PRECISION, TEMPERATURE-COMPENSATED, SHIELDED CURRENT MEASUREMENT DEVICE' [patent_app_type] => utility [patent_app_number] => 11/681620 [patent_app_country] => US [patent_app_date] => 2007-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 10239 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20080048646.pdf [firstpage_image] =>[orig_patent_app_number] => 11681620 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4930844 [patent_doc_number] => 20080001619 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-03 [patent_title] => 'Display panel lighting test apparatus, and test line employing the same' [patent_app_type] => utility [patent_app_number] => 11/713021 [patent_app_country] => US [patent_app_date] => 2007-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4538 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20080001619.pdf [firstpage_image] =>[orig_patent_app_number] => 11713021 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5257183 [patent_doc_number] => 20070210815 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-13 [patent_title] => 'Blade probe and blade probe card' [patent_app_type] => utility [patent_app_number] => 11/711319 [patent_app_country] => US [patent_app_date] => 2007-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2308 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0210/20070210815.pdf [firstpage_image] =>[orig_patent_app_number] => 11711319 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 373805 [patent_doc_number] => 07474110 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-01-06 [patent_title] => 'Probe card' [patent_app_type] => utility [patent_app_number] => 11/710223 [patent_app_country] => US [patent_app_date] => 2007-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 8135 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 248 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/474/07474110.pdf [firstpage_image] =>[orig_patent_app_number] => 11710223 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 830579 [patent_doc_number] => 07400135 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-07-15 [patent_title] => 'Test fixture and method for circuit board testing' [patent_app_type] => utility [patent_app_number] => 11/710020 [patent_app_country] => US [patent_app_date] => 2007-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 2753 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/400/07400135.pdf [firstpage_image] =>[orig_patent_app_number] => 11710020 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5228591 [patent_doc_number] => 20070290698 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-20 [patent_title] => 'Probe card' [patent_app_type] => utility [patent_app_number] => 11/710221 [patent_app_country] => US [patent_app_date] => 2007-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 7812 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20070290698.pdf [firstpage_image] =>[orig_patent_app_number] => 11710221 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 334776 [patent_doc_number] => 07508188 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-24 [patent_title] => 'On-chip current sensing methods and systems' [patent_app_type] => utility [patent_app_number] => 11/707023 [patent_app_country] => US [patent_app_date] => 2007-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4834 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/508/07508188.pdf [firstpage_image] =>[orig_patent_app_number] => 11707023 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4811095 [patent_doc_number] => 20080191726 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-14 [patent_title] => 'Cantilever-type probe card for high frequency application' [patent_app_type] => utility [patent_app_number] => 11/705523 [patent_app_country] => US [patent_app_date] => 2007-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 3361 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0191/20080191726.pdf [firstpage_image] =>[orig_patent_app_number] => 11705523 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4560098 [patent_doc_number] => 07821278 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-10-26 [patent_title] => 'Method and device for testing of non-componented circuit boards' [patent_app_type] => utility [patent_app_number] => 12/097819 [patent_app_country] => US [patent_app_date] => 2007-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 5133 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/821/07821278.pdf [firstpage_image] =>[orig_patent_app_number] => 12097819 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 240107 [patent_doc_number] => 07592827 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-09-22 [patent_title] => 'Apparatus and method for electrical detection and localization of shorts in metal interconnect lines' [patent_app_type] => utility [patent_app_number] => 11/622924 [patent_app_country] => US [patent_app_date] => 2007-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 13 [patent_no_of_words] => 5572 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 175 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/592/07592827.pdf [firstpage_image] =>[orig_patent_app_number] => 11622924 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5197118 [patent_doc_number] => 20070296436 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-27 [patent_title] => 'ELECTRICAL TEST PROBES WITH A CONTACT ELEMENT, METHODS OF MAKING AND USING THE SAME' [patent_app_type] => utility [patent_app_number] => 11/621717 [patent_app_country] => US [patent_app_date] => 2007-01-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4250 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0296/20070296436.pdf [firstpage_image] =>[orig_patent_app_number] => 11621717 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4749719 [patent_doc_number] => 20080157790 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-03 [patent_title] => 'STIFFENER ASSEMBLY FOR USE WITH TESTING DEVICES' [patent_app_type] => utility [patent_app_number] => 11/617929 [patent_app_country] => US [patent_app_date] => 2006-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5357 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0157/20080157790.pdf [firstpage_image] =>[orig_patent_app_number] => 11617929 [rel_patent_id] =>[rel_patent_doc_number] =>)