Search

John W. Shepperd

Examiner (ID: 12016)

Most Active Art Unit
2602
Art Unit(s)
2505, 2309, 2107, 2102, 3504, 2514, 2602, 2403
Total Applications
1208
Issued Applications
1081
Pending Applications
8
Abandoned Applications
119

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4655290 [patent_doc_number] => 20080024150 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-31 [patent_title] => 'SURFACE MOUNT PACKAGE FAULT DETECTION APPARATUS' [patent_app_type] => utility [patent_app_number] => 11/494502 [patent_app_country] => US [patent_app_date] => 2006-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3617 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20080024150.pdf [firstpage_image] =>[orig_patent_app_number] => 11494502 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/494502
Surface mount package fault detection apparatus Jul 27, 2006 Issued
Array ( [id] => 6568062 [patent_doc_number] => 20100060294 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-03-11 [patent_title] => 'Timing generator and semiconductor test apparatus' [patent_app_type] => utility [patent_app_number] => 11/989713 [patent_app_country] => US [patent_app_date] => 2006-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6720 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0060/20100060294.pdf [firstpage_image] =>[orig_patent_app_number] => 11989713 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/989713
Timing generator and semiconductor test apparatus Jul 27, 2006 Issued
Array ( [id] => 5202833 [patent_doc_number] => 20070024312 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-01 [patent_title] => 'Device and method for the testing of integrated semiconductor circuits on wafers' [patent_app_type] => utility [patent_app_number] => 11/493628 [patent_app_country] => US [patent_app_date] => 2006-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2710 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20070024312.pdf [firstpage_image] =>[orig_patent_app_number] => 11493628 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/493628
Device and method for the testing of integrated semiconductor circuits on wafers Jul 26, 2006 Abandoned
Array ( [id] => 6257252 [patent_doc_number] => 20100295571 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-25 [patent_title] => 'Device and Method for Configuring a Semiconductor Circuit' [patent_app_type] => utility [patent_app_number] => 11/990095 [patent_app_country] => US [patent_app_date] => 2006-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6073 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0295/20100295571.pdf [firstpage_image] =>[orig_patent_app_number] => 11990095 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/990095
Device and Method for Configuring a Semiconductor Circuit Jul 26, 2006 Abandoned
Array ( [id] => 5202821 [patent_doc_number] => 20070024300 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-01 [patent_title] => 'Method for manufacturing integrated circuit, measurement apparatus for integrated circuit, and wafer' [patent_app_type] => utility [patent_app_number] => 11/493424 [patent_app_country] => US [patent_app_date] => 2006-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2675 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20070024300.pdf [firstpage_image] =>[orig_patent_app_number] => 11493424 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/493424
Method for testing integrated circuit, and wafer Jul 25, 2006 Issued
Array ( [id] => 5600025 [patent_doc_number] => 20060290370 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-28 [patent_title] => 'TEMPERATURE CONTROL IN IC SOCKETS' [patent_app_type] => utility [patent_app_number] => 11/459288 [patent_app_country] => US [patent_app_date] => 2006-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2866 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20060290370.pdf [firstpage_image] =>[orig_patent_app_number] => 11459288 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/459288
TEMPERATURE CONTROL IN IC SOCKETS Jul 20, 2006 Abandoned
Array ( [id] => 5240184 [patent_doc_number] => 20070018675 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-25 [patent_title] => 'SEMICONDUCTOR WAFER EXAMINATION METHOD AND SEMICONDUCTOR CHIP MANUFACTURING METHOD' [patent_app_type] => utility [patent_app_number] => 11/458781 [patent_app_country] => US [patent_app_date] => 2006-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2689 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0018/20070018675.pdf [firstpage_image] =>[orig_patent_app_number] => 11458781 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/458781
SEMICONDUCTOR WAFER EXAMINATION METHOD AND SEMICONDUCTOR CHIP MANUFACTURING METHOD Jul 19, 2006 Abandoned
Array ( [id] => 821030 [patent_doc_number] => 07408365 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-08-05 [patent_title] => 'Image sensor testing method and apparatus' [patent_app_type] => utility [patent_app_number] => 11/486106 [patent_app_country] => US [patent_app_date] => 2006-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 6583 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/408/07408365.pdf [firstpage_image] =>[orig_patent_app_number] => 11486106 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/486106
Image sensor testing method and apparatus Jul 13, 2006 Issued
Array ( [id] => 394435 [patent_doc_number] => 07298136 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-11-20 [patent_title] => 'Magnetically coupled electrical test lead' [patent_app_type] => utility [patent_app_number] => 11/456048 [patent_app_country] => US [patent_app_date] => 2006-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 30 [patent_no_of_words] => 6441 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/298/07298136.pdf [firstpage_image] =>[orig_patent_app_number] => 11456048 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/456048
Magnetically coupled electrical test lead Jul 5, 2006 Issued
Array ( [id] => 292843 [patent_doc_number] => 07545138 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-06-09 [patent_title] => 'Precision, temperature-compensated, shielded current measurement device' [patent_app_type] => utility [patent_app_number] => 11/456007 [patent_app_country] => US [patent_app_date] => 2006-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 18 [patent_no_of_words] => 8531 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 45 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/545/07545138.pdf [firstpage_image] =>[orig_patent_app_number] => 11456007 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/456007
Precision, temperature-compensated, shielded current measurement device Jul 5, 2006 Issued
Array ( [id] => 6225836 [patent_doc_number] => 20100182037 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-07-22 [patent_title] => 'Diagnostic Method For Load-Testing Self-Excited Three-Phase Generators in a Motor Vehicle' [patent_app_type] => utility [patent_app_number] => 11/995395 [patent_app_country] => US [patent_app_date] => 2006-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2407 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0182/20100182037.pdf [firstpage_image] =>[orig_patent_app_number] => 11995395 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/995395
Diagnostic Method For Load-Testing Self-Excited Three-Phase Generators in a Motor Vehicle Jun 30, 2006 Abandoned
Array ( [id] => 5139496 [patent_doc_number] => 20070001712 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-04 [patent_title] => 'Hi-pot testing device with transfer table automatically connecting to testing signal generator' [patent_app_type] => utility [patent_app_number] => 11/478704 [patent_app_country] => US [patent_app_date] => 2006-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2225 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20070001712.pdf [firstpage_image] =>[orig_patent_app_number] => 11478704 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/478704
Hi-pot testing device with transfer table automatically connecting to testing signal generator Jun 29, 2006 Issued
Array ( [id] => 5197082 [patent_doc_number] => 20070296400 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-27 [patent_title] => 'VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TEST APPARATUS' [patent_app_type] => utility [patent_app_number] => 11/475577 [patent_app_country] => US [patent_app_date] => 2006-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6989 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0296/20070296400.pdf [firstpage_image] =>[orig_patent_app_number] => 11475577 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/475577
Voltage generating apparatus, current generating apparatus, and test apparatus Jun 26, 2006 Issued
Array ( [id] => 901186 [patent_doc_number] => 07339366 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-04 [patent_title] => 'Directional coupler for a accurate power detection' [patent_app_type] => utility [patent_app_number] => 11/475783 [patent_app_country] => US [patent_app_date] => 2006-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2008 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/339/07339366.pdf [firstpage_image] =>[orig_patent_app_number] => 11475783 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/475783
Directional coupler for a accurate power detection Jun 26, 2006 Issued
Array ( [id] => 5600026 [patent_doc_number] => 20060290371 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-28 [patent_title] => 'Testing apparatus and testing method using the same' [patent_app_type] => utility [patent_app_number] => 11/474627 [patent_app_country] => US [patent_app_date] => 2006-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3517 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20060290371.pdf [firstpage_image] =>[orig_patent_app_number] => 11474627 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/474627
Testing apparatus and testing method using the same Jun 25, 2006 Issued
Array ( [id] => 185945 [patent_doc_number] => 07649375 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-01-19 [patent_title] => 'Connector-to-pad printed circuit board translator and method of fabrication' [patent_app_type] => utility [patent_app_number] => 11/474921 [patent_app_country] => US [patent_app_date] => 2006-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 2339 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/649/07649375.pdf [firstpage_image] =>[orig_patent_app_number] => 11474921 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/474921
Connector-to-pad printed circuit board translator and method of fabrication Jun 25, 2006 Issued
Array ( [id] => 5240162 [patent_doc_number] => 20070018653 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-25 [patent_title] => 'Apparatus and method for testing system board' [patent_app_type] => utility [patent_app_number] => 11/473029 [patent_app_country] => US [patent_app_date] => 2006-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4459 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0018/20070018653.pdf [firstpage_image] =>[orig_patent_app_number] => 11473029 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/473029
Apparatus and method for testing system board Jun 22, 2006 Abandoned
Array ( [id] => 425622 [patent_doc_number] => 07271605 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-09-18 [patent_title] => 'Burn-in apparatus' [patent_app_type] => utility [patent_app_number] => 11/455850 [patent_app_country] => US [patent_app_date] => 2006-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 9667 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/271/07271605.pdf [firstpage_image] =>[orig_patent_app_number] => 11455850 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/455850
Burn-in apparatus Jun 19, 2006 Issued
Array ( [id] => 814114 [patent_doc_number] => 07414389 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-08-19 [patent_title] => 'Low-power battery pack with hall-effect sensor' [patent_app_type] => utility [patent_app_number] => 11/453780 [patent_app_country] => US [patent_app_date] => 2006-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 5833 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/414/07414389.pdf [firstpage_image] =>[orig_patent_app_number] => 11453780 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/453780
Low-power battery pack with hall-effect sensor Jun 13, 2006 Issued
Array ( [id] => 5640864 [patent_doc_number] => 20060279319 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-14 [patent_title] => 'Electronic component test system' [patent_app_type] => utility [patent_app_number] => 11/451056 [patent_app_country] => US [patent_app_date] => 2006-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4070 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0279/20060279319.pdf [firstpage_image] =>[orig_patent_app_number] => 11451056 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/451056
Electronic component test system Jun 11, 2006 Abandoned
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