
John W. Shepperd
Examiner (ID: 12016)
| Most Active Art Unit | 2602 |
| Art Unit(s) | 2505, 2309, 2107, 2102, 3504, 2514, 2602, 2403 |
| Total Applications | 1208 |
| Issued Applications | 1081 |
| Pending Applications | 8 |
| Abandoned Applications | 119 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4655290
[patent_doc_number] => 20080024150
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-31
[patent_title] => 'SURFACE MOUNT PACKAGE FAULT DETECTION APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 11/494502
[patent_app_country] => US
[patent_app_date] => 2006-07-28
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0024/20080024150.pdf
[firstpage_image] =>[orig_patent_app_number] => 11494502
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/494502 | Surface mount package fault detection apparatus | Jul 27, 2006 | Issued |
Array
(
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[patent_doc_number] => 20100060294
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[patent_kind] => A1
[patent_issue_date] => 2010-03-11
[patent_title] => 'Timing generator and semiconductor test apparatus'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/989713 | Timing generator and semiconductor test apparatus | Jul 27, 2006 | Issued |
Array
(
[id] => 5202833
[patent_doc_number] => 20070024312
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[patent_issue_date] => 2007-02-01
[patent_title] => 'Device and method for the testing of integrated semiconductor circuits on wafers'
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[patent_app_date] => 2006-07-27
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Array
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[patent_issue_date] => 2010-11-25
[patent_title] => 'Device and Method for Configuring a Semiconductor Circuit'
[patent_app_type] => utility
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[patent_app_date] => 2006-07-27
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Array
(
[id] => 5202821
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[patent_issue_date] => 2007-02-01
[patent_title] => 'Method for manufacturing integrated circuit, measurement apparatus for integrated circuit, and wafer'
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Array
(
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[patent_doc_number] => 20060290370
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[patent_issue_date] => 2006-12-28
[patent_title] => 'TEMPERATURE CONTROL IN IC SOCKETS'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/459288 | TEMPERATURE CONTROL IN IC SOCKETS | Jul 20, 2006 | Abandoned |
Array
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[id] => 5240184
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[patent_title] => 'SEMICONDUCTOR WAFER EXAMINATION METHOD AND SEMICONDUCTOR CHIP MANUFACTURING METHOD'
[patent_app_type] => utility
[patent_app_number] => 11/458781
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/458781 | SEMICONDUCTOR WAFER EXAMINATION METHOD AND SEMICONDUCTOR CHIP MANUFACTURING METHOD | Jul 19, 2006 | Abandoned |
Array
(
[id] => 821030
[patent_doc_number] => 07408365
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[patent_kind] => B2
[patent_issue_date] => 2008-08-05
[patent_title] => 'Image sensor testing method and apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/486106
[patent_app_country] => US
[patent_app_date] => 2006-07-14
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[firstpage_image] =>[orig_patent_app_number] => 11486106
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/486106 | Image sensor testing method and apparatus | Jul 13, 2006 | Issued |
Array
(
[id] => 394435
[patent_doc_number] => 07298136
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[patent_issue_date] => 2007-11-20
[patent_title] => 'Magnetically coupled electrical test lead'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/456048 | Magnetically coupled electrical test lead | Jul 5, 2006 | Issued |
Array
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[patent_doc_number] => 07545138
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[patent_issue_date] => 2009-06-09
[patent_title] => 'Precision, temperature-compensated, shielded current measurement device'
[patent_app_type] => utility
[patent_app_number] => 11/456007
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Array
(
[id] => 6225836
[patent_doc_number] => 20100182037
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[patent_issue_date] => 2010-07-22
[patent_title] => 'Diagnostic Method For Load-Testing Self-Excited Three-Phase Generators in a Motor Vehicle'
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[patent_app_number] => 11/995395
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/995395 | Diagnostic Method For Load-Testing Self-Excited Three-Phase Generators in a Motor Vehicle | Jun 30, 2006 | Abandoned |
Array
(
[id] => 5139496
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[patent_title] => 'Hi-pot testing device with transfer table automatically connecting to testing signal generator'
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Array
(
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[patent_title] => 'VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TEST APPARATUS'
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Array
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Array
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Array
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Array
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Array
(
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