Search

Jonathan Charles Teixeira Moffat

Supervisory Patent Examiner (ID: 15025, Phone: (571)272-2255 , Office: P/2863 )

Most Active Art Unit
2863
Art Unit(s)
2863, 3700, 2800, 2857
Total Applications
506
Issued Applications
351
Pending Applications
30
Abandoned Applications
148

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 8308136 [patent_doc_number] => 08229686 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-07-24 [patent_title] => 'Apparatus and method for measuring liquid and gas flow rates in a stratified multi-phase flow' [patent_app_type] => utility [patent_app_number] => 12/164828 [patent_app_country] => US [patent_app_date] => 2008-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 15 [patent_no_of_words] => 6322 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 199 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12164828 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/164828
Apparatus and method for measuring liquid and gas flow rates in a stratified multi-phase flow Jun 29, 2008 Issued
Array ( [id] => 5466659 [patent_doc_number] => 20090326859 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-12-31 [patent_title] => 'PREDICTIVE ANGULAR SENSOR READOUT' [patent_app_type] => utility [patent_app_number] => 12/146633 [patent_app_country] => US [patent_app_date] => 2008-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6093 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0326/20090326859.pdf [firstpage_image] =>[orig_patent_app_number] => 12146633 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/146633
Predictive angular sensor readout Jun 25, 2008 Issued
Array ( [id] => 4853953 [patent_doc_number] => 20080319696 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-25 [patent_title] => 'Method and Its System for Calibrating Measured Data Between Different Measuring Tools' [patent_app_type] => utility [patent_app_number] => 12/137779 [patent_app_country] => US [patent_app_date] => 2008-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 6472 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0319/20080319696.pdf [firstpage_image] =>[orig_patent_app_number] => 12137779 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/137779
Method and its system for calibrating measured data between different measuring tools Jun 11, 2008 Issued
Array ( [id] => 5297814 [patent_doc_number] => 20090012740 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-08 [patent_title] => 'Method for determining the wheel position in a vehicle' [patent_app_type] => utility [patent_app_number] => 12/157678 [patent_app_country] => US [patent_app_date] => 2008-06-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3160 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0012/20090012740.pdf [firstpage_image] =>[orig_patent_app_number] => 12157678 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/157678
Method for determining the wheel position in a vehicle Jun 10, 2008 Abandoned
Array ( [id] => 4950582 [patent_doc_number] => 20080306708 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-11 [patent_title] => 'SYSTEM AND METHOD FOR ORIENTATION AND LOCATION CALIBRATION FOR IMAGE SENSORS' [patent_app_type] => utility [patent_app_number] => 12/132423 [patent_app_country] => US [patent_app_date] => 2008-06-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 12638 [patent_no_of_claims] => 45 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0306/20080306708.pdf [firstpage_image] =>[orig_patent_app_number] => 12132423 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/132423
SYSTEM AND METHOD FOR ORIENTATION AND LOCATION CALIBRATION FOR IMAGE SENSORS Jun 2, 2008 Abandoned
Array ( [id] => 5447569 [patent_doc_number] => 20090048795 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-19 [patent_title] => 'METHOD AND APPARATUS FOR RESOLVING INDIVIDUAL SIGNALS IN DETECTOR OUTPUT DATA' [patent_app_type] => utility [patent_app_number] => 12/130671 [patent_app_country] => US [patent_app_date] => 2008-05-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 9593 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20090048795.pdf [firstpage_image] =>[orig_patent_app_number] => 12130671 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/130671
METHOD AND APPARATUS FOR RESOLVING INDIVIDUAL SIGNALS IN DETECTOR OUTPUT DATA May 29, 2008 Abandoned
Array ( [id] => 5305015 [patent_doc_number] => 20090299667 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-12-03 [patent_title] => 'Qualifying Data Produced By An Application Carried Out Using A Plurality Of Pluggable Processing Components' [patent_app_type] => utility [patent_app_number] => 12/129252 [patent_app_country] => US [patent_app_date] => 2008-05-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 9544 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0299/20090299667.pdf [firstpage_image] =>[orig_patent_app_number] => 12129252 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/129252
Qualifying Data Produced By An Application Carried Out Using A Plurality Of Pluggable Processing Components May 28, 2008 Abandoned
Array ( [id] => 5305026 [patent_doc_number] => 20090299678 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-12-03 [patent_title] => 'METHOD AND APPARATUS FOR DETERMINING A PRODUCT LOADING PLAN FOR A TESTING SYSTEM' [patent_app_type] => utility [patent_app_number] => 12/127306 [patent_app_country] => US [patent_app_date] => 2008-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5049 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0299/20090299678.pdf [firstpage_image] =>[orig_patent_app_number] => 12127306 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/127306
METHOD AND APPARATUS FOR DETERMINING A PRODUCT LOADING PLAN FOR A TESTING SYSTEM May 26, 2008 Abandoned
Array ( [id] => 4496290 [patent_doc_number] => 07904266 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-03-08 [patent_title] => 'Method and apparatus for calculating the separation time of arcing contacts of a high-volume switchgear' [patent_app_type] => utility [patent_app_number] => 12/122860 [patent_app_country] => US [patent_app_date] => 2008-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3342 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 194 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/904/07904266.pdf [firstpage_image] =>[orig_patent_app_number] => 12122860 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/122860
Method and apparatus for calculating the separation time of arcing contacts of a high-volume switchgear May 18, 2008 Issued
Array ( [id] => 4728934 [patent_doc_number] => 20080208478 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-28 [patent_title] => 'Dynamic Production System Management' [patent_app_type] => utility [patent_app_number] => 12/121710 [patent_app_country] => US [patent_app_date] => 2008-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 17903 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0208/20080208478.pdf [firstpage_image] =>[orig_patent_app_number] => 12121710 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/121710
Dynamic Production System Management May 14, 2008 Abandoned
Array ( [id] => 5553454 [patent_doc_number] => 20090287440 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-11-19 [patent_title] => 'SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER AND GENERATING INSPECTION RESULTS FOR THE WAFER' [patent_app_type] => utility [patent_app_number] => 12/120574 [patent_app_country] => US [patent_app_date] => 2008-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 13930 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0287/20090287440.pdf [firstpage_image] =>[orig_patent_app_number] => 12120574 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/120574
Systems and methods for detecting defects on a wafer and generating inspection results for the wafer May 13, 2008 Issued
Array ( [id] => 5447573 [patent_doc_number] => 20090048799 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-19 [patent_title] => 'Roundness measuring device, method and program for measuring roundness' [patent_app_type] => utility [patent_app_number] => 12/153164 [patent_app_country] => US [patent_app_date] => 2008-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3938 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20090048799.pdf [firstpage_image] =>[orig_patent_app_number] => 12153164 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/153164
Roundness measuring device, method and program for measuring roundness May 13, 2008 Abandoned
Array ( [id] => 145698 [patent_doc_number] => 07689382 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-03-30 [patent_title] => 'System for first pass filtering of anomalies and providing a base confidence level for resource usage prediction in a utility computing environment' [patent_app_type] => utility [patent_app_number] => 12/119224 [patent_app_country] => US [patent_app_date] => 2008-05-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7148 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 267 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/689/07689382.pdf [firstpage_image] =>[orig_patent_app_number] => 12119224 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/119224
System for first pass filtering of anomalies and providing a base confidence level for resource usage prediction in a utility computing environment May 11, 2008 Issued
Array ( [id] => 5559550 [patent_doc_number] => 20090271127 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-10-29 [patent_title] => 'SYSTEM AND METHOD FOR MONITORING VEHICLE RESIDUAL INTEGRITY' [patent_app_type] => utility [patent_app_number] => 12/110116 [patent_app_country] => US [patent_app_date] => 2008-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5523 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0271/20090271127.pdf [firstpage_image] =>[orig_patent_app_number] => 12110116 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/110116
SYSTEM AND METHOD FOR MONITORING VEHICLE RESIDUAL INTEGRITY Apr 24, 2008 Abandoned
Array ( [id] => 8169585 [patent_doc_number] => 08175831 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-05-08 [patent_title] => 'Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers' [patent_app_type] => utility [patent_app_number] => 12/107346 [patent_app_country] => US [patent_app_date] => 2008-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 8 [patent_no_of_words] => 23878 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/175/08175831.pdf [firstpage_image] =>[orig_patent_app_number] => 12107346 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/107346
Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers Apr 21, 2008 Issued
Array ( [id] => 4708987 [patent_doc_number] => 20080297513 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-04 [patent_title] => 'Method of Analyzing Data' [patent_app_type] => utility [patent_app_number] => 12/102502 [patent_app_country] => US [patent_app_date] => 2008-04-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 11215 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0297/20080297513.pdf [firstpage_image] =>[orig_patent_app_number] => 12102502 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/102502
Method of Analyzing Data Apr 13, 2008 Abandoned
Array ( [id] => 4677643 [patent_doc_number] => 20080215274 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-04 [patent_title] => 'Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication' [patent_app_type] => utility [patent_app_number] => 12/078840 [patent_app_country] => US [patent_app_date] => 2008-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 9705 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0215/20080215274.pdf [firstpage_image] =>[orig_patent_app_number] => 12078840 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/078840
Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication Apr 6, 2008 Issued
Array ( [id] => 4683502 [patent_doc_number] => 20080249728 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-09 [patent_title] => 'METHOD FOR DETECTING DEFECTS ON THE BACK SIDE OF A SEMICONDUCTOR WAFER' [patent_app_type] => utility [patent_app_number] => 12/056734 [patent_app_country] => US [patent_app_date] => 2008-03-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2529 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0249/20080249728.pdf [firstpage_image] =>[orig_patent_app_number] => 12056734 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/056734
METHOD FOR DETECTING DEFECTS ON THE BACK SIDE OF A SEMICONDUCTOR WAFER Mar 26, 2008 Abandoned
Array ( [id] => 46693 [patent_doc_number] => 07783444 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-08-24 [patent_title] => 'Systems and methods of alternative overlay calculation' [patent_app_type] => utility [patent_app_number] => 12/056134 [patent_app_country] => US [patent_app_date] => 2008-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2387 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/783/07783444.pdf [firstpage_image] =>[orig_patent_app_number] => 12056134 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/056134
Systems and methods of alternative overlay calculation Mar 25, 2008 Issued
Array ( [id] => 5405139 [patent_doc_number] => 20090240454 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-09-24 [patent_title] => 'METHOD AND SYSTEM FOR VALIDATING A PROCESSOR IN A SEMICONDUCTOR ASSEMBLY' [patent_app_type] => utility [patent_app_number] => 12/054277 [patent_app_country] => US [patent_app_date] => 2008-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3403 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0240/20090240454.pdf [firstpage_image] =>[orig_patent_app_number] => 12054277 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/054277
METHOD AND SYSTEM FOR VALIDATING A PROCESSOR IN A SEMICONDUCTOR ASSEMBLY Mar 23, 2008 Abandoned
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