| Application number | Title of the application | Filing Date | Status |
|---|
Array
(
[id] => 4255215
[patent_doc_number] => 06137283
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-10-24
[patent_title] => 'Process and machine for signal waveform analysis'
[patent_app_type] => 1
[patent_app_number] => 9/435707
[patent_app_country] => US
[patent_app_date] => 1999-11-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 31
[patent_no_of_words] => 9982
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 17
[patent_words_short_claim] => 135
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/137/06137283.pdf
[firstpage_image] =>[orig_patent_app_number] => 435707
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/435707 | Process and machine for signal waveform analysis | Nov 7, 1999 | Issued |
Array
(
[id] => 4139302
[patent_doc_number] => 06147500
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-11-14
[patent_title] => 'EDM with jump motion detecting reactive force'
[patent_app_type] => 1
[patent_app_number] => 9/396456
[patent_app_country] => US
[patent_app_date] => 1999-09-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 14
[patent_no_of_words] => 5702
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 147
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/147/06147500.pdf
[firstpage_image] =>[orig_patent_app_number] => 396456
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/396456 | EDM with jump motion detecting reactive force | Sep 14, 1999 | Issued |
Array
(
[id] => 4366254
[patent_doc_number] => 06191570
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-02-20
[patent_title] => 'System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment'
[patent_app_type] => 1
[patent_app_number] => 9/361368
[patent_app_country] => US
[patent_app_date] => 1999-07-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 6904
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 361
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/191/06191570.pdf
[firstpage_image] =>[orig_patent_app_number] => 361368
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/361368 | System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment | Jul 25, 1999 | Issued |
Array
(
[id] => 4266936
[patent_doc_number] => 06204678
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-03-20
[patent_title] => 'Direct connect interconnect for testing semiconductor dice and wafers'
[patent_app_type] => 1
[patent_app_number] => 9/302833
[patent_app_country] => US
[patent_app_date] => 1999-04-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 19
[patent_no_of_words] => 5794
[patent_no_of_claims] => 36
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 89
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/204/06204678.pdf
[firstpage_image] =>[orig_patent_app_number] => 302833
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/302833 | Direct connect interconnect for testing semiconductor dice and wafers | Apr 29, 1999 | Issued |
Array
(
[id] => 4413091
[patent_doc_number] => 06172507
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-01-09
[patent_title] => 'Circuit configuration for measuring resistance and leakage'
[patent_app_type] => 1
[patent_app_number] => 9/272962
[patent_app_country] => US
[patent_app_date] => 1999-03-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 2797
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 140
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/172/06172507.pdf
[firstpage_image] =>[orig_patent_app_number] => 272962
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/272962 | Circuit configuration for measuring resistance and leakage | Mar 18, 1999 | Issued |
Array
(
[id] => 4413074
[patent_doc_number] => 06172505
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-01-09
[patent_title] => 'Electronic battery tester'
[patent_app_type] => 1
[patent_app_number] => 9/264743
[patent_app_country] => US
[patent_app_date] => 1999-03-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 9
[patent_no_of_words] => 4610
[patent_no_of_claims] => 42
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 71
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/172/06172505.pdf
[firstpage_image] =>[orig_patent_app_number] => 264743
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/264743 | Electronic battery tester | Mar 8, 1999 | Issued |
Array
(
[id] => 4196958
[patent_doc_number] => 06154041
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-11-28
[patent_title] => 'Method and apparatus for measuring thickness of semiconductor substrates'
[patent_app_type] => 1
[patent_app_number] => 9/258066
[patent_app_country] => US
[patent_app_date] => 1999-02-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 12
[patent_no_of_words] => 11127
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 117
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/154/06154041.pdf
[firstpage_image] =>[orig_patent_app_number] => 258066
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/258066 | Method and apparatus for measuring thickness of semiconductor substrates | Feb 25, 1999 | Issued |
Array
(
[id] => 4211469
[patent_doc_number] => 06078181
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-06-20
[patent_title] => 'Method for the measurement of forest duff moisture content'
[patent_app_type] => 1
[patent_app_number] => 9/246272
[patent_app_country] => US
[patent_app_date] => 1999-02-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 10
[patent_no_of_words] => 4331
[patent_no_of_claims] => 1
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 188
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/078/06078181.pdf
[firstpage_image] =>[orig_patent_app_number] => 246272
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/246272 | Method for the measurement of forest duff moisture content | Feb 7, 1999 | Issued |
Array
(
[id] => 4192140
[patent_doc_number] => 06160406
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-12-12
[patent_title] => 'Condom testing apparatus'
[patent_app_type] => 1
[patent_app_number] => 9/226753
[patent_app_country] => US
[patent_app_date] => 1999-01-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 3962
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 161
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/160/06160406.pdf
[firstpage_image] =>[orig_patent_app_number] => 226753
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/226753 | Condom testing apparatus | Jan 5, 1999 | Issued |
Array
(
[id] => 4092276
[patent_doc_number] => 06025726
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-02-15
[patent_title] => 'Method and apparatus for determining three-dimensional position, orientation and mass distribution'
[patent_app_type] => 1
[patent_app_number] => 9/200609
[patent_app_country] => US
[patent_app_date] => 1998-11-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 15
[patent_no_of_words] => 12356
[patent_no_of_claims] => 40
[patent_no_of_ind_claims] => 10
[patent_words_short_claim] => 132
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/025/06025726.pdf
[firstpage_image] =>[orig_patent_app_number] => 200609
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/200609 | Method and apparatus for determining three-dimensional position, orientation and mass distribution | Nov 29, 1998 | Issued |
Array
(
[id] => 4364819
[patent_doc_number] => 06169394
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-01-02
[patent_title] => 'Electrical detector for micro-analysis systems'
[patent_app_type] => 1
[patent_app_number] => 9/154668
[patent_app_country] => US
[patent_app_date] => 1998-09-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 26
[patent_no_of_words] => 10703
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 139
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/169/06169394.pdf
[firstpage_image] =>[orig_patent_app_number] => 154668
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/154668 | Electrical detector for micro-analysis systems | Sep 17, 1998 | Issued |
| 09/146363 | DEVICE FOR DETERMINING THE MOISTURE CONTENT OF A SMALL VOLUME OF MATERIAL IN REAL-TIME | Sep 2, 1998 | Abandoned |
| 09/143966 | METHOD AND DEVICE FOR HIGHLY ACCURATE, HIGH SPEED, REAL TIME, CONTINUOUS OR STATIONARY, IN-LINE, NON-INVASIVE, THREE DIMENSIONAL, MULTI-SLICE DENSITY DEVIATION AND DENSITY MEASUREMENTS AND CALCULATIONS OF HOMOGENEOUS OR NON-HOMOGENEOUS FIBROUS YARN, SLIVERS, | Aug 30, 1998 | Abandoned |
Array
(
[id] => 4110501
[patent_doc_number] => 06100703
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-08-08
[patent_title] => 'Polarization-sensitive near-field microwave microscope'
[patent_app_type] => 1
[patent_app_number] => 9/111453
[patent_app_country] => US
[patent_app_date] => 1998-07-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 11
[patent_no_of_words] => 5035
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 76
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/100/06100703.pdf
[firstpage_image] =>[orig_patent_app_number] => 111453
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/111453 | Polarization-sensitive near-field microwave microscope | Jul 7, 1998 | Issued |
Array
(
[id] => 4178622
[patent_doc_number] => 06140821
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-10-31
[patent_title] => 'Method and system for the recognition of insulation defects'
[patent_app_type] => 1
[patent_app_number] => 9/105140
[patent_app_country] => US
[patent_app_date] => 1998-06-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 5383
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 166
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/140/06140821.pdf
[firstpage_image] =>[orig_patent_app_number] => 105140
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/105140 | Method and system for the recognition of insulation defects | Jun 25, 1998 | Issued |
Array
(
[id] => 4425244
[patent_doc_number] => 06225812
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-05-01
[patent_title] => 'Method and apparatus for measuring the density of a substance having free water compensation'
[patent_app_type] => 1
[patent_app_number] => 9/104661
[patent_app_country] => US
[patent_app_date] => 1998-06-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 7
[patent_no_of_words] => 3369
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 222
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/225/06225812.pdf
[firstpage_image] =>[orig_patent_app_number] => 104661
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/104661 | Method and apparatus for measuring the density of a substance having free water compensation | Jun 24, 1998 | Issued |
| 08/973977 | CAPACITANCE MEASUREMENT | Jun 23, 1998 | Abandoned |
Array
(
[id] => 4362830
[patent_doc_number] => 06201400
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-03-13
[patent_title] => 'Bulls-eye mid-frequency impedance probe'
[patent_app_type] => 1
[patent_app_number] => 9/103369
[patent_app_country] => US
[patent_app_date] => 1998-06-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 10
[patent_no_of_words] => 2896
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 147
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/201/06201400.pdf
[firstpage_image] =>[orig_patent_app_number] => 103369
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/103369 | Bulls-eye mid-frequency impedance probe | Jun 22, 1998 | Issued |
| 09/029171 | DEVICE FOR DETECTION OF PROHIBITED OPERATION OF A MEASUREMENT EQUIPMENT | Jun 16, 1998 | Abandoned |
Array
(
[id] => 4178692
[patent_doc_number] => 06140825
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-10-31
[patent_title] => 'Method and apparatus for evaluating quality of resistance welds'
[patent_app_type] => 1
[patent_app_number] => 9/075953
[patent_app_country] => US
[patent_app_date] => 1998-05-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 2753
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 121
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/140/06140825.pdf
[firstpage_image] =>[orig_patent_app_number] => 075953
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/075953 | Method and apparatus for evaluating quality of resistance welds | May 11, 1998 | Issued |