
Jose M. Solis
Examiner (ID: 16967)
| Most Active Art Unit | 2607 |
| Art Unit(s) | 2858, 2607, 2213, 2899 |
| Total Applications | 1157 |
| Issued Applications | 979 |
| Pending Applications | 47 |
| Abandoned Applications | 131 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
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[patent_issue_date] => 1984-05-08
[patent_title] => 'Apparatus for automatic measurement of equivalent circuit parameters of piezoelectric resonators'
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Array
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[patent_issue_date] => 1984-10-16
[patent_title] => 'Noise field intensity measuring apparatus'
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Array
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[patent_issue_date] => 1984-09-18
[patent_title] => 'Leakage impedance measuring system including a superimposed measuring voltage having a frequency differing slightly from system frequency'
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Array
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[patent_issue_date] => 1984-08-07
[patent_title] => 'Electronic wall stud sensor'
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Array
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Array
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[patent_title] => 'Method for measuring impulse delays and fault locations in cables and light wave conductors'
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Array
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[patent_title] => 'Device for detecting the variation of a capacitive impedance having dielectric consisting of a lubricant'
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Array
(
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[patent_issue_date] => 1985-06-18
[patent_title] => 'Method for the determination of kinetics of structure formation in a binder'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 06/352516 | Method for the determination of kinetics of structure formation in a binder | Feb 25, 1982 | Issued |
Array
(
[id] => 2273586
[patent_doc_number] => 04584528
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[patent_issue_date] => 1986-04-22
[patent_title] => 'Speed detecting method and apparatus'
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Array
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[patent_title] => 'Method and apparatus for the electronic measurement of the thickness of very thin electrically conductive films on a nonconductive substrate'
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Array
(
[id] => 2079790
[patent_doc_number] => 04445086
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[patent_title] => 'Multiconductor cable tester'
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Array
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Array
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Array
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Array
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Array
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Array
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