Joshua Benitez Rosario

Array ( [id] => 4743728 [patent_doc_number] => 20080088329 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-04-17 [patent_title] => 'Systems Configured for Utilizing Two or More Multiple Different Semiconductor Components Configurations, Methods of Providing Semicondutor Components within Sockets, and Methods of Retaining Semiconductor Component Configurations within Sockets' [patent_app_type] => utility [patent_app_number] => 11/951849 [patent_app_country] => US [patent_app_date] => 2007-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 5666 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0088/20080088329.pdf [firstpage_image] =>[orig_patent_app_number] => 11951849 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6575502 [patent_doc_number] => 20100321002 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-12-23 [patent_title] => 'INTEGRATED SENSOR WITH CAPACITIVE COUPLING REJECTION TO THE MECHANICAL GROUND' [patent_app_type] => utility [patent_app_number] => 12/521709 [patent_app_country] => US [patent_app_date] => 2007-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3466 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0321/20100321002.pdf [firstpage_image] =>[orig_patent_app_number] => 12521709 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4708715 [patent_doc_number] => 20080297241 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-04 [patent_title] => 'APPLICATION-SPECIFIC INTEGRATED CIRCUIT WITH AUTOMATIC TIME-CONSTANT MATCHING' [patent_app_type] => utility [patent_app_number] => 11/935421 [patent_app_country] => US [patent_app_date] => 2007-11-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 5036 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0297/20080297241.pdf [firstpage_image] =>[orig_patent_app_number] => 11935421 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7713901 [patent_doc_number] => 08093919 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-01-10 [patent_title] => 'Test circuit, method, and semiconductor device' [patent_app_type] => utility [patent_app_number] => 12/514364 [patent_app_country] => US [patent_app_date] => 2007-11-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 5755 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 368 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/093/08093919.pdf [firstpage_image] =>[orig_patent_app_number] => 12514364 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4702292 [patent_doc_number] => 20080061814 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-13 [patent_title] => 'Electronic Component Test System' [patent_app_type] => utility [patent_app_number] => 11/935042 [patent_app_country] => US [patent_app_date] => 2007-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4236 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0061/20080061814.pdf [firstpage_image] =>[orig_patent_app_number] => 11935042 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7764082 [patent_doc_number] => 08115507 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-02-14 [patent_title] => 'Circuit and method for parallel testing and semiconductor device' [patent_app_type] => utility [patent_app_number] => 12/514363 [patent_app_country] => US [patent_app_date] => 2007-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 20 [patent_no_of_words] => 14829 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 12 [patent_words_short_claim] => 47 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/115/08115507.pdf [firstpage_image] =>[orig_patent_app_number] => 12514363 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4789917 [patent_doc_number] => 20080290890 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-11-27 [patent_title] => 'TESTING SYSTEM FOR TESTING ELECTRONIC ASSEMBLY' [patent_app_type] => utility [patent_app_number] => 11/875127 [patent_app_country] => US [patent_app_date] => 2007-10-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2388 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20080290890.pdf [firstpage_image] =>[orig_patent_app_number] => 11875127 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6378709 [patent_doc_number] => 20100301892 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-12-02 [patent_title] => 'Electrostatic discharge withstand voltage evaluating device and electrostatic discharge withstand voltage evaluating method' [patent_app_type] => utility [patent_app_number] => 12/311857 [patent_app_country] => US [patent_app_date] => 2007-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 11633 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0301/20100301892.pdf [firstpage_image] =>[orig_patent_app_number] => 12311857 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5426288 [patent_doc_number] => 20090085598 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-02 [patent_title] => 'INTEGRATED CIRCUIT TEST SYSTEM AND METHOD WITH TEST DRIVER SHARING' [patent_app_type] => utility [patent_app_number] => 11/863920 [patent_app_country] => US [patent_app_date] => 2007-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3703 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0085/20090085598.pdf [firstpage_image] =>[orig_patent_app_number] => 11863920 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4897313 [patent_doc_number] => 20080116926 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-22 [patent_title] => 'SEMICONDUCTOR PROBE HAVING RESISTIVE TIP AND METHOD OF FABRICATING THE SAME' [patent_app_type] => utility [patent_app_number] => 11/861417 [patent_app_country] => US [patent_app_date] => 2007-09-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3995 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0116/20080116926.pdf [firstpage_image] =>[orig_patent_app_number] => 11861417 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4539578 [patent_doc_number] => 07888955 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-02-15 [patent_title] => 'Method and apparatus for testing devices using serially controlled resources' [patent_app_type] => utility [patent_app_number] => 11/861223 [patent_app_country] => US [patent_app_date] => 2007-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 5665 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/888/07888955.pdf [firstpage_image] =>[orig_patent_app_number] => 11861223 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4749720 [patent_doc_number] => 20080157791 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-03 [patent_title] => 'STIFFENER ASSEMBLY FOR USE WITH TESTING DEVICES' [patent_app_type] => utility [patent_app_number] => 11/860406 [patent_app_country] => US [patent_app_date] => 2007-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7887 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0157/20080157791.pdf [firstpage_image] =>[orig_patent_app_number] => 11860406 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 114193 [patent_doc_number] => 07714569 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-05-11 [patent_title] => 'Adaptor for electrical connector' [patent_app_type] => utility [patent_app_number] => 11/858123 [patent_app_country] => US [patent_app_date] => 2007-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1795 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/714/07714569.pdf [firstpage_image] =>[orig_patent_app_number] => 11858123 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4877473 [patent_doc_number] => 20080150856 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-26 [patent_title] => 'LIQUID CRYSTAL DISPLAY, CONNECTOR AND METHOD OF TESTING THE LIQUID CRYSTAL DISPLAY' [patent_app_type] => utility [patent_app_number] => 11/850415 [patent_app_country] => US [patent_app_date] => 2007-09-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7833 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0150/20080150856.pdf [firstpage_image] =>[orig_patent_app_number] => 11850415 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4769252 [patent_doc_number] => 20080054910 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-06 [patent_title] => 'Test apparatus for testing operation of a printed circuit board' [patent_app_type] => utility [patent_app_number] => 11/896623 [patent_app_country] => US [patent_app_date] => 2007-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3565 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0054/20080054910.pdf [firstpage_image] =>[orig_patent_app_number] => 11896623 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4715937 [patent_doc_number] => 20080238459 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-02 [patent_title] => 'Testing apparatus and method' [patent_app_type] => utility [patent_app_number] => 11/896218 [patent_app_country] => US [patent_app_date] => 2007-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1698 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0238/20080238459.pdf [firstpage_image] =>[orig_patent_app_number] => 11896218 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6579214 [patent_doc_number] => 20100097056 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-22 [patent_title] => 'METHOD AND APPARATUS FOR NANO-SCALE SQUID' [patent_app_type] => utility [patent_app_number] => 12/310397 [patent_app_country] => US [patent_app_date] => 2007-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5946 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0097/20100097056.pdf [firstpage_image] =>[orig_patent_app_number] => 12310397 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9167464 [patent_doc_number] => 08593147 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-11-26 [patent_title] => 'Resistivity logging with reduced dip artifacts' [patent_app_type] => utility [patent_app_number] => 12/373558 [patent_app_country] => US [patent_app_date] => 2007-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 3574 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12373558 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4702275 [patent_doc_number] => 20080061797 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-13 [patent_title] => 'SYSTEM FOR TESTING POWER SUPPLY PERFORMANCE' [patent_app_type] => utility [patent_app_number] => 11/834018 [patent_app_country] => US [patent_app_date] => 2007-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1397 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0061/20080061797.pdf [firstpage_image] =>[orig_patent_app_number] => 11834018 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7978957 [patent_doc_number] => 08072226 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-12-06 [patent_title] => 'Nanostructure sensors' [patent_app_type] => utility [patent_app_number] => 11/995916 [patent_app_country] => US [patent_app_date] => 2007-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 13 [patent_no_of_words] => 7800 [patent_no_of_claims] => 46 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/072/08072226.pdf [firstpage_image] =>[orig_patent_app_number] => 11995916 [rel_patent_id] =>[rel_patent_doc_number] =>)