Joshua Benitez Rosario

Array ( [id] => 4708656 [patent_doc_number] => 20080297182 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-04 [patent_title] => 'SEMICODUCTOR TESTING DEVICE WITH ELASTOMER INTERPOSER' [patent_app_type] => utility [patent_app_number] => 11/754818 [patent_app_country] => US [patent_app_date] => 2007-05-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 4498 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0297/20080297182.pdf [firstpage_image] =>[orig_patent_app_number] => 11754818 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 152818 [patent_doc_number] => 07683650 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-03-23 [patent_title] => 'Measurement instrument with synchronized interference signals' [patent_app_type] => utility [patent_app_number] => 11/753323 [patent_app_country] => US [patent_app_date] => 2007-05-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 859 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/683/07683650.pdf [firstpage_image] =>[orig_patent_app_number] => 11753323 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5579054 [patent_doc_number] => 20090174400 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-09 [patent_title] => 'Arrangement for Non-Contact Defined Movement of at Least One Magnetic Body' [patent_app_type] => utility [patent_app_number] => 12/227272 [patent_app_country] => US [patent_app_date] => 2007-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3066 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0174/20090174400.pdf [firstpage_image] =>[orig_patent_app_number] => 12227272 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 315331 [patent_doc_number] => 07525304 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-04-28 [patent_title] => 'Measurement of effective capacitance' [patent_app_type] => utility [patent_app_number] => 11/748207 [patent_app_country] => US [patent_app_date] => 2007-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 2623 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/525/07525304.pdf [firstpage_image] =>[orig_patent_app_number] => 11748207 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6507486 [patent_doc_number] => 20100013488 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-21 [patent_title] => 'MEASURING HEAD AND MEASURING METHOD' [patent_app_type] => utility [patent_app_number] => 12/440771 [patent_app_country] => US [patent_app_date] => 2007-05-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2558 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0013/20100013488.pdf [firstpage_image] =>[orig_patent_app_number] => 12440771 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4446353 [patent_doc_number] => 07863917 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-01-04 [patent_title] => 'Semiconductor chip having a crack test circuit and method of testing a crack of a semiconductor chip using the same' [patent_app_type] => utility [patent_app_number] => 11/797426 [patent_app_country] => US [patent_app_date] => 2007-05-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5992 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/863/07863917.pdf [firstpage_image] =>[orig_patent_app_number] => 11797426 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5014478 [patent_doc_number] => 20070257686 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-11-08 [patent_title] => 'INTEGRATED CIRCUIT PROBE CARD ANALYZER' [patent_app_type] => utility [patent_app_number] => 11/743020 [patent_app_country] => US [patent_app_date] => 2007-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 2960 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0257/20070257686.pdf [firstpage_image] =>[orig_patent_app_number] => 11743020 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4855976 [patent_doc_number] => 20080264826 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-30 [patent_title] => 'Test plate for electronic handler' [patent_app_type] => utility [patent_app_number] => 11/741921 [patent_app_country] => US [patent_app_date] => 2007-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1487 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0264/20080264826.pdf [firstpage_image] =>[orig_patent_app_number] => 11741921 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8410888 [patent_doc_number] => 08274287 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-09-25 [patent_title] => 'Metallic debris detection sensor' [patent_app_type] => utility [patent_app_number] => 12/300500 [patent_app_country] => US [patent_app_date] => 2007-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 3199 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12300500 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5208593 [patent_doc_number] => 20070247177 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-10-25 [patent_title] => 'Test Apparatus For Semiconductor Elements On A Semiconductor Wafer, And A Test Method Using The Test Apparatus' [patent_app_type] => utility [patent_app_number] => 11/736422 [patent_app_country] => US [patent_app_date] => 2007-04-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5054 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0247/20070247177.pdf [firstpage_image] =>[orig_patent_app_number] => 11736422 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5365230 [patent_doc_number] => 20090302789 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-12-10 [patent_title] => 'Method for Identification of the Sensor Assignment within an Electrical Machine' [patent_app_type] => utility [patent_app_number] => 12/227297 [patent_app_country] => US [patent_app_date] => 2007-04-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3546 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0302/20090302789.pdf [firstpage_image] =>[orig_patent_app_number] => 12227297 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 323121 [patent_doc_number] => 07518355 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-04-14 [patent_title] => 'Package level voltage sensing of a power gated die' [patent_app_type] => utility [patent_app_number] => 11/694424 [patent_app_country] => US [patent_app_date] => 2007-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1834 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/518/07518355.pdf [firstpage_image] =>[orig_patent_app_number] => 11694424 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4737644 [patent_doc_number] => 20080231296 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-25 [patent_title] => 'Test Apparatus for the Testing of Electronic Components' [patent_app_type] => utility [patent_app_number] => 12/090419 [patent_app_country] => US [patent_app_date] => 2007-03-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3610 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0231/20080231296.pdf [firstpage_image] =>[orig_patent_app_number] => 12090419 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4986353 [patent_doc_number] => 20070152691 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-05 [patent_title] => 'WAFER CHUCK' [patent_app_type] => utility [patent_app_number] => 11/682703 [patent_app_country] => US [patent_app_date] => 2007-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4252 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0152/20070152691.pdf [firstpage_image] =>[orig_patent_app_number] => 11682703 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4930844 [patent_doc_number] => 20080001619 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-03 [patent_title] => 'Display panel lighting test apparatus, and test line employing the same' [patent_app_type] => utility [patent_app_number] => 11/713021 [patent_app_country] => US [patent_app_date] => 2007-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4538 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20080001619.pdf [firstpage_image] =>[orig_patent_app_number] => 11713021 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4731668 [patent_doc_number] => 20080048646 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-28 [patent_title] => 'PRECISION, TEMPERATURE-COMPENSATED, SHIELDED CURRENT MEASUREMENT DEVICE' [patent_app_type] => utility [patent_app_number] => 11/681620 [patent_app_country] => US [patent_app_date] => 2007-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 10239 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20080048646.pdf [firstpage_image] =>[orig_patent_app_number] => 11681620 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7978923 [patent_doc_number] => 08072209 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-12-06 [patent_title] => 'Position sensor with variable direction of magnetization and method of production' [patent_app_type] => utility [patent_app_number] => 12/281207 [patent_app_country] => US [patent_app_date] => 2007-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 26 [patent_no_of_words] => 4037 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/072/08072209.pdf [firstpage_image] =>[orig_patent_app_number] => 12281207 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5257183 [patent_doc_number] => 20070210815 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-13 [patent_title] => 'Blade probe and blade probe card' [patent_app_type] => utility [patent_app_number] => 11/711319 [patent_app_country] => US [patent_app_date] => 2007-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2308 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0210/20070210815.pdf [firstpage_image] =>[orig_patent_app_number] => 11711319 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 373805 [patent_doc_number] => 07474110 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-01-06 [patent_title] => 'Probe card' [patent_app_type] => utility [patent_app_number] => 11/710223 [patent_app_country] => US [patent_app_date] => 2007-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 8135 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 248 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/474/07474110.pdf [firstpage_image] =>[orig_patent_app_number] => 11710223 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5228591 [patent_doc_number] => 20070290698 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-20 [patent_title] => 'Probe card' [patent_app_type] => utility [patent_app_number] => 11/710221 [patent_app_country] => US [patent_app_date] => 2007-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 7812 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20070290698.pdf [firstpage_image] =>[orig_patent_app_number] => 11710221 [rel_patent_id] =>[rel_patent_doc_number] =>)