Search

Joshua Benitez Rosario

Supervisory Patent Examiner (ID: 18038, Phone: (571)270-1435 , Office: P/2834 )

Most Active Art Unit
2858
Art Unit(s)
2829, 2858, 4134, 2815, 4119, 2867, 2834
Total Applications
422
Issued Applications
312
Pending Applications
12
Abandoned Applications
100

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 830579 [patent_doc_number] => 07400135 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-07-15 [patent_title] => 'Test fixture and method for circuit board testing' [patent_app_type] => utility [patent_app_number] => 11/710020 [patent_app_country] => US [patent_app_date] => 2007-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 2753 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/400/07400135.pdf [firstpage_image] =>[orig_patent_app_number] => 11710020 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/710020
Test fixture and method for circuit board testing Feb 22, 2007 Issued
Array ( [id] => 334776 [patent_doc_number] => 07508188 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-24 [patent_title] => 'On-chip current sensing methods and systems' [patent_app_type] => utility [patent_app_number] => 11/707023 [patent_app_country] => US [patent_app_date] => 2007-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4834 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/508/07508188.pdf [firstpage_image] =>[orig_patent_app_number] => 11707023 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/707023
On-chip current sensing methods and systems Feb 15, 2007 Issued
Array ( [id] => 4811095 [patent_doc_number] => 20080191726 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-14 [patent_title] => 'Cantilever-type probe card for high frequency application' [patent_app_type] => utility [patent_app_number] => 11/705523 [patent_app_country] => US [patent_app_date] => 2007-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 3361 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0191/20080191726.pdf [firstpage_image] =>[orig_patent_app_number] => 11705523 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/705523
Cantilever-type probe card for high frequency application Feb 12, 2007 Issued
Array ( [id] => 4560098 [patent_doc_number] => 07821278 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-10-26 [patent_title] => 'Method and device for testing of non-componented circuit boards' [patent_app_type] => utility [patent_app_number] => 12/097819 [patent_app_country] => US [patent_app_date] => 2007-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 5133 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/821/07821278.pdf [firstpage_image] =>[orig_patent_app_number] => 12097819 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/097819
Method and device for testing of non-componented circuit boards Jan 25, 2007 Issued
Array ( [id] => 240107 [patent_doc_number] => 07592827 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-09-22 [patent_title] => 'Apparatus and method for electrical detection and localization of shorts in metal interconnect lines' [patent_app_type] => utility [patent_app_number] => 11/622924 [patent_app_country] => US [patent_app_date] => 2007-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 13 [patent_no_of_words] => 5572 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 175 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/592/07592827.pdf [firstpage_image] =>[orig_patent_app_number] => 11622924 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/622924
Apparatus and method for electrical detection and localization of shorts in metal interconnect lines Jan 11, 2007 Issued
Array ( [id] => 5197118 [patent_doc_number] => 20070296436 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-27 [patent_title] => 'ELECTRICAL TEST PROBES WITH A CONTACT ELEMENT, METHODS OF MAKING AND USING THE SAME' [patent_app_type] => utility [patent_app_number] => 11/621717 [patent_app_country] => US [patent_app_date] => 2007-01-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4250 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0296/20070296436.pdf [firstpage_image] =>[orig_patent_app_number] => 11621717 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/621717
Electrical test probes with a contact element, methods of making and using the same Jan 9, 2007 Issued
Array ( [id] => 4749719 [patent_doc_number] => 20080157790 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-03 [patent_title] => 'STIFFENER ASSEMBLY FOR USE WITH TESTING DEVICES' [patent_app_type] => utility [patent_app_number] => 11/617929 [patent_app_country] => US [patent_app_date] => 2006-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5357 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0157/20080157790.pdf [firstpage_image] =>[orig_patent_app_number] => 11617929 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/617929
Stiffener assembly for use with testing devices Dec 28, 2006 Issued
Array ( [id] => 5024258 [patent_doc_number] => 20070150224 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-06-28 [patent_title] => 'Evaluation of an output signal of a device under test' [patent_app_type] => utility [patent_app_number] => 11/647118 [patent_app_country] => US [patent_app_date] => 2006-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3510 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0150/20070150224.pdf [firstpage_image] =>[orig_patent_app_number] => 11647118 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/647118
Evaluation of an output signal of a device under test Dec 27, 2006 Issued
Array ( [id] => 4624972 [patent_doc_number] => 08004274 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-08-23 [patent_title] => 'Inductive position sensor' [patent_app_type] => utility [patent_app_number] => 12/097682 [patent_app_country] => US [patent_app_date] => 2006-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 18 [patent_no_of_words] => 4858 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 213 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/004/08004274.pdf [firstpage_image] =>[orig_patent_app_number] => 12097682 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/097682
Inductive position sensor Dec 17, 2006 Issued
Array ( [id] => 4864301 [patent_doc_number] => 20080143360 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-19 [patent_title] => 'Method and apparatus for improving load time for automated test equipment' [patent_app_type] => utility [patent_app_number] => 11/639769 [patent_app_country] => US [patent_app_date] => 2006-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2431 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0143/20080143360.pdf [firstpage_image] =>[orig_patent_app_number] => 11639769 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/639769
Method and apparatus for improving load time for automated test equipment Dec 14, 2006 Issued
Array ( [id] => 4864302 [patent_doc_number] => 20080143361 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-19 [patent_title] => 'Automated loader for removing and inserting removable devices to improve load time for automated test equipment' [patent_app_type] => utility [patent_app_number] => 11/639770 [patent_app_country] => US [patent_app_date] => 2006-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2600 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0143/20080143361.pdf [firstpage_image] =>[orig_patent_app_number] => 11639770 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/639770
Automated loader for removing and inserting removable devices to improve load time for automated test equipment Dec 14, 2006 Issued
Array ( [id] => 304098 [patent_doc_number] => 07535239 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-05-19 [patent_title] => 'Probe card configured for interchangeable heads' [patent_app_type] => utility [patent_app_number] => 11/639627 [patent_app_country] => US [patent_app_date] => 2006-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 2441 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 184 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/535/07535239.pdf [firstpage_image] =>[orig_patent_app_number] => 11639627 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/639627
Probe card configured for interchangeable heads Dec 13, 2006 Issued
Array ( [id] => 7801730 [patent_doc_number] => 08130005 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-03-06 [patent_title] => 'Electrical guard structures for protecting a signal trace from electrical interference' [patent_app_type] => utility [patent_app_number] => 11/610925 [patent_app_country] => US [patent_app_date] => 2006-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 24 [patent_no_of_words] => 7861 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/130/08130005.pdf [firstpage_image] =>[orig_patent_app_number] => 11610925 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/610925
Electrical guard structures for protecting a signal trace from electrical interference Dec 13, 2006 Issued
Array ( [id] => 4731722 [patent_doc_number] => 20080048700 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-28 [patent_title] => 'INTEGRATED CIRCUIT PROBING APPARATUS HAVING A TEMPERATURE-ADJUSTING MECHANISM' [patent_app_type] => utility [patent_app_number] => 11/609558 [patent_app_country] => US [patent_app_date] => 2006-12-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 2055 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20080048700.pdf [firstpage_image] =>[orig_patent_app_number] => 11609558 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/609558
Integrated circuit probing apparatus having a temperature-adjusting mechanism Dec 11, 2006 Issued
Array ( [id] => 5026591 [patent_doc_number] => 20070268037 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-11-22 [patent_title] => 'CIRCUIT TESTING APPARATUS' [patent_app_type] => utility [patent_app_number] => 11/608226 [patent_app_country] => US [patent_app_date] => 2006-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1921 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0268/20070268037.pdf [firstpage_image] =>[orig_patent_app_number] => 11608226 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/608226
CIRCUIT TESTING APPARATUS Dec 6, 2006 Abandoned
Array ( [id] => 5157895 [patent_doc_number] => 20070170939 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-26 [patent_title] => 'Apparatus for testing semiconductor test system and method thereof' [patent_app_type] => utility [patent_app_number] => 11/635745 [patent_app_country] => US [patent_app_date] => 2006-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4144 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0170/20070170939.pdf [firstpage_image] =>[orig_patent_app_number] => 11635745 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/635745
Apparatus for testing semiconductor test system and method thereof Dec 6, 2006 Issued
Array ( [id] => 590303 [patent_doc_number] => 07443180 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-10-28 [patent_title] => 'On-chip probing apparatus' [patent_app_type] => utility [patent_app_number] => 11/567449 [patent_app_country] => US [patent_app_date] => 2006-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1529 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 170 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/443/07443180.pdf [firstpage_image] =>[orig_patent_app_number] => 11567449 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/567449
On-chip probing apparatus Dec 5, 2006 Issued
Array ( [id] => 4821417 [patent_doc_number] => 20080122470 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-29 [patent_title] => 'Probe installed to a probe card' [patent_app_type] => utility [patent_app_number] => 11/604067 [patent_app_country] => US [patent_app_date] => 2006-11-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3109 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0122/20080122470.pdf [firstpage_image] =>[orig_patent_app_number] => 11604067 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/604067
Probe installed to a probe card Nov 26, 2006 Abandoned
Array ( [id] => 311588 [patent_doc_number] => 07528620 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-05-05 [patent_title] => 'Probe card transfer assist apparatus and inspection equipment using same' [patent_app_type] => utility [patent_app_number] => 11/563427 [patent_app_country] => US [patent_app_date] => 2006-11-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 24 [patent_no_of_words] => 12569 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 78 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/528/07528620.pdf [firstpage_image] =>[orig_patent_app_number] => 11563427 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/563427
Probe card transfer assist apparatus and inspection equipment using same Nov 26, 2006 Issued
Array ( [id] => 330969 [patent_doc_number] => 07511468 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-31 [patent_title] => 'Harmonics measurement instrument with in-situ calibration' [patent_app_type] => utility [patent_app_number] => 11/603227 [patent_app_country] => US [patent_app_date] => 2006-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3732 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 182 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/511/07511468.pdf [firstpage_image] =>[orig_patent_app_number] => 11603227 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/603227
Harmonics measurement instrument with in-situ calibration Nov 19, 2006 Issued
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