Joshua Benitez Rosario

Array ( [id] => 233327 [patent_doc_number] => 07598756 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-10-06 [patent_title] => 'Inspection device and inspection method' [patent_app_type] => utility [patent_app_number] => 11/600149 [patent_app_country] => US [patent_app_date] => 2006-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 29 [patent_no_of_words] => 15574 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 374 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/598/07598756.pdf [firstpage_image] =>[orig_patent_app_number] => 11600149 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 260546 [patent_doc_number] => 07573276 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-08-11 [patent_title] => 'Probe card layout' [patent_app_type] => utility [patent_app_number] => 11/592425 [patent_app_country] => US [patent_app_date] => 2006-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 15 [patent_no_of_words] => 5141 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/573/07573276.pdf [firstpage_image] =>[orig_patent_app_number] => 11592425 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4497029 [patent_doc_number] => 07956625 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-06-07 [patent_title] => 'Undoped silicon heat spreader window' [patent_app_type] => utility [patent_app_number] => 11/591421 [patent_app_country] => US [patent_app_date] => 2006-10-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3980 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/956/07956625.pdf [firstpage_image] =>[orig_patent_app_number] => 11591421 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4511861 [patent_doc_number] => 07915902 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-03-29 [patent_title] => 'Dynamic burn-in systems and apparatuses' [patent_app_type] => utility [patent_app_number] => 11/550728 [patent_app_country] => US [patent_app_date] => 2006-10-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3190 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/915/07915902.pdf [firstpage_image] =>[orig_patent_app_number] => 11550728 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 300360 [patent_doc_number] => 07538564 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-05-26 [patent_title] => 'Methods and apparatus for utilizing an optical reference' [patent_app_type] => utility [patent_app_number] => 11/582829 [patent_app_country] => US [patent_app_date] => 2006-10-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 15 [patent_no_of_words] => 16110 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 216 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/538/07538564.pdf [firstpage_image] =>[orig_patent_app_number] => 11582829 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 25255 [patent_doc_number] => 07795887 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-09-14 [patent_title] => 'Photoconductive based electrical testing of transistor arrays' [patent_app_type] => utility [patent_app_number] => 12/089421 [patent_app_country] => US [patent_app_date] => 2006-10-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 15 [patent_no_of_words] => 6621 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/795/07795887.pdf [firstpage_image] =>[orig_patent_app_number] => 12089421 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 575479 [patent_doc_number] => 07463016 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-12-09 [patent_title] => 'Current sensor' [patent_app_type] => utility [patent_app_number] => 11/546901 [patent_app_country] => US [patent_app_date] => 2006-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 16 [patent_no_of_words] => 9106 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 304 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/463/07463016.pdf [firstpage_image] =>[orig_patent_app_number] => 11546901 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4743727 [patent_doc_number] => 20080088328 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-04-17 [patent_title] => 'Grounding scheme for high speed probing with reduced loop area' [patent_app_type] => utility [patent_app_number] => 11/580520 [patent_app_country] => US [patent_app_date] => 2006-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2970 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0088/20080088328.pdf [firstpage_image] =>[orig_patent_app_number] => 11580520 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5214098 [patent_doc_number] => 20070103178 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-05-10 [patent_title] => 'Probe sheet adhesion holder, probe card, semiconductor test device, and manufacturing method of semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/543021 [patent_app_country] => US [patent_app_date] => 2006-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 16355 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0103/20070103178.pdf [firstpage_image] =>[orig_patent_app_number] => 11543021 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 857576 [patent_doc_number] => 07375507 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-05-20 [patent_title] => 'Assembly group for current measurement' [patent_app_type] => utility [patent_app_number] => 11/542329 [patent_app_country] => US [patent_app_date] => 2006-10-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 4780 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 256 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/375/07375507.pdf [firstpage_image] =>[orig_patent_app_number] => 11542329 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5276046 [patent_doc_number] => 20090128178 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-05-21 [patent_title] => 'WAFER INSPECTING APPARATUS, WAFER INSPECTING METHOD AND COMPUTER PROGRAM' [patent_app_type] => utility [patent_app_number] => 12/065621 [patent_app_country] => US [patent_app_date] => 2006-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 8095 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0128/20090128178.pdf [firstpage_image] =>[orig_patent_app_number] => 12065621 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 824111 [patent_doc_number] => 07405585 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-07-29 [patent_title] => 'Versatile semiconductor test structure array' [patent_app_type] => utility [patent_app_number] => 11/522069 [patent_app_country] => US [patent_app_date] => 2006-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 2339 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/405/07405585.pdf [firstpage_image] =>[orig_patent_app_number] => 11522069 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6413919 [patent_doc_number] => 20100141248 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-10 [patent_title] => 'Magnetostriction Apparatus' [patent_app_type] => utility [patent_app_number] => 12/095740 [patent_app_country] => US [patent_app_date] => 2006-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4920 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0141/20100141248.pdf [firstpage_image] =>[orig_patent_app_number] => 12095740 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 225410 [patent_doc_number] => 07605596 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-10-20 [patent_title] => 'Probe card, apparatus and method for inspecting an object' [patent_app_type] => utility [patent_app_number] => 11/510620 [patent_app_country] => US [patent_app_date] => 2006-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4899 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/605/07605596.pdf [firstpage_image] =>[orig_patent_app_number] => 11510620 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5686328 [patent_doc_number] => 20060284643 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-21 [patent_title] => 'Method for inspecting array substrates' [patent_app_type] => utility [patent_app_number] => 11/510629 [patent_app_country] => US [patent_app_date] => 2006-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5685 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0284/20060284643.pdf [firstpage_image] =>[orig_patent_app_number] => 11510629 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 800691 [patent_doc_number] => 07425839 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-09-16 [patent_title] => 'Systems and methods for testing packaged microelectronic devices' [patent_app_type] => utility [patent_app_number] => 11/509907 [patent_app_country] => US [patent_app_date] => 2006-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4644 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 26 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/425/07425839.pdf [firstpage_image] =>[orig_patent_app_number] => 11509907 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 345636 [patent_doc_number] => 07498826 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-03 [patent_title] => 'Probe array wafer' [patent_app_type] => utility [patent_app_number] => 11/511061 [patent_app_country] => US [patent_app_date] => 2006-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 9 [patent_no_of_words] => 1396 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/498/07498826.pdf [firstpage_image] =>[orig_patent_app_number] => 11511061 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5181065 [patent_doc_number] => 20070052407 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-03-08 [patent_title] => 'Device and method for measuring a current flowing in an electrical conductor' [patent_app_type] => utility [patent_app_number] => 11/510124 [patent_app_country] => US [patent_app_date] => 2006-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4637 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0052/20070052407.pdf [firstpage_image] =>[orig_patent_app_number] => 11510124 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4731706 [patent_doc_number] => 20080048684 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-28 [patent_title] => 'Circuit module testing apparatus and method' [patent_app_type] => utility [patent_app_number] => 11/508419 [patent_app_country] => US [patent_app_date] => 2006-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2752 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20080048684.pdf [firstpage_image] =>[orig_patent_app_number] => 11508419 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4667621 [patent_doc_number] => 20080042681 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-21 [patent_title] => 'Integrated circuit device with current measurement' [patent_app_type] => utility [patent_app_number] => 11/502924 [patent_app_country] => US [patent_app_date] => 2006-08-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1143 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0042/20080042681.pdf [firstpage_image] =>[orig_patent_app_number] => 11502924 [rel_patent_id] =>[rel_patent_doc_number] =>)