Search

Joshua Benitez Rosario

Supervisory Patent Examiner (ID: 18038, Phone: (571)270-1435 , Office: P/2834 )

Most Active Art Unit
2858
Art Unit(s)
2829, 2858, 4134, 2815, 4119, 2867, 2834
Total Applications
422
Issued Applications
312
Pending Applications
12
Abandoned Applications
100

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5686316 [patent_doc_number] => 20060284631 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-21 [patent_title] => 'Imaging test socket, system, and method of testing an image sensor device' [patent_app_type] => utility [patent_app_number] => 11/140720 [patent_app_country] => US [patent_app_date] => 2005-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4701 [patent_no_of_claims] => 51 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0284/20060284631.pdf [firstpage_image] =>[orig_patent_app_number] => 11140720 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/140720
Imaging test socket, system, and method of testing an image sensor device May 30, 2005 Abandoned
Array ( [id] => 901251 [patent_doc_number] => 07339391 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-04 [patent_title] => 'Defect detection method' [patent_app_type] => utility [patent_app_number] => 10/908828 [patent_app_country] => US [patent_app_date] => 2005-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2786 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/339/07339391.pdf [firstpage_image] =>[orig_patent_app_number] => 10908828 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/908828
Defect detection method May 26, 2005 Issued
Array ( [id] => 821034 [patent_doc_number] => 07408369 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-08-05 [patent_title] => 'System and method for determining thermal shutdown characteristics' [patent_app_type] => utility [patent_app_number] => 11/122624 [patent_app_country] => US [patent_app_date] => 2005-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 7135 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/408/07408369.pdf [firstpage_image] =>[orig_patent_app_number] => 11122624 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/122624
System and method for determining thermal shutdown characteristics May 4, 2005 Issued
Array ( [id] => 4655291 [patent_doc_number] => 20080024151 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-31 [patent_title] => 'Socket For Connecting Ball-Grid-Array Integrated Circuit Device To Test Circuit' [patent_app_type] => utility [patent_app_number] => 11/569418 [patent_app_country] => US [patent_app_date] => 2005-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4042 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20080024151.pdf [firstpage_image] =>[orig_patent_app_number] => 11569418 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/569418
Socket for connecting ball-grid-array integrated circuit device to test circuit Apr 12, 2005 Issued
Array ( [id] => 837506 [patent_doc_number] => 07394275 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-07-01 [patent_title] => 'Systems and methods for generating and evaluating high frequency, low voltage swing signals at in-circuit testing' [patent_app_type] => utility [patent_app_number] => 11/092423 [patent_app_country] => US [patent_app_date] => 2005-03-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3714 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/394/07394275.pdf [firstpage_image] =>[orig_patent_app_number] => 11092423 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/092423
Systems and methods for generating and evaluating high frequency, low voltage swing signals at in-circuit testing Mar 28, 2005 Issued
Array ( [id] => 458092 [patent_doc_number] => 07245119 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-07-17 [patent_title] => 'fixture for manual functional testing of wireless devices' [patent_app_type] => utility [patent_app_number] => 11/072224 [patent_app_country] => US [patent_app_date] => 2005-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 5153 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/245/07245119.pdf [firstpage_image] =>[orig_patent_app_number] => 11072224 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/072224
fixture for manual functional testing of wireless devices Mar 6, 2005 Issued
Array ( [id] => 185935 [patent_doc_number] => 07649369 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-01-19 [patent_title] => 'Probe and method of manufacturing probe' [patent_app_type] => utility [patent_app_number] => 10/591645 [patent_app_country] => US [patent_app_date] => 2005-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 8 [patent_no_of_words] => 3445 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/649/07649369.pdf [firstpage_image] =>[orig_patent_app_number] => 10591645 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/591645
Probe and method of manufacturing probe Mar 2, 2005 Issued
Array ( [id] => 5703069 [patent_doc_number] => 20060192116 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-31 [patent_title] => 'Charged particle beam device probe operation' [patent_app_type] => utility [patent_app_number] => 11/064127 [patent_app_country] => US [patent_app_date] => 2005-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 21422 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0192/20060192116.pdf [firstpage_image] =>[orig_patent_app_number] => 11064127 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/064127
Charged particle beam device probe operation Feb 22, 2005 Issued
Array ( [id] => 5228566 [patent_doc_number] => 20070290673 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-20 [patent_title] => 'Portable Electric Testing Equipment' [patent_app_type] => utility [patent_app_number] => 10/581021 [patent_app_country] => US [patent_app_date] => 2004-11-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2281 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20070290673.pdf [firstpage_image] =>[orig_patent_app_number] => 10581021 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/581021
Portable Electric Testing Equipment Nov 25, 2004 Abandoned
Array ( [id] => 5217896 [patent_doc_number] => 20070159207 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-12 [patent_title] => 'Device and method for analyzing a sample plate' [patent_app_type] => utility [patent_app_number] => 10/582122 [patent_app_country] => US [patent_app_date] => 2004-11-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 8648 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0159/20070159207.pdf [firstpage_image] =>[orig_patent_app_number] => 10582122 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/582122
Device and method for analyzing a sample plate Nov 17, 2004 Issued
Array ( [id] => 5139485 [patent_doc_number] => 20070001701 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-04 [patent_title] => 'Circuit board inspection device' [patent_app_type] => utility [patent_app_number] => 10/573473 [patent_app_country] => US [patent_app_date] => 2004-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 21343 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20070001701.pdf [firstpage_image] =>[orig_patent_app_number] => 10573473 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/573473
Circuit board inspection device Sep 26, 2004 Abandoned
Array ( [id] => 5156086 [patent_doc_number] => 20070038969 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-15 [patent_title] => 'Electronic ultimate defects analyzer detecting all defects in pcb/mcm' [patent_app_type] => utility [patent_app_number] => 10/595166 [patent_app_country] => US [patent_app_date] => 2004-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2976 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0038/20070038969.pdf [firstpage_image] =>[orig_patent_app_number] => 10595166 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/595166
Electronic ultimate defects analyzer detecting all defects in pcb/mcm Sep 13, 2004 Abandoned
Array ( [id] => 7597151 [patent_doc_number] => 07619427 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-11-17 [patent_title] => 'Temperature control device and temperature control method' [patent_app_type] => utility [patent_app_number] => 10/568623 [patent_app_country] => US [patent_app_date] => 2004-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 10420 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/619/07619427.pdf [firstpage_image] =>[orig_patent_app_number] => 10568623 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/568623
Temperature control device and temperature control method Aug 17, 2004 Issued
09/601013 Device for testing the electromagnetic compatibility of systems having large dimensions Jul 25, 2000 Abandoned
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