Search

Joshua Benitez Rosario

Supervisory Patent Examiner (ID: 18038, Phone: (571)270-1435 , Office: P/2834 )

Most Active Art Unit
2858
Art Unit(s)
2829, 2858, 4134, 2815, 4119, 2867, 2834
Total Applications
422
Issued Applications
312
Pending Applications
12
Abandoned Applications
100

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 8871323 [patent_doc_number] => 08466702 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-06-18 [patent_title] => 'Test system and substrate unit for testing' [patent_app_type] => utility [patent_app_number] => 12/953352 [patent_app_country] => US [patent_app_date] => 2010-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 5319 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12953352 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/953352
Test system and substrate unit for testing Nov 22, 2010 Issued
Array ( [id] => 8083369 [patent_doc_number] => 08149011 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2012-04-03 [patent_title] => 'Stress programming of transistors' [patent_app_type] => utility [patent_app_number] => 12/953117 [patent_app_country] => US [patent_app_date] => 2010-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 4023 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/149/08149011.pdf [firstpage_image] =>[orig_patent_app_number] => 12953117 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/953117
Stress programming of transistors Nov 22, 2010 Issued
Array ( [id] => 6004702 [patent_doc_number] => 20110057662 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-10 [patent_title] => 'Arc Detector And Associated Method For Detecting Undesired Arcs' [patent_app_type] => utility [patent_app_number] => 12/909674 [patent_app_country] => US [patent_app_date] => 2010-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3321 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0057/20110057662.pdf [firstpage_image] =>[orig_patent_app_number] => 12909674 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/909674
Arc detector and associated method for detecting undesired arcs Oct 20, 2010 Issued
Array ( [id] => 8933378 [patent_doc_number] => 08493083 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-07-23 [patent_title] => 'Test apparatus, test method and computer readable medium' [patent_app_type] => utility [patent_app_number] => 12/869545 [patent_app_country] => US [patent_app_date] => 2010-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 12591 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12869545 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/869545
Test apparatus, test method and computer readable medium Aug 25, 2010 Issued
Array ( [id] => 4622312 [patent_doc_number] => RE042637 [patent_country] => US [patent_kind] => E1 [patent_issue_date] => 2011-08-23 [patent_title] => 'Probe card' [patent_app_type] => reissue [patent_app_number] => 12/806046 [patent_app_country] => US [patent_app_date] => 2010-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 8135 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 248 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/RE/042/RE042637.pdf [firstpage_image] =>[orig_patent_app_number] => 12806046 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/806046
Probe card Aug 2, 2010 Issued
Array ( [id] => 6193606 [patent_doc_number] => 20110025360 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-03 [patent_title] => 'SEMICONDUCTOR INTEGRATED CIRCUIT TEST DEVICE' [patent_app_type] => utility [patent_app_number] => 12/838967 [patent_app_country] => US [patent_app_date] => 2010-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6923 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0025/20110025360.pdf [firstpage_image] =>[orig_patent_app_number] => 12838967 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/838967
SEMICONDUCTOR INTEGRATED CIRCUIT TEST DEVICE Jul 18, 2010 Abandoned
Array ( [id] => 9324285 [patent_doc_number] => 08659312 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-02-25 [patent_title] => 'Probe card and semiconductor wafer inspection method using the same' [patent_app_type] => utility [patent_app_number] => 12/838849 [patent_app_country] => US [patent_app_date] => 2010-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 22 [patent_no_of_words] => 11841 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 225 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12838849 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/838849
Probe card and semiconductor wafer inspection method using the same Jul 18, 2010 Issued
Array ( [id] => 6146212 [patent_doc_number] => 20110018580 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-27 [patent_title] => 'POWER SUPPLY APPARATUS, POWER SUPPLY UNIT DIAGNOSTIC APPARATUS, AND METHOD FOR CONTROLLING POWER SUPPLY APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/837611 [patent_app_country] => US [patent_app_date] => 2010-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7261 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0018/20110018580.pdf [firstpage_image] =>[orig_patent_app_number] => 12837611 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/837611
Power supply apparatus, power supply unit diagnostic apparatus, and method for controlling power supply apparatus Jul 15, 2010 Issued
Array ( [id] => 9060684 [patent_doc_number] => 08547123 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-10-01 [patent_title] => 'Storage device testing system with a conductive heating assembly' [patent_app_type] => utility [patent_app_number] => 12/836915 [patent_app_country] => US [patent_app_date] => 2010-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 59 [patent_figures_cnt] => 59 [patent_no_of_words] => 11811 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12836915 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/836915
Storage device testing system with a conductive heating assembly Jul 14, 2010 Issued
Array ( [id] => 8785331 [patent_doc_number] => 08432178 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-04-30 [patent_title] => 'Testing device and method thereof' [patent_app_type] => utility [patent_app_number] => 12/826911 [patent_app_country] => US [patent_app_date] => 2010-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1439 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 189 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12826911 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/826911
Testing device and method thereof Jun 29, 2010 Issued
Array ( [id] => 7667254 [patent_doc_number] => 20110316523 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-12-29 [patent_title] => 'AVOMETER' [patent_app_type] => utility [patent_app_number] => 12/825994 [patent_app_country] => US [patent_app_date] => 2010-06-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1083 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12825994 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/825994
AVOMETER Jun 28, 2010 Abandoned
Array ( [id] => 8534109 [patent_doc_number] => 08310267 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-11-13 [patent_title] => 'Semiconductor integrated circuit, and method for testing semiconductor integrated circuit' [patent_app_type] => utility [patent_app_number] => 12/823674 [patent_app_country] => US [patent_app_date] => 2010-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 4166 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12823674 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/823674
Semiconductor integrated circuit, and method for testing semiconductor integrated circuit Jun 24, 2010 Issued
Array ( [id] => 8739028 [patent_doc_number] => 08410803 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-04-02 [patent_title] => 'Test apparatus of semiconductor device and method thereof' [patent_app_type] => utility [patent_app_number] => 12/820623 [patent_app_country] => US [patent_app_date] => 2010-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 14 [patent_no_of_words] => 4252 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12820623 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/820623
Test apparatus of semiconductor device and method thereof Jun 21, 2010 Issued
Array ( [id] => 6099719 [patent_doc_number] => 20110163774 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-07-07 [patent_title] => 'PROBE CARD' [patent_app_type] => utility [patent_app_number] => 12/819460 [patent_app_country] => US [patent_app_date] => 2010-06-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6985 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0163/20110163774.pdf [firstpage_image] =>[orig_patent_app_number] => 12819460 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/819460
PROBE CARD Jun 20, 2010 Abandoned
Array ( [id] => 6538981 [patent_doc_number] => 20100271060 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-10-28 [patent_title] => 'MEMBRANE PROBING METHOD USING IMPROVED CONTACT' [patent_app_type] => utility [patent_app_number] => 12/818521 [patent_app_country] => US [patent_app_date] => 2010-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 9642 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0271/20100271060.pdf [firstpage_image] =>[orig_patent_app_number] => 12818521 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/818521
Membrane probing method using improved contact Jun 17, 2010 Issued
Array ( [id] => 6146208 [patent_doc_number] => 20110018576 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-27 [patent_title] => 'METHOD AND DEVICE FOR TESTING SEMICONDUCTOR' [patent_app_type] => utility [patent_app_number] => 12/818857 [patent_app_country] => US [patent_app_date] => 2010-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3545 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0018/20110018576.pdf [firstpage_image] =>[orig_patent_app_number] => 12818857 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/818857
METHOD AND DEVICE FOR TESTING SEMICONDUCTOR Jun 17, 2010 Abandoned
Array ( [id] => 8578528 [patent_doc_number] => 08344744 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-01-01 [patent_title] => 'Probe station for on-wafer-measurement under EMI-shielding' [patent_app_type] => utility [patent_app_number] => 12/818442 [patent_app_country] => US [patent_app_date] => 2010-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3733 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12818442 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/818442
Probe station for on-wafer-measurement under EMI-shielding Jun 17, 2010 Issued
Array ( [id] => 8544215 [patent_doc_number] => 08319510 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-11-27 [patent_title] => 'Pre-alignment method of semiconductor wafer and computer-readable recording medium having pre-alignment program recorded thereon' [patent_app_type] => utility [patent_app_number] => 12/817876 [patent_app_country] => US [patent_app_date] => 2010-06-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 4390 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 270 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12817876 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/817876
Pre-alignment method of semiconductor wafer and computer-readable recording medium having pre-alignment program recorded thereon Jun 16, 2010 Issued
Array ( [id] => 6178634 [patent_doc_number] => 20110121852 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-26 [patent_title] => 'PROBE CARD AND TEST APPARATUS INCLUDING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/817826 [patent_app_country] => US [patent_app_date] => 2010-06-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 12295 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0121/20110121852.pdf [firstpage_image] =>[orig_patent_app_number] => 12817826 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/817826
Probe card and test apparatus including the same Jun 16, 2010 Issued
Array ( [id] => 6378694 [patent_doc_number] => 20100301889 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-12-02 [patent_title] => 'CIRCUIT BOARD UNIT AND TESTING APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/784333 [patent_app_country] => US [patent_app_date] => 2010-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 11500 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0301/20100301889.pdf [firstpage_image] =>[orig_patent_app_number] => 12784333 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/784333
Circuit board unit and testing apparatus May 19, 2010 Issued
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