Search

Joshua Benitez Rosario

Supervisory Patent Examiner (ID: 18038, Phone: (571)270-1435 , Office: P/2834 )

Most Active Art Unit
2858
Art Unit(s)
2829, 2858, 4134, 2815, 4119, 2867, 2834
Total Applications
422
Issued Applications
312
Pending Applications
12
Abandoned Applications
100

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6419723 [patent_doc_number] => 20100277196 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-04 [patent_title] => 'SEMICONDUCTOR TEST SYSTEM AND METHOD' [patent_app_type] => utility [patent_app_number] => 12/434010 [patent_app_country] => US [patent_app_date] => 2009-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3764 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0277/20100277196.pdf [firstpage_image] =>[orig_patent_app_number] => 12434010 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/434010
Semiconductor test system and method Apr 30, 2009 Issued
Array ( [id] => 6553976 [patent_doc_number] => 20100127721 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-05-27 [patent_title] => 'TEST PROBE STRUCTURE' [patent_app_type] => utility [patent_app_number] => 12/433217 [patent_app_country] => US [patent_app_date] => 2009-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3664 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0127/20100127721.pdf [firstpage_image] =>[orig_patent_app_number] => 12433217 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/433217
Test probe structure Apr 29, 2009 Issued
Array ( [id] => 5456431 [patent_doc_number] => 20090256583 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-10-15 [patent_title] => 'Vertical Microprobes for Contacting Electronic Components and Method for Making Such Probes' [patent_app_type] => utility [patent_app_number] => 12/429110 [patent_app_country] => US [patent_app_date] => 2009-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 25 [patent_no_of_words] => 13204 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0256/20090256583.pdf [firstpage_image] =>[orig_patent_app_number] => 12429110 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/429110
Vertical Microprobes for Contacting Electronic Components and Method for Making Such Probes Apr 22, 2009 Abandoned
Array ( [id] => 7535858 [patent_doc_number] => 08049492 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-11-01 [patent_title] => 'Position measuring apparatus' [patent_app_type] => utility [patent_app_number] => 12/384372 [patent_app_country] => US [patent_app_date] => 2009-04-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2425 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/049/08049492.pdf [firstpage_image] =>[orig_patent_app_number] => 12384372 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/384372
Position measuring apparatus Apr 1, 2009 Issued
Array ( [id] => 6287191 [patent_doc_number] => 20100237875 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-23 [patent_title] => 'Unified brake and light tester' [patent_app_type] => utility [patent_app_number] => 12/382522 [patent_app_country] => US [patent_app_date] => 2009-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2650 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0237/20100237875.pdf [firstpage_image] =>[orig_patent_app_number] => 12382522 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/382522
Unified brake and light tester Mar 17, 2009 Abandoned
Array ( [id] => 9047474 [patent_doc_number] => 08542028 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-09-24 [patent_title] => 'Inspection circuit, electro-optic device, and electronic apparatus' [patent_app_type] => utility [patent_app_number] => 12/405368 [patent_app_country] => US [patent_app_date] => 2009-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 8223 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 209 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12405368 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/405368
Inspection circuit, electro-optic device, and electronic apparatus Mar 16, 2009 Issued
Array ( [id] => 5401782 [patent_doc_number] => 20090237095 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-09-24 [patent_title] => 'METHOD AND DEVICE FOR MEASURING POWDER PROPERTIES' [patent_app_type] => utility [patent_app_number] => 12/403702 [patent_app_country] => US [patent_app_date] => 2009-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5312 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0237/20090237095.pdf [firstpage_image] =>[orig_patent_app_number] => 12403702 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/403702
Method and device for measuring powder properties Mar 12, 2009 Issued
Array ( [id] => 5340979 [patent_doc_number] => 20090179629 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-16 [patent_title] => 'On-chip current sensing methods and systems' [patent_app_type] => utility [patent_app_number] => 12/382286 [patent_app_country] => US [patent_app_date] => 2009-03-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4855 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0179/20090179629.pdf [firstpage_image] =>[orig_patent_app_number] => 12382286 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/382286
On-chip current sensing methods and systems Mar 11, 2009 Issued
Array ( [id] => 4477862 [patent_doc_number] => 07868631 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-01-11 [patent_title] => 'Solar cell testing apparatus' [patent_app_type] => utility [patent_app_number] => 12/395712 [patent_app_country] => US [patent_app_date] => 2009-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3381 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/868/07868631.pdf [firstpage_image] =>[orig_patent_app_number] => 12395712 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/395712
Solar cell testing apparatus Mar 1, 2009 Issued
Array ( [id] => 5512502 [patent_doc_number] => 20090212806 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-08-27 [patent_title] => 'System for Making Contact Between a Transmit/Receive Module and a Testing Device' [patent_app_type] => utility [patent_app_number] => 12/392712 [patent_app_country] => US [patent_app_date] => 2009-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2912 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0212/20090212806.pdf [firstpage_image] =>[orig_patent_app_number] => 12392712 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/392712
System for making contact between a transmit/receive module and a testing device Feb 24, 2009 Issued
Array ( [id] => 4576794 [patent_doc_number] => 07859283 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-12-28 [patent_title] => 'Probe apparatus, probing method, and storage medium' [patent_app_type] => utility [patent_app_number] => 12/389913 [patent_app_country] => US [patent_app_date] => 2009-02-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 35 [patent_no_of_words] => 7403 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 306 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/859/07859283.pdf [firstpage_image] =>[orig_patent_app_number] => 12389913 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/389913
Probe apparatus, probing method, and storage medium Feb 19, 2009 Issued
Array ( [id] => 8422470 [patent_doc_number] => 08278959 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-10-02 [patent_title] => 'Method and system for measuring laser induced phenomena changes in a semiconductor device' [patent_app_type] => utility [patent_app_number] => 12/372914 [patent_app_country] => US [patent_app_date] => 2009-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3130 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12372914 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/372914
Method and system for measuring laser induced phenomena changes in a semiconductor device Feb 17, 2009 Issued
Array ( [id] => 4528290 [patent_doc_number] => 07952378 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-05-31 [patent_title] => 'Tunable stress technique for reliability degradation measurement' [patent_app_type] => utility [patent_app_number] => 12/358510 [patent_app_country] => US [patent_app_date] => 2009-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 5726 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/952/07952378.pdf [firstpage_image] =>[orig_patent_app_number] => 12358510 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/358510
Tunable stress technique for reliability degradation measurement Jan 22, 2009 Issued
Array ( [id] => 6193604 [patent_doc_number] => 20110025358 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-03 [patent_title] => 'PROBE UNIT' [patent_app_type] => utility [patent_app_number] => 12/735598 [patent_app_country] => US [patent_app_date] => 2009-01-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5288 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0025/20110025358.pdf [firstpage_image] =>[orig_patent_app_number] => 12735598 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/735598
Probe unit Jan 21, 2009 Issued
Array ( [id] => 6305833 [patent_doc_number] => 20100109661 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-05-06 [patent_title] => 'HALL-EFFECT SWITCH CIRCUIT ALLOWING LOW VOLTAGE OPERATION' [patent_app_type] => utility [patent_app_number] => 12/355042 [patent_app_country] => US [patent_app_date] => 2009-01-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2553 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20100109661.pdf [firstpage_image] =>[orig_patent_app_number] => 12355042 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/355042
Hall-effect switch circuit allowing low voltage operation Jan 15, 2009 Issued
Array ( [id] => 124532 [patent_doc_number] => 07705623 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-04-27 [patent_title] => 'Method and device for detecting interlaminar short circuits' [patent_app_type] => utility [patent_app_number] => 12/352923 [patent_app_country] => US [patent_app_date] => 2009-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 6365 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/705/07705623.pdf [firstpage_image] =>[orig_patent_app_number] => 12352923 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/352923
Method and device for detecting interlaminar short circuits Jan 12, 2009 Issued
Array ( [id] => 5328384 [patent_doc_number] => 20090108861 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-30 [patent_title] => 'STIFFENER ASSEMBLY FOR USE WITH TESTING DEVICES' [patent_app_type] => utility [patent_app_number] => 12/345740 [patent_app_country] => US [patent_app_date] => 2008-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5404 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0108/20090108861.pdf [firstpage_image] =>[orig_patent_app_number] => 12345740 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/345740
Stiffener assembly for use with testing devices Dec 29, 2008 Issued
Array ( [id] => 4436180 [patent_doc_number] => 07898277 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-03-01 [patent_title] => 'Hot-electronic injection testing of transistors on a wafer' [patent_app_type] => utility [patent_app_number] => 12/344016 [patent_app_country] => US [patent_app_date] => 2008-12-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3499 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 235 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/898/07898277.pdf [firstpage_image] =>[orig_patent_app_number] => 12344016 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/344016
Hot-electronic injection testing of transistors on a wafer Dec 23, 2008 Issued
Array ( [id] => 6282601 [patent_doc_number] => 20100156519 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-24 [patent_title] => 'ELECTRICAL SYSTEM, VOLTAGE REFERENCE GENERATION CIRCUIT, AND CALIBRATION METHOD OF THE CIRCUIT' [patent_app_type] => utility [patent_app_number] => 12/340110 [patent_app_country] => US [patent_app_date] => 2008-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3871 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0156/20100156519.pdf [firstpage_image] =>[orig_patent_app_number] => 12340110 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/340110
Electrical system, voltage reference generation circuit, and calibration method of the circuit Dec 18, 2008 Issued
Array ( [id] => 7535853 [patent_doc_number] => 08049487 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-11-01 [patent_title] => 'Power measurement circuit' [patent_app_type] => utility [patent_app_number] => 12/338235 [patent_app_country] => US [patent_app_date] => 2008-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 19 [patent_no_of_words] => 3671 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/049/08049487.pdf [firstpage_image] =>[orig_patent_app_number] => 12338235 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/338235
Power measurement circuit Dec 17, 2008 Issued
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