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Josiah C. Cocks

Examiner (ID: 7289)

Most Active Art Unit
3749
Art Unit(s)
3743, 3749
Total Applications
731
Issued Applications
472
Pending Applications
82
Abandoned Applications
177

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6324288 [patent_doc_number] => 20100244868 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-30 [patent_title] => 'Wireless Clamp-on Current Probe' [patent_app_type] => utility [patent_app_number] => 12/720055 [patent_app_country] => US [patent_app_date] => 2010-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 6104 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0244/20100244868.pdf [firstpage_image] =>[orig_patent_app_number] => 12720055 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/720055
Wireless Clamp-on Current Probe Mar 8, 2010 Abandoned
Array ( [id] => 6483024 [patent_doc_number] => 20100213968 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-26 [patent_title] => 'TESTING INTEGRATED CIRCUITS' [patent_app_type] => utility [patent_app_number] => 12/713047 [patent_app_country] => US [patent_app_date] => 2010-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2312 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0213/20100213968.pdf [firstpage_image] =>[orig_patent_app_number] => 12713047 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/713047
TESTING INTEGRATED CIRCUITS Feb 24, 2010 Abandoned
Array ( [id] => 6482968 [patent_doc_number] => 20100213963 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-26 [patent_title] => 'SEMICONDUCTOR INTEGRATED CIRCUIT TEST METHOD' [patent_app_type] => utility [patent_app_number] => 12/710377 [patent_app_country] => US [patent_app_date] => 2010-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4107 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0213/20100213963.pdf [firstpage_image] =>[orig_patent_app_number] => 12710377 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/710377
Semiconductor integrated circuit test method Feb 22, 2010 Issued
Array ( [id] => 6517989 [patent_doc_number] => 20100211348 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-19 [patent_title] => 'Method and apparatus for locating a fault in an electrical conductor, with interference compensation' [patent_app_type] => utility [patent_app_number] => 12/657824 [patent_app_country] => US [patent_app_date] => 2010-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5300 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0211/20100211348.pdf [firstpage_image] =>[orig_patent_app_number] => 12657824 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/657824
Method and apparatus for locating a fault in an electrical conductor, with interference compensation Jan 26, 2010 Issued
Array ( [id] => 6324263 [patent_doc_number] => 20100244865 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-30 [patent_title] => 'VOLTAGE MEASUREMENTS OF ELECTRICALLY CONDUCTING ELEMENTS IN SYSTEMS FOR CONTROLLING ELECTRICAL PROCESSES' [patent_app_type] => utility [patent_app_number] => 12/663440 [patent_app_country] => US [patent_app_date] => 2008-06-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4584 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0244/20100244865.pdf [firstpage_image] =>[orig_patent_app_number] => 12663440 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/663440
Voltage measurements of electrically conducting elements in systems for controlling electrical processes Jun 1, 2008 Issued
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