
Kara E. Geisel
Supervisory Patent Examiner (ID: 1769, Phone: (571)272-2416 , Office: P/2877 )
| Most Active Art Unit | 2877 |
| Art Unit(s) | RD00, 2877 |
| Total Applications | 981 |
| Issued Applications | 748 |
| Pending Applications | 86 |
| Abandoned Applications | 154 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4502898
[patent_doc_number] => 07948624
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-05-24
[patent_title] => 'Photocatalysis testing device'
[patent_app_type] => utility
[patent_app_number] => 12/436141
[patent_app_country] => US
[patent_app_date] => 2009-05-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 916
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 195
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/948/07948624.pdf
[firstpage_image] =>[orig_patent_app_number] => 12436141
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/436141 | Photocatalysis testing device | May 5, 2009 | Issued |
Array
(
[id] => 6462106
[patent_doc_number] => 20100284009
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-11-11
[patent_title] => 'COLOR ANALYSIS SYSTEM AND METHOD'
[patent_app_type] => utility
[patent_app_number] => 12/436240
[patent_app_country] => US
[patent_app_date] => 2009-05-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2658
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0284/20100284009.pdf
[firstpage_image] =>[orig_patent_app_number] => 12436240
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/436240 | Color analysis system and method | May 5, 2009 | Issued |
Array
(
[id] => 8847444
[patent_doc_number] => 08456633
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-06-04
[patent_title] => 'Spectrometric process monitoring'
[patent_app_type] => utility
[patent_app_number] => 12/387643
[patent_app_country] => US
[patent_app_date] => 2009-05-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 16
[patent_no_of_words] => 13661
[patent_no_of_claims] => 94
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 104
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12387643
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/387643 | Spectrometric process monitoring | May 4, 2009 | Issued |
Array
(
[id] => 5484575
[patent_doc_number] => 20090274340
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-11-05
[patent_title] => 'SYSTEMS, METHODS AND DEVICES FOR USE IN ASSESSING FAT AND MUSCLE DEPTH'
[patent_app_type] => utility
[patent_app_number] => 12/435735
[patent_app_country] => US
[patent_app_date] => 2009-05-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 8286
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0274/20090274340.pdf
[firstpage_image] =>[orig_patent_app_number] => 12435735
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/435735 | Systems, methods and devices for use in assessing fat and muscle depth | May 4, 2009 | Issued |
Array
(
[id] => 5484015
[patent_doc_number] => 20090273780
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-11-05
[patent_title] => 'RAMAN SPECTRUM DETECTING METHOD AND RAMAN SPECTRUM DETECTING DEVICE'
[patent_app_type] => utility
[patent_app_number] => 12/434147
[patent_app_country] => US
[patent_app_date] => 2009-05-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 9274
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0273/20090273780.pdf
[firstpage_image] =>[orig_patent_app_number] => 12434147
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/434147 | RAMAN SPECTRUM DETECTING METHOD AND RAMAN SPECTRUM DETECTING DEVICE | Apr 30, 2009 | Abandoned |
Array
(
[id] => 9959374
[patent_doc_number] => 09007586
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2015-04-14
[patent_title] => 'Collection optics for a color sensor'
[patent_app_type] => utility
[patent_app_number] => 13/265222
[patent_app_country] => US
[patent_app_date] => 2009-04-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 12
[patent_no_of_words] => 4383
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 248
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13265222
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/265222 | Collection optics for a color sensor | Apr 19, 2009 | Issued |
Array
(
[id] => 6266723
[patent_doc_number] => 20100253941
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-10-07
[patent_title] => 'Coded Aperture Snapshot Spectral Imager and Method Therefor'
[patent_app_type] => utility
[patent_app_number] => 12/422031
[patent_app_country] => US
[patent_app_date] => 2009-04-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 5327
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0253/20100253941.pdf
[firstpage_image] =>[orig_patent_app_number] => 12422031
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/422031 | Coded aperture snapshot spectral imager and method therefor | Apr 9, 2009 | Issued |
Array
(
[id] => 5568310
[patent_doc_number] => 20090251688
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-10-08
[patent_title] => 'DEVICE FOR MEASURING THE DIFFUSION AND/OR ABSORPTION AND/OR REFRACTION OF A SAMPLE'
[patent_app_type] => utility
[patent_app_number] => 12/418333
[patent_app_country] => US
[patent_app_date] => 2009-04-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 3346
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12418333
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/418333 | Device for measuring the diffusion and/or absorption and/or refraction of a sample | Apr 2, 2009 | Issued |
Array
(
[id] => 8180915
[patent_doc_number] => 08180138
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-05-15
[patent_title] => 'Method and system for inspection of containers'
[patent_app_type] => utility
[patent_app_number] => 12/408751
[patent_app_country] => US
[patent_app_date] => 2009-03-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3607
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 177
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/180/08180138.pdf
[firstpage_image] =>[orig_patent_app_number] => 12408751
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/408751 | Method and system for inspection of containers | Mar 22, 2009 | Issued |
Array
(
[id] => 6147244
[patent_doc_number] => 20110019192
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-01-27
[patent_title] => 'SPECTRAL CHARACTERISTIC MEASURING SYSTEM, SPECTRAL CHARACTERISTIC MEASURING INSTRUMENT, AND DATA PROCESSING DEVICE'
[patent_app_type] => utility
[patent_app_number] => 12/934247
[patent_app_country] => US
[patent_app_date] => 2009-03-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 10278
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0019/20110019192.pdf
[firstpage_image] =>[orig_patent_app_number] => 12934247
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/934247 | Spectral characteristic measuring system, spectral characteristic measuring instrument, and data processing device | Mar 15, 2009 | Issued |
Array
(
[id] => 7731864
[patent_doc_number] => 08102525
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-01-24
[patent_title] => 'Systems and methods for detecting chemical and biological substances'
[patent_app_type] => utility
[patent_app_number] => 12/403522
[patent_app_country] => US
[patent_app_date] => 2009-03-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 31
[patent_figures_cnt] => 48
[patent_no_of_words] => 12626
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 119
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/102/08102525.pdf
[firstpage_image] =>[orig_patent_app_number] => 12403522
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/403522 | Systems and methods for detecting chemical and biological substances | Mar 12, 2009 | Issued |
Array
(
[id] => 125185
[patent_doc_number] => 07705974
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-04-27
[patent_title] => 'Metrology system with spectroscopic ellipsometer and photoacoustic measurements'
[patent_app_type] => utility
[patent_app_number] => 12/381477
[patent_app_country] => US
[patent_app_date] => 2009-03-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 9
[patent_no_of_words] => 6480
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 150
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/705/07705974.pdf
[firstpage_image] =>[orig_patent_app_number] => 12381477
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/381477 | Metrology system with spectroscopic ellipsometer and photoacoustic measurements | Mar 10, 2009 | Issued |
Array
(
[id] => 6308685
[patent_doc_number] => 20100110421
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-05-06
[patent_title] => 'DEGREE-OF-DISPERSION DETERMINATION METHOD FOR SINGLE-WALLED CARBON NANOTUBES AND DEGREE-OF-DISPERSION DETERMINATION APPARATUS FOR SINGLE-WALLED CARBON NANOTUBES'
[patent_app_type] => utility
[patent_app_number] => 12/398934
[patent_app_country] => US
[patent_app_date] => 2009-03-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 7892
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0110/20100110421.pdf
[firstpage_image] =>[orig_patent_app_number] => 12398934
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/398934 | Degree-of-dispersion determination method for single-walled carbon nanotubes and degree-of-dispersion determination apparatus for single-walled carbon nanotubes | Mar 4, 2009 | Issued |
Array
(
[id] => 85480
[patent_doc_number] => 07742156
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-06-22
[patent_title] => 'Method of testing optical materials by irradiating with high energy density radiation, optical materials selected by said method and uses thereof'
[patent_app_type] => utility
[patent_app_number] => 12/398402
[patent_app_country] => US
[patent_app_date] => 2009-03-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 6148
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 249
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/742/07742156.pdf
[firstpage_image] =>[orig_patent_app_number] => 12398402
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/398402 | Method of testing optical materials by irradiating with high energy density radiation, optical materials selected by said method and uses thereof | Mar 4, 2009 | Issued |
Array
(
[id] => 5402342
[patent_doc_number] => 20090237656
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-09-24
[patent_title] => 'Tomographic Imaging Using Hyperspectral Absorption Spectroscopy'
[patent_app_type] => utility
[patent_app_number] => 12/393845
[patent_app_country] => US
[patent_app_date] => 2009-02-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 17
[patent_no_of_words] => 12890
[patent_no_of_claims] => 35
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0237/20090237656.pdf
[firstpage_image] =>[orig_patent_app_number] => 12393845
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/393845 | Tomographic Imaging Using Hyperspectral Absorption Spectroscopy | Feb 25, 2009 | Abandoned |
Array
(
[id] => 9390578
[patent_doc_number] => 08687189
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-04-01
[patent_title] => 'Analysis of arrays by laser induced breakdown spectroscopy'
[patent_app_type] => utility
[patent_app_number] => 12/393926
[patent_app_country] => US
[patent_app_date] => 2009-02-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 10
[patent_no_of_words] => 15277
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 87
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12393926
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/393926 | Analysis of arrays by laser induced breakdown spectroscopy | Feb 25, 2009 | Issued |
Array
(
[id] => 7703866
[patent_doc_number] => 08089628
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-01-03
[patent_title] => 'Pulsed-multiline excitation for color-blind fluorescence detection'
[patent_app_type] => utility
[patent_app_number] => 12/388358
[patent_app_country] => US
[patent_app_date] => 2009-02-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 6
[patent_no_of_words] => 22910
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 152
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/089/08089628.pdf
[firstpage_image] =>[orig_patent_app_number] => 12388358
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/388358 | Pulsed-multiline excitation for color-blind fluorescence detection | Feb 17, 2009 | Issued |
Array
(
[id] => 8020677
[patent_doc_number] => 08139847
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-03-20
[patent_title] => 'Defect inspection tool and method of parameter tuning for defect inspection tool'
[patent_app_type] => utility
[patent_app_number] => 12/370784
[patent_app_country] => US
[patent_app_date] => 2009-02-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 18
[patent_no_of_words] => 12432
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 113
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/139/08139847.pdf
[firstpage_image] =>[orig_patent_app_number] => 12370784
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/370784 | Defect inspection tool and method of parameter tuning for defect inspection tool | Feb 12, 2009 | Issued |
Array
(
[id] => 4536294
[patent_doc_number] => 07924422
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-04-12
[patent_title] => 'Calibration method for optical metrology'
[patent_app_type] => utility
[patent_app_number] => 12/369947
[patent_app_country] => US
[patent_app_date] => 2009-02-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 17
[patent_no_of_words] => 15970
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 243
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/924/07924422.pdf
[firstpage_image] =>[orig_patent_app_number] => 12369947
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/369947 | Calibration method for optical metrology | Feb 11, 2009 | Issued |
Array
(
[id] => 4435246
[patent_doc_number] => 07969568
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-06-28
[patent_title] => 'Spectrographic metrology of patterned wafers'
[patent_app_type] => utility
[patent_app_number] => 12/369627
[patent_app_country] => US
[patent_app_date] => 2009-02-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 17
[patent_no_of_words] => 3123
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 127
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/969/07969568.pdf
[firstpage_image] =>[orig_patent_app_number] => 12369627
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/369627 | Spectrographic metrology of patterned wafers | Feb 10, 2009 | Issued |