
Kara E. Geisel
Supervisory Patent Examiner (ID: 16963, Phone: (571)272-2416 , Office: P/2877 )
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2877, RD00 |
| Total Applications | 972 |
| Issued Applications | 745 |
| Pending Applications | 81 |
| Abandoned Applications | 153 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 8180915
[patent_doc_number] => 08180138
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-05-15
[patent_title] => 'Method and system for inspection of containers'
[patent_app_type] => utility
[patent_app_number] => 12/408751
[patent_app_country] => US
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[pdf_file] => patents/08/180/08180138.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/408751 | Method and system for inspection of containers | Mar 22, 2009 | Issued |
Array
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[patent_doc_number] => 20110019192
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[patent_kind] => A1
[patent_issue_date] => 2011-01-27
[patent_title] => 'SPECTRAL CHARACTERISTIC MEASURING SYSTEM, SPECTRAL CHARACTERISTIC MEASURING INSTRUMENT, AND DATA PROCESSING DEVICE'
[patent_app_type] => utility
[patent_app_number] => 12/934247
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[firstpage_image] =>[orig_patent_app_number] => 12934247
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/934247 | Spectral characteristic measuring system, spectral characteristic measuring instrument, and data processing device | Mar 15, 2009 | Issued |
Array
(
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[patent_title] => 'Systems and methods for detecting chemical and biological substances'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/403522 | Systems and methods for detecting chemical and biological substances | Mar 12, 2009 | Issued |
Array
(
[id] => 125185
[patent_doc_number] => 07705974
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[patent_kind] => B2
[patent_issue_date] => 2010-04-27
[patent_title] => 'Metrology system with spectroscopic ellipsometer and photoacoustic measurements'
[patent_app_type] => utility
[patent_app_number] => 12/381477
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[patent_app_date] => 2009-03-11
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/381477 | Metrology system with spectroscopic ellipsometer and photoacoustic measurements | Mar 10, 2009 | Issued |
Array
(
[id] => 6308685
[patent_doc_number] => 20100110421
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[patent_kind] => A1
[patent_issue_date] => 2010-05-06
[patent_title] => 'DEGREE-OF-DISPERSION DETERMINATION METHOD FOR SINGLE-WALLED CARBON NANOTUBES AND DEGREE-OF-DISPERSION DETERMINATION APPARATUS FOR SINGLE-WALLED CARBON NANOTUBES'
[patent_app_type] => utility
[patent_app_number] => 12/398934
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/398934 | Degree-of-dispersion determination method for single-walled carbon nanotubes and degree-of-dispersion determination apparatus for single-walled carbon nanotubes | Mar 4, 2009 | Issued |
Array
(
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[patent_doc_number] => 07742156
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[patent_issue_date] => 2010-06-22
[patent_title] => 'Method of testing optical materials by irradiating with high energy density radiation, optical materials selected by said method and uses thereof'
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[patent_app_number] => 12/398402
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Array
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[id] => 9390578
[patent_doc_number] => 08687189
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[patent_issue_date] => 2014-04-01
[patent_title] => 'Analysis of arrays by laser induced breakdown spectroscopy'
[patent_app_type] => utility
[patent_app_number] => 12/393926
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/393926 | Analysis of arrays by laser induced breakdown spectroscopy | Feb 25, 2009 | Issued |
Array
(
[id] => 5402342
[patent_doc_number] => 20090237656
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[patent_issue_date] => 2009-09-24
[patent_title] => 'Tomographic Imaging Using Hyperspectral Absorption Spectroscopy'
[patent_app_type] => utility
[patent_app_number] => 12/393845
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Array
(
[id] => 7703866
[patent_doc_number] => 08089628
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[patent_title] => 'Pulsed-multiline excitation for color-blind fluorescence detection'
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[patent_app_number] => 12/388358
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/388358 | Pulsed-multiline excitation for color-blind fluorescence detection | Feb 17, 2009 | Issued |
Array
(
[id] => 8020677
[patent_doc_number] => 08139847
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[patent_issue_date] => 2012-03-20
[patent_title] => 'Defect inspection tool and method of parameter tuning for defect inspection tool'
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Array
(
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Array
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Array
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Array
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Array
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Array
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Array
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