
Kara E. Geisel
Supervisory Patent Examiner (ID: 16963, Phone: (571)272-2416 , Office: P/2877 )
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2877, RD00 |
| Total Applications | 972 |
| Issued Applications | 745 |
| Pending Applications | 81 |
| Abandoned Applications | 153 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 221833
[patent_doc_number] => 07609379
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[patent_issue_date] => 2009-10-27
[patent_title] => 'Detecting laser-induced fluorescence emissions'
[patent_app_type] => utility
[patent_app_number] => 11/664432
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/664432 | Detecting laser-induced fluorescence emissions | Sep 29, 2005 | Issued |
Array
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[patent_title] => 'Hyperspectral scene projection/generation systems and methods'
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[patent_title] => 'SPECTROMETER MOUNT AND MEASURING APPARATUS INCLUDING SAME'
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Array
(
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[patent_doc_number] => 07420678
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[patent_kind] => B2
[patent_issue_date] => 2008-09-02
[patent_title] => 'Multi-spectral imaging'
[patent_app_type] => utility
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Array
(
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[patent_title] => 'System and deconvolution process for an optical filtering device based on WGM resonance'
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Array
(
[id] => 6297427
[patent_doc_number] => 20100067000
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[patent_issue_date] => 2010-03-18
[patent_title] => 'Raman spectroscopy'
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Array
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[patent_title] => 'Method of and apparatus for measuring stress of semiconductor material'
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Array
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[id] => 377753
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[patent_issue_date] => 2007-12-25
[patent_title] => 'Method and system for monitoring plasma using optical emission spectrometry'
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Array
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[patent_title] => 'Miniaturized fluorescence analysis system'
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Array
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[patent_title] => 'Fast time-correlated multi-element photon detector and method'
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Array
(
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[patent_title] => 'Method and System for Optimizing Surface Enhanced Raman Scattering'
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Array
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Array
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[patent_title] => 'Littrow spectrometer and a spectral domain optical coherence tomography system with a Littrow spectrometer'
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Array
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