
Kara E. Geisel
Supervisory Patent Examiner (ID: 15814, Phone: (571)272-2416 , Office: P/2877 )
| Most Active Art Unit | 2877 |
| Art Unit(s) | RD00, 2877 |
| Total Applications | 982 |
| Issued Applications | 749 |
| Pending Applications | 86 |
| Abandoned Applications | 154 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6850106
[patent_doc_number] => 20030142308
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-07-31
[patent_title] => 'Multi-path monochromator'
[patent_app_type] => new
[patent_app_number] => 10/345672
[patent_app_country] => US
[patent_app_date] => 2003-01-16
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[pdf_file] => publications/A1/0142/20030142308.pdf
[firstpage_image] =>[orig_patent_app_number] => 10345672
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/345672 | Multi-path monochromator | Jan 15, 2003 | Issued |
Array
(
[id] => 7627491
[patent_doc_number] => 06806949
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-10-19
[patent_title] => 'Monitoring material buildup on system components by optical emission'
[patent_app_type] => B2
[patent_app_number] => 10/331349
[patent_app_country] => US
[patent_app_date] => 2002-12-31
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/331349 | Monitoring material buildup on system components by optical emission | Dec 30, 2002 | Issued |
Array
(
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[patent_doc_number] => 06894769
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[patent_issue_date] => 2005-05-17
[patent_title] => 'Monitoring erosion of system components by optical emission'
[patent_app_type] => utility
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[patent_app_country] => US
[patent_app_date] => 2002-12-31
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[pdf_file] => patents/06/894/06894769.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/331456 | Monitoring erosion of system components by optical emission | Dec 30, 2002 | Issued |
Array
(
[id] => 7609020
[patent_doc_number] => 06999169
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-02-14
[patent_title] => 'Spectrometer'
[patent_app_type] => utility
[patent_app_number] => 10/327872
[patent_app_country] => US
[patent_app_date] => 2002-12-26
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/327872 | Spectrometer | Dec 25, 2002 | Issued |
Array
(
[id] => 311923
[patent_doc_number] => 07528957
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-05-05
[patent_title] => 'Spectrometric process monitoring'
[patent_app_type] => utility
[patent_app_number] => 10/328713
[patent_app_country] => US
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[pdf_file] => patents/07/528/07528957.pdf
[firstpage_image] =>[orig_patent_app_number] => 10328713
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/328713 | Spectrometric process monitoring | Dec 22, 2002 | Issued |
Array
(
[id] => 7384174
[patent_doc_number] => 20040036856
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[patent_issue_date] => 2004-02-26
[patent_title] => 'Apparatus and method for in-situ measurement of polymer quantities output from an extractor'
[patent_app_type] => new
[patent_app_number] => 10/327031
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[pdf_file] => publications/A1/0036/20040036856.pdf
[firstpage_image] =>[orig_patent_app_number] => 10327031
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/327031 | Apparatus and method for in-situ measurement of polymer quantities output from an extractor | Dec 19, 2002 | Issued |
Array
(
[id] => 7462319
[patent_doc_number] => 20040119974
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[patent_issue_date] => 2004-06-24
[patent_title] => 'Instrument setup system for a fluorescence analyzer'
[patent_app_type] => new
[patent_app_number] => 10/326524
[patent_app_country] => US
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[pdf_file] => publications/A1/0119/20040119974.pdf
[firstpage_image] =>[orig_patent_app_number] => 10326524
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/326524 | Instrument setup system for a fluorescence analyzer | Dec 19, 2002 | Issued |
Array
(
[id] => 6738169
[patent_doc_number] => 20030155537
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[patent_kind] => A1
[patent_issue_date] => 2003-08-21
[patent_title] => 'Method and system for monitoring a process of material removal from the surface of a patterned structure'
[patent_app_type] => new
[patent_app_number] => 10/309348
[patent_app_country] => US
[patent_app_date] => 2002-12-04
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[pdf_file] => publications/A1/0155/20030155537.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/309348 | Method and system for monitoring a process of material removal from the surface of a patterned structure | Dec 3, 2002 | Issued |
Array
(
[id] => 7287527
[patent_doc_number] => 20040109159
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[patent_issue_date] => 2004-06-10
[patent_title] => 'Field multiplexed dispersive imaging spectrometer'
[patent_app_type] => new
[patent_app_number] => 10/313471
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/313471 | Field multiplexed dispersive imaging spectrometer | Dec 3, 2002 | Issued |
Array
(
[id] => 980091
[patent_doc_number] => 06930775
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[patent_issue_date] => 2005-08-16
[patent_title] => 'Diffraction-based optical correlator'
[patent_app_type] => utility
[patent_app_number] => 10/303172
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[firstpage_image] =>[orig_patent_app_number] => 10303172
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/303172 | Diffraction-based optical correlator | Nov 21, 2002 | Issued |
Array
(
[id] => 6859676
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[patent_title] => 'Micropattern shape measuring system and method'
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[firstpage_image] =>[orig_patent_app_number] => 10291675
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/291675 | Micropattern shape measuring system and method | Nov 11, 2002 | Issued |
Array
(
[id] => 6868517
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[patent_title] => 'Multipass sampling system for Raman spectroscopy'
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Array
(
[id] => 7009254
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[patent_issue_date] => 2005-03-24
[patent_title] => 'Dental colorimetry measuring apparatus'
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[firstpage_image] =>[orig_patent_app_number] => 10493448
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/493448 | Dental colorimetry measuring apparatus | Oct 23, 2002 | Abandoned |
Array
(
[id] => 6800092
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[patent_title] => 'Method and apparatus for quantifying an \"integrated index\" of a material medium'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/274330 | Method and apparatus for quantifying an “integrated index†of a material medium | Oct 17, 2002 | Issued |
Array
(
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Array
(
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[patent_title] => 'Method for fluorescence microscopy, and fluorescence microscope'
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Array
(
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| 10/130484 | Compact optical probe and related measuring method | Sep 29, 2002 | Abandoned |
Array
(
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Array
(
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