
Kara E. Geisel
Supervisory Patent Examiner (ID: 1769, Phone: (571)272-2416 , Office: P/2877 )
| Most Active Art Unit | 2877 |
| Art Unit(s) | RD00, 2877 |
| Total Applications | 981 |
| Issued Applications | 748 |
| Pending Applications | 86 |
| Abandoned Applications | 154 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 1394403
[patent_doc_number] => 06556297
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-04-29
[patent_title] => 'Athermalization and pressure desensitization of diffraction grating based spectrometer devices'
[patent_app_type] => B1
[patent_app_number] => 09/724638
[patent_app_country] => US
[patent_app_date] => 2000-11-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 10
[patent_no_of_words] => 5830
[patent_no_of_claims] => 66
[patent_no_of_ind_claims] => 8
[patent_words_short_claim] => 131
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/556/06556297.pdf
[firstpage_image] =>[orig_patent_app_number] => 09724638
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/724638 | Athermalization and pressure desensitization of diffraction grating based spectrometer devices | Nov 27, 2000 | Issued |
Array
(
[id] => 1407479
[patent_doc_number] => 06545755
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-04-08
[patent_title] => 'Micro-Raman spectroscopy system for identifying foreign material on a semiconductor wafer'
[patent_app_type] => B1
[patent_app_number] => 09/723318
[patent_app_country] => US
[patent_app_date] => 2000-11-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 4850
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 302
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/545/06545755.pdf
[firstpage_image] =>[orig_patent_app_number] => 09723318
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/723318 | Micro-Raman spectroscopy system for identifying foreign material on a semiconductor wafer | Nov 26, 2000 | Issued |
Array
(
[id] => 1330948
[patent_doc_number] => 06603538
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-08-05
[patent_title] => 'Method and apparatus employing optical emission spectroscopy to detect a fault in process conditions of a semiconductor processing system'
[patent_app_type] => B1
[patent_app_number] => 09/721403
[patent_app_country] => US
[patent_app_date] => 2000-11-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 13
[patent_no_of_words] => 8724
[patent_no_of_claims] => 21
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/603/06603538.pdf
[firstpage_image] =>[orig_patent_app_number] => 09721403
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/721403 | Method and apparatus employing optical emission spectroscopy to detect a fault in process conditions of a semiconductor processing system | Nov 20, 2000 | Issued |
Array
(
[id] => 1317838
[patent_doc_number] => 06614525
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-09-02
[patent_title] => 'Laser scanning microscope with single wavelength excitation'
[patent_app_type] => B1
[patent_app_number] => 09/718948
[patent_app_country] => US
[patent_app_date] => 2000-11-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 3969
[patent_no_of_claims] => 34
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 157
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/614/06614525.pdf
[firstpage_image] =>[orig_patent_app_number] => 09718948
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/718948 | Laser scanning microscope with single wavelength excitation | Nov 19, 2000 | Issued |
Array
(
[id] => 1290965
[patent_doc_number] => 06639668
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-10-28
[patent_title] => 'Asynchronous fluorescence scan'
[patent_app_type] => B1
[patent_app_number] => 09/704829
[patent_app_country] => US
[patent_app_date] => 2000-11-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 2332
[patent_no_of_claims] => 31
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 91
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/639/06639668.pdf
[firstpage_image] =>[orig_patent_app_number] => 09704829
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/704829 | Asynchronous fluorescence scan | Nov 2, 2000 | Issued |
Array
(
[id] => 1321867
[patent_doc_number] => 06608678
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-08-19
[patent_title] => 'Situ determination of DPC and BPA in polycarbonate by Raman spectroscopy'
[patent_app_type] => B1
[patent_app_number] => 09/692549
[patent_app_country] => US
[patent_app_date] => 2000-10-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 8028
[patent_no_of_claims] => 70
[patent_no_of_ind_claims] => 6
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/608/06608678.pdf
[firstpage_image] =>[orig_patent_app_number] => 09692549
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/692549 | Situ determination of DPC and BPA in polycarbonate by Raman spectroscopy | Oct 18, 2000 | Issued |
Array
(
[id] => 1107678
[patent_doc_number] => 06813017
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-11-02
[patent_title] => 'Apparatus and method employing incoherent light emitting semiconductor devices as particle detection light sources in a flow cytometer'
[patent_app_type] => B1
[patent_app_number] => 09/691155
[patent_app_country] => US
[patent_app_date] => 2000-10-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 22
[patent_figures_cnt] => 44
[patent_no_of_words] => 8880
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 132
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/813/06813017.pdf
[firstpage_image] =>[orig_patent_app_number] => 09691155
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/691155 | Apparatus and method employing incoherent light emitting semiconductor devices as particle detection light sources in a flow cytometer | Oct 18, 2000 | Issued |
Array
(
[id] => 1302698
[patent_doc_number] => 06628383
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-09-30
[patent_title] => 'Imaging spectrograph for multiorder spectroscopy'
[patent_app_type] => B1
[patent_app_number] => 09/691725
[patent_app_country] => US
[patent_app_date] => 2000-10-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2945
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 136
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/628/06628383.pdf
[firstpage_image] =>[orig_patent_app_number] => 09691725
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/691725 | Imaging spectrograph for multiorder spectroscopy | Oct 17, 2000 | Issued |
Array
(
[id] => 7632267
[patent_doc_number] => 06665068
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-12-16
[patent_title] => 'Arrangement for wavelength-dependent adjustment of light beam'
[patent_app_type] => B1
[patent_app_number] => 09/687124
[patent_app_country] => US
[patent_app_date] => 2000-10-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 936
[patent_no_of_claims] => 8
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/665/06665068.pdf
[firstpage_image] =>[orig_patent_app_number] => 09687124
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/687124 | Arrangement for wavelength-dependent adjustment of light beam | Oct 12, 2000 | Issued |
Array
(
[id] => 1340544
[patent_doc_number] => 06597451
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-07-22
[patent_title] => 'Spectrometry measuring apparatus'
[patent_app_type] => B1
[patent_app_number] => 09/686934
[patent_app_country] => US
[patent_app_date] => 2000-10-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 11
[patent_no_of_words] => 3768
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 7
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/597/06597451.pdf
[firstpage_image] =>[orig_patent_app_number] => 09686934
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/686934 | Spectrometry measuring apparatus | Oct 11, 2000 | Issued |
Array
(
[id] => 1357272
[patent_doc_number] => 06583874
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-06-24
[patent_title] => 'Spectrometer with holographic and echelle gratings'
[patent_app_type] => B1
[patent_app_number] => 09/680932
[patent_app_country] => US
[patent_app_date] => 2000-10-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
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[patent_no_of_words] => 12431
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/583/06583874.pdf
[firstpage_image] =>[orig_patent_app_number] => 09680932
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/680932 | Spectrometer with holographic and echelle gratings | Oct 9, 2000 | Issued |
Array
(
[id] => 1130117
[patent_doc_number] => 06791676
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-09-14
[patent_title] => 'Spectrophotometric and nephelometric detection unit'
[patent_app_type] => B1
[patent_app_number] => 09/680436
[patent_app_country] => US
[patent_app_date] => 2000-10-06
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[pdf_file] => patents/06/791/06791676.pdf
[firstpage_image] =>[orig_patent_app_number] => 09680436
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/680436 | Spectrophotometric and nephelometric detection unit | Oct 5, 2000 | Issued |
Array
(
[id] => 1041846
[patent_doc_number] => 06870619
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2005-03-22
[patent_title] => 'Spectrometer and method for measuring optical spectrum'
[patent_app_type] => utility
[patent_app_number] => 10/089161
[patent_app_country] => US
[patent_app_date] => 2000-09-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/870/06870619.pdf
[firstpage_image] =>[orig_patent_app_number] => 10089161
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/089161 | Spectrometer and method for measuring optical spectrum | Sep 26, 2000 | Issued |