
Karen Hantis
Examiner (ID: 14375)
| Most Active Art Unit | 2505 |
| Art Unit(s) | 2877, 2899, 2505, 2876 |
| Total Applications | 725 |
| Issued Applications | 559 |
| Pending Applications | 42 |
| Abandoned Applications | 124 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4003102
[patent_doc_number] => 05892585
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-04-06
[patent_title] => 'Colorimeter for measurement of temporally variant light sources'
[patent_app_type] => 1
[patent_app_number] => 8/835084
[patent_app_country] => US
[patent_app_date] => 1997-04-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 19
[patent_no_of_words] => 5917
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 178
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/892/05892585.pdf
[firstpage_image] =>[orig_patent_app_number] => 835084
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/835084 | Colorimeter for measurement of temporally variant light sources | Apr 3, 1997 | Issued |
Array
(
[id] => 3886336
[patent_doc_number] => 05825486
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-10-20
[patent_title] => 'Electro-optic module especially suitable for use in a spectrophotometer'
[patent_app_type] => 1
[patent_app_number] => 8/831826
[patent_app_country] => US
[patent_app_date] => 1997-04-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 26
[patent_no_of_words] => 5939
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 94
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/825/05825486.pdf
[firstpage_image] =>[orig_patent_app_number] => 831826
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/831826 | Electro-optic module especially suitable for use in a spectrophotometer | Apr 1, 1997 | Issued |
Array
(
[id] => 3937775
[patent_doc_number] => 05877853
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-03-02
[patent_title] => 'Method of evaluating an optical transmission path'
[patent_app_type] => 1
[patent_app_number] => 8/831406
[patent_app_country] => US
[patent_app_date] => 1997-04-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 2200
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 92
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/877/05877853.pdf
[firstpage_image] =>[orig_patent_app_number] => 831406
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/831406 | Method of evaluating an optical transmission path | Mar 31, 1997 | Issued |
Array
(
[id] => 3870671
[patent_doc_number] => 05796479
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-08-18
[patent_title] => 'Signal monitoring apparatus for wavelength division multiplexed optical telecommunication networks'
[patent_app_type] => 1
[patent_app_number] => 8/824978
[patent_app_country] => US
[patent_app_date] => 1997-03-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 1958
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 169
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/796/05796479.pdf
[firstpage_image] =>[orig_patent_app_number] => 824978
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/824978 | Signal monitoring apparatus for wavelength division multiplexed optical telecommunication networks | Mar 26, 1997 | Issued |
Array
(
[id] => 3795383
[patent_doc_number] => 05822071
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-10-13
[patent_title] => 'Spectrometer normalization system'
[patent_app_type] => 1
[patent_app_number] => 8/826297
[patent_app_country] => US
[patent_app_date] => 1997-03-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 3878
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 246
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/822/05822071.pdf
[firstpage_image] =>[orig_patent_app_number] => 826297
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/826297 | Spectrometer normalization system | Mar 26, 1997 | Issued |
Array
(
[id] => 4062492
[patent_doc_number] => 05969824
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-10-19
[patent_title] => 'Illumination for scanners'
[patent_app_type] => 1
[patent_app_number] => 8/826059
[patent_app_country] => US
[patent_app_date] => 1997-03-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3693
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/969/05969824.pdf
[firstpage_image] =>[orig_patent_app_number] => 826059
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/826059 | Illumination for scanners | Mar 25, 1997 | Issued |
Array
(
[id] => 3984792
[patent_doc_number] => 05905569
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-05-18
[patent_title] => 'Illuminance measuring method, an exposure apparatus using the method, and a device manufacturing method'
[patent_app_type] => 1
[patent_app_number] => 8/824797
[patent_app_country] => US
[patent_app_date] => 1997-03-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 11
[patent_no_of_words] => 4707
[patent_no_of_claims] => 39
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 134
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/905/05905569.pdf
[firstpage_image] =>[orig_patent_app_number] => 824797
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/824797 | Illuminance measuring method, an exposure apparatus using the method, and a device manufacturing method | Mar 25, 1997 | Issued |
Array
(
[id] => 3937933
[patent_doc_number] => 05877863
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-03-02
[patent_title] => 'Readhead for a photometric diagnostic instrument'
[patent_app_type] => 1
[patent_app_number] => 8/822189
[patent_app_country] => US
[patent_app_date] => 1997-03-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 7
[patent_no_of_words] => 3305
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 105
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/877/05877863.pdf
[firstpage_image] =>[orig_patent_app_number] => 822189
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/822189 | Readhead for a photometric diagnostic instrument | Mar 19, 1997 | Issued |
Array
(
[id] => 3780984
[patent_doc_number] => 05774212
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-06-30
[patent_title] => 'Method and apparatus for detecting and analyzing directionally reflective surface flaws'
[patent_app_type] => 1
[patent_app_number] => 8/821676
[patent_app_country] => US
[patent_app_date] => 1997-03-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 8
[patent_no_of_words] => 3862
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 163
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/774/05774212.pdf
[firstpage_image] =>[orig_patent_app_number] => 821676
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/821676 | Method and apparatus for detecting and analyzing directionally reflective surface flaws | Mar 18, 1997 | Issued |
Array
(
[id] => 3789284
[patent_doc_number] => 05818582
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-10-06
[patent_title] => 'Apparatus and method for phase fluorometry'
[patent_app_type] => 1
[patent_app_number] => 8/818881
[patent_app_country] => US
[patent_app_date] => 1997-03-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 10191
[patent_no_of_claims] => 36
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 177
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/818/05818582.pdf
[firstpage_image] =>[orig_patent_app_number] => 818881
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/818881 | Apparatus and method for phase fluorometry | Mar 16, 1997 | Issued |
Array
(
[id] => 3986309
[patent_doc_number] => 05917604
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-06-29
[patent_title] => 'Alignment device and lithographic apparatus provided with such a device'
[patent_app_type] => 1
[patent_app_number] => 8/818143
[patent_app_country] => US
[patent_app_date] => 1997-03-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 20
[patent_no_of_words] => 13997
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 264
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/917/05917604.pdf
[firstpage_image] =>[orig_patent_app_number] => 818143
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/818143 | Alignment device and lithographic apparatus provided with such a device | Mar 12, 1997 | Issued |
Array
(
[id] => 4024706
[patent_doc_number] => 05880832
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-03-09
[patent_title] => 'Spectrophotometry'
[patent_app_type] => 1
[patent_app_number] => 8/808223
[patent_app_country] => US
[patent_app_date] => 1997-02-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 10
[patent_no_of_words] => 5691
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 77
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/880/05880832.pdf
[firstpage_image] =>[orig_patent_app_number] => 808223
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/808223 | Spectrophotometry | Feb 27, 1997 | Issued |
| 08/807647 | PLANE POSITIONING APPARATUS | Feb 26, 1997 | Abandoned |
Array
(
[id] => 3909588
[patent_doc_number] => 05751421
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-05-12
[patent_title] => 'Near infrared spectrometer used in combination with a combine for real time grain analysis'
[patent_app_type] => 1
[patent_app_number] => 8/807661
[patent_app_country] => US
[patent_app_date] => 1997-02-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3844
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 107
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/751/05751421.pdf
[firstpage_image] =>[orig_patent_app_number] => 807661
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/807661 | Near infrared spectrometer used in combination with a combine for real time grain analysis | Feb 26, 1997 | Issued |
Array
(
[id] => 4003542
[patent_doc_number] => 05920398
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-07-06
[patent_title] => 'Surface position detecting method and scanning exposure method using the same'
[patent_app_type] => 1
[patent_app_number] => 8/805749
[patent_app_country] => US
[patent_app_date] => 1997-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 20
[patent_no_of_words] => 11066
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 117
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/920/05920398.pdf
[firstpage_image] =>[orig_patent_app_number] => 805749
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/805749 | Surface position detecting method and scanning exposure method using the same | Feb 24, 1997 | Issued |
Array
(
[id] => 3842693
[patent_doc_number] => 05815255
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-09-29
[patent_title] => 'Method and system for measuring deflection angle of a beam of light reflected from a disk to determine tilt of the disk'
[patent_app_type] => 1
[patent_app_number] => 8/801903
[patent_app_country] => US
[patent_app_date] => 1997-02-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 7
[patent_no_of_words] => 3630
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 204
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/815/05815255.pdf
[firstpage_image] =>[orig_patent_app_number] => 801903
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/801903 | Method and system for measuring deflection angle of a beam of light reflected from a disk to determine tilt of the disk | Feb 13, 1997 | Issued |
Array
(
[id] => 4084647
[patent_doc_number] => 05966216
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-10-12
[patent_title] => 'On-axix mask and wafer alignment system'
[patent_app_type] => 1
[patent_app_number] => 8/793069
[patent_app_country] => US
[patent_app_date] => 1997-02-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5285
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 182
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/966/05966216.pdf
[firstpage_image] =>[orig_patent_app_number] => 793069
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/793069 | On-axix mask and wafer alignment system | Feb 13, 1997 | Issued |
Array
(
[id] => 4128856
[patent_doc_number] => 06072567
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-06-06
[patent_title] => 'Vertical seismic profiling system having vertical seismic profiling optical signal processing equipment and fiber Bragg grafting optical sensors'
[patent_app_type] => 1
[patent_app_number] => 8/800208
[patent_app_country] => US
[patent_app_date] => 1997-02-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4360
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 260
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/072/06072567.pdf
[firstpage_image] =>[orig_patent_app_number] => 800208
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/800208 | Vertical seismic profiling system having vertical seismic profiling optical signal processing equipment and fiber Bragg grafting optical sensors | Feb 11, 1997 | Issued |
Array
(
[id] => 3842707
[patent_doc_number] => 05815256
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-09-29
[patent_title] => 'Apparatus and method for measuring in-plane distribution of surface free energy'
[patent_app_type] => 1
[patent_app_number] => 8/797607
[patent_app_country] => US
[patent_app_date] => 1997-02-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 33
[patent_no_of_words] => 9020
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 197
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/815/05815256.pdf
[firstpage_image] =>[orig_patent_app_number] => 797607
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/797607 | Apparatus and method for measuring in-plane distribution of surface free energy | Feb 6, 1997 | Issued |
Array
(
[id] => 3795396
[patent_doc_number] => 05822072
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-10-13
[patent_title] => 'Fiberoptic probe and system for spectral measurements'
[patent_app_type] => 1
[patent_app_number] => 8/792510
[patent_app_country] => US
[patent_app_date] => 1997-01-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 12
[patent_no_of_words] => 8013
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 246
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/822/05822072.pdf
[firstpage_image] =>[orig_patent_app_number] => 792510
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/792510 | Fiberoptic probe and system for spectral measurements | Jan 30, 1997 | Issued |