![](/images/general/no_picture/200_user.png)
Kawing Chan
Examiner (ID: 286, Phone: (571)270-3909 , Office: P/2837 )
Most Active Art Unit | 2837 |
Art Unit(s) | 2846, 4147, 2837 |
Total Applications | 892 |
Issued Applications | 614 |
Pending Applications | 66 |
Abandoned Applications | 212 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
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[id] => 4751547
[patent_doc_number] => 20080159618
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[patent_issue_date] => 2008-07-03
[patent_title] => 'Apparatus for Measuring Doctor Blade Geometric Deviations'
[patent_app_type] => utility
[patent_app_number] => 11/616956
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/616956 | Apparatus for measuring doctor blade geometric deviations | Dec 27, 2006 | Issued |
Array
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[patent_issue_date] => 2007-07-19
[patent_title] => ' Optical authentication'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/615581 | Optical authentication | Dec 21, 2006 | Issued |
Array
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[patent_title] => 'Measuring apparatus'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/643616 | Measuring apparatus | Dec 20, 2006 | Issued |
Array
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[patent_title] => 'PULSED ELLIPSOMETER DEVICE'
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[patent_app_number] => 11/614673
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/614673 | PULSED ELLIPSOMETER DEVICE | Dec 20, 2006 | Abandoned |
Array
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[patent_title] => 'Devices and methods for inspecting optical elements with a view to contamination'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/635293 | Devices and methods for inspecting optical elements with a view to contamination | Dec 6, 2006 | Issued |
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[patent_title] => 'Optical inspection of a specimen using multi-channel responses from the specimen'
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/814472 | Method and apparatus for determining intensities and peak wavelengths of light | Nov 16, 2006 | Issued |
Array
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[patent_issue_date] => 2010-02-16
[patent_title] => 'Contamination monitoring and control techniques for use with an optical metrology instrument'
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[patent_app_number] => 11/600477
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Array
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[id] => 4953490
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[patent_title] => 'Method For Optical Chassis Measurement'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/909266 | Method For Optical Chassis Measurement | Nov 15, 2006 | Abandoned |
Array
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[id] => 5169889
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[patent_kind] => A1
[patent_issue_date] => 2007-03-29
[patent_title] => 'METHOD FOR ABERRATION EVALUATION IN A PROJECTION SYSTEM'
[patent_app_type] => utility
[patent_app_number] => 11/559454
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/559454 | Method for aberration evaluation in a projection system | Nov 13, 2006 | Issued |
Array
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[id] => 5181612
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[patent_title] => 'Method and equipment for detecting pattern defect'
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Array
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Array
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Array
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