Kawing Chan
Examiner (ID: 286, Phone: (571)270-3909 , Office: P/2837 )
Most Active Art Unit | 2837 |
Art Unit(s) | 2846, 4147, 2837 |
Total Applications | 892 |
Issued Applications | 614 |
Pending Applications | 66 |
Abandoned Applications | 212 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 6657034
[patent_doc_number] => 20030133133
[patent_country] => US
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[patent_issue_date] => 2003-07-17
[patent_title] => 'Measuring apparatus'
[patent_app_type] => new
[patent_app_number] => 10/337168
[patent_app_country] => US
[patent_app_date] => 2003-01-06
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/337168 | Measuring apparatus | Jan 5, 2003 | Issued |
Array
(
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[patent_kind] => B2
[patent_issue_date] => 2004-06-15
[patent_title] => 'Integrated optical devices and method of fabrication therefor'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/326346 | Integrated optical devices and method of fabrication therefor | Dec 19, 2002 | Issued |
Array
(
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[patent_issue_date] => 2004-04-15
[patent_title] => 'Parametric profiling using optical spectroscopic systems'
[patent_app_type] => new
[patent_app_number] => 10/327466
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/327466 | Parametric profiling using optical spectroscopic systems | Dec 18, 2002 | Issued |
Array
(
[id] => 6681752
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[patent_issue_date] => 2003-06-26
[patent_title] => 'Wafer external inspection apparatus'
[patent_app_type] => new
[patent_app_number] => 10/321663
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/321663 | Wafer external inspection apparatus | Dec 17, 2002 | Abandoned |
Array
(
[id] => 732042
[patent_doc_number] => 07042557
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[patent_issue_date] => 2006-05-09
[patent_title] => 'Sample supplying device for a dry particle-size distribution measuring apparatus and method'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/322819 | Sample supplying device for a dry particle-size distribution measuring apparatus and method | Dec 17, 2002 | Issued |
Array
(
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[patent_doc_number] => 20040251405
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[patent_issue_date] => 2004-12-16
[patent_title] => 'Methods and devices for optically recording and imaging representations of interactions of an object with its environment'
[patent_app_type] => new
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Array
(
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[patent_title] => 'Surface reflectivity discriminating device'
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[firstpage_image] =>[orig_patent_app_number] => 10315005
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/315005 | Surface reflectivity discriminating device | Dec 9, 2002 | Issued |
Array
(
[id] => 7287560
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[patent_title] => 'Method and apparatus for optical film measurements in a controlled environment'
[patent_app_type] => new
[patent_app_number] => 10/310759
[patent_app_country] => US
[patent_app_date] => 2002-12-06
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[pdf_file] => publications/A1/0109/20040109174.pdf
[firstpage_image] =>[orig_patent_app_number] => 10310759
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/310759 | Method and apparatus for optical film measurements in a controlled environment | Dec 5, 2002 | Issued |
Array
(
[id] => 865632
[patent_doc_number] => 07363817
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-04-29
[patent_title] => 'System and technique for detecting the presence of foreign material'
[patent_app_type] => utility
[patent_app_number] => 10/496744
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/496744 | System and technique for detecting the presence of foreign material | Nov 26, 2002 | Issued |
Array
(
[id] => 6850089
[patent_doc_number] => 20030142291
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[patent_issue_date] => 2003-07-31
[patent_title] => 'Portable scattering and fluorescence cytometer'
[patent_app_type] => new
[patent_app_number] => 10/304773
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[pdf_file] => publications/A1/0142/20030142291.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/304773 | Portable scattering and fluorescence cytometer | Nov 25, 2002 | Issued |
Array
(
[id] => 1026287
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[patent_title] => 'Self-calibration of an optical-based sensor using a total internal reflection (TIR) signature'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/301979 | Self-calibration of an optical-based sensor using a total internal reflection (TIR) signature | Nov 21, 2002 | Issued |
Array
(
[id] => 7619302
[patent_doc_number] => 06943887
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[patent_title] => 'Surface plasmon resonance sensor having real-time referencing'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/300978 | Surface plasmon resonance sensor having real-time referencing | Nov 20, 2002 | Issued |
Array
(
[id] => 936052
[patent_doc_number] => 06975402
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[patent_kind] => B2
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[patent_title] => 'Tunable light source for use in photoacoustic spectrometers'
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Array
(
[id] => 7384270
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/276562 | One-dimensional calibration standard | Nov 13, 2002 | Abandoned |
Array
(
[id] => 736069
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[patent_title] => 'Three-dimensional micropattern profile measuring system and method'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/289401 | Three-dimensional micropattern profile measuring system and method | Nov 6, 2002 | Issued |
Array
(
[id] => 1026249
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[patent_title] => 'Fingerprint input devices and electronic devices provided with the same'
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Array
(
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Array
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Array
(
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/273157 | Sensor arrangement to determine vehicle height | Oct 17, 2002 | Abandoned |