Kawing Chan
Examiner (ID: 286, Phone: (571)270-3909 , Office: P/2837 )
Most Active Art Unit | 2837 |
Art Unit(s) | 2846, 4147, 2837 |
Total Applications | 892 |
Issued Applications | 614 |
Pending Applications | 66 |
Abandoned Applications | 212 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 5439942
[patent_doc_number] => 20090091581
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-04-09
[patent_title] => 'Combined Object Capturing System and Display Device and Associated Method'
[patent_app_type] => utility
[patent_app_number] => 11/868352
[patent_app_country] => US
[patent_app_date] => 2007-10-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0091/20090091581.pdf
[firstpage_image] =>[orig_patent_app_number] => 11868352
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/868352 | Combined object capturing system and display device and associated method | Oct 4, 2007 | Issued |
Array
(
[id] => 8364871
[patent_doc_number] => 08253942
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-08-28
[patent_title] => 'Optical gas detector'
[patent_app_type] => utility
[patent_app_number] => 11/862959
[patent_app_country] => US
[patent_app_date] => 2007-09-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
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[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 11862959
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/862959 | Optical gas detector | Sep 26, 2007 | Issued |
Array
(
[id] => 35720
[patent_doc_number] => 07787108
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-08-31
[patent_title] => 'Inline stress evaluation in microstructure devices'
[patent_app_type] => utility
[patent_app_number] => 11/856799
[patent_app_country] => US
[patent_app_date] => 2007-09-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/787/07787108.pdf
[firstpage_image] =>[orig_patent_app_number] => 11856799
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/856799 | Inline stress evaluation in microstructure devices | Sep 17, 2007 | Issued |
Array
(
[id] => 25863
[patent_doc_number] => 07796263
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-09-14
[patent_title] => 'Method and apparatus for determining fluid content downhole'
[patent_app_type] => utility
[patent_app_number] => 11/850455
[patent_app_country] => US
[patent_app_date] => 2007-09-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 3591
[patent_no_of_claims] => 22
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/796/07796263.pdf
[firstpage_image] =>[orig_patent_app_number] => 11850455
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/850455 | Method and apparatus for determining fluid content downhole | Sep 4, 2007 | Issued |
Array
(
[id] => 4579821
[patent_doc_number] => 07859653
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-12-28
[patent_title] => 'Detecting strain in birefringent materials using spectral polarimetry'
[patent_app_type] => utility
[patent_app_number] => 11/848284
[patent_app_country] => US
[patent_app_date] => 2007-08-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 25
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[patent_no_of_words] => 7796
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/859/07859653.pdf
[firstpage_image] =>[orig_patent_app_number] => 11848284
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/848284 | Detecting strain in birefringent materials using spectral polarimetry | Aug 30, 2007 | Issued |
Array
(
[id] => 7969623
[patent_doc_number] => 07940386
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2011-05-10
[patent_title] => 'Scatterometry target employing non-periodic defect features to enhance or optimize target sensitivity to a parameter of interest'
[patent_app_type] => utility
[patent_app_number] => 11/848158
[patent_app_country] => US
[patent_app_date] => 2007-08-30
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 8045
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[pdf_file] => patents/07/940/07940386.pdf
[firstpage_image] =>[orig_patent_app_number] => 11848158
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/848158 | Scatterometry target employing non-periodic defect features to enhance or optimize target sensitivity to a parameter of interest | Aug 29, 2007 | Issued |
Array
(
[id] => 4769942
[patent_doc_number] => 20080055600
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-03-06
[patent_title] => 'DEFECT INSPECTION APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 11/844452
[patent_app_country] => US
[patent_app_date] => 2007-08-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[patent_no_of_words] => 3758
[patent_no_of_claims] => 22
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0055/20080055600.pdf
[firstpage_image] =>[orig_patent_app_number] => 11844452
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/844452 | Defect inspection apparatus | Aug 23, 2007 | Issued |
Array
(
[id] => 5445115
[patent_doc_number] => 20090046341
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-02-19
[patent_title] => 'SCANNING OPTICAL SYSTEM ADJUSTING DEVICE AND SCANNING OPTICAL SYSTEM ADJUSTING METHOD'
[patent_app_type] => utility
[patent_app_number] => 11/840374
[patent_app_country] => US
[patent_app_date] => 2007-08-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 2550
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0046/20090046341.pdf
[firstpage_image] =>[orig_patent_app_number] => 11840374
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/840374 | Scanning optical system adjusting device and scanning optical system adjusting method | Aug 16, 2007 | Issued |
Array
(
[id] => 4777034
[patent_doc_number] => 20080285032
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-11-20
[patent_title] => 'LIGHT SCATTERING DETECTOR'
[patent_app_type] => utility
[patent_app_number] => 11/833659
[patent_app_country] => US
[patent_app_date] => 2007-08-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[pdf_file] => publications/A1/0285/20080285032.pdf
[firstpage_image] =>[orig_patent_app_number] => 11833659
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/833659 | LIGHT SCATTERING DETECTOR | Aug 2, 2007 | Abandoned |
Array
(
[id] => 4686556
[patent_doc_number] => 20080030737
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-07
[patent_title] => 'MULTIPLE PASS SURFACE PLASMON RESONANCE DETECTOR'
[patent_app_type] => utility
[patent_app_number] => 11/832554
[patent_app_country] => US
[patent_app_date] => 2007-08-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 7144
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 4
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0030/20080030737.pdf
[firstpage_image] =>[orig_patent_app_number] => 11832554
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/832554 | MULTIPLE PASS SURFACE PLASMON RESONANCE DETECTOR | Jul 31, 2007 | Abandoned |
Array
(
[id] => 7725098
[patent_doc_number] => 08098372
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-01-17
[patent_title] => 'Optical inspection tool featuring multiple speed modes'
[patent_app_type] => utility
[patent_app_number] => 11/781454
[patent_app_country] => US
[patent_app_date] => 2007-07-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_no_of_words] => 8399
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[pdf_file] => patents/08/098/08098372.pdf
[firstpage_image] =>[orig_patent_app_number] => 11781454
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/781454 | Optical inspection tool featuring multiple speed modes | Jul 22, 2007 | Issued |
Array
(
[id] => 7551726
[patent_doc_number] => 08064063
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-11-22
[patent_title] => 'Optical characterisation methods and systems'
[patent_app_type] => utility
[patent_app_number] => 12/374255
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[pdf_file] => patents/08/064/08064063.pdf
[firstpage_image] =>[orig_patent_app_number] => 12374255
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/374255 | Optical characterisation methods and systems | Jul 19, 2007 | Issued |
Array
(
[id] => 4801516
[patent_doc_number] => 20080013103
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-17
[patent_title] => 'DISPLACEMENT SENSOR'
[patent_app_type] => utility
[patent_app_number] => 11/776255
[patent_app_country] => US
[patent_app_date] => 2007-07-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 23
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[pdf_file] => publications/A1/0013/20080013103.pdf
[firstpage_image] =>[orig_patent_app_number] => 11776255
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/776255 | Displacement sensor | Jul 10, 2007 | Issued |
Array
(
[id] => 4839897
[patent_doc_number] => 20080280383
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[patent_title] => 'Method of real-time monitoring implantation'
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0280/20080280383.pdf
[firstpage_image] =>[orig_patent_app_number] => 11822755
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/822755 | Method of real-time monitoring implantation | Jul 9, 2007 | Abandoned |
Array
(
[id] => 4796893
[patent_doc_number] => 20080008479
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-10
[patent_title] => 'Method and arrangement for detecting light signals'
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[firstpage_image] =>[orig_patent_app_number] => 11822152
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/822152 | Method and arrangement for detecting light signals | Jul 1, 2007 | Issued |
Array
(
[id] => 6561070
[patent_doc_number] => 20100045985
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-02-25
[patent_title] => 'Focused-beam ellipsometer'
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[patent_app_number] => 12/308662
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[pdf_file] => publications/A1/0045/20100045985.pdf
[firstpage_image] =>[orig_patent_app_number] => 12308662
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/308662 | Focused-beam ellipsometer | Jun 19, 2007 | Issued |
Array
(
[id] => 5494321
[patent_doc_number] => 20090262349
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-10-22
[patent_title] => 'ELECTROOPTIC PROBE FOR VECTOR MEASUREMENT OF AN ELECTROMAGNETIC FIELD'
[patent_app_type] => utility
[patent_app_number] => 12/305066
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[patent_app_date] => 2007-06-15
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[pdf_file] => publications/A1/0262/20090262349.pdf
[firstpage_image] =>[orig_patent_app_number] => 12305066
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/305066 | Electrooptic probe for vector measurement of an electromagnetic field | Jun 14, 2007 | Issued |
Array
(
[id] => 7590546
[patent_doc_number] => 07663758
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[patent_issue_date] => 2010-02-16
[patent_title] => 'Apparatus and method for detecting surface plasmon resonance'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/760356 | Apparatus and method for detecting surface plasmon resonance | Jun 7, 2007 | Issued |
Array
(
[id] => 4714058
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[patent_issue_date] => 2008-10-02
[patent_title] => 'Method and system for detecting the level of anesthesia agent in an anesthesia vaporizer'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/809453 | Method and system for detecting the level of anesthesia agent in an anesthesia vaporizer | Jun 1, 2007 | Issued |
Array
(
[id] => 247843
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[patent_title] => 'Metrology tool, system comprising a lithographic apparatus and a metrology tool, and a method for determining a parameter of a substrate'
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[pdf_file] => patents/07/586/07586598.pdf
[firstpage_image] =>[orig_patent_app_number] => 11802257
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/802257 | Metrology tool, system comprising a lithographic apparatus and a metrology tool, and a method for determining a parameter of a substrate | May 20, 2007 | Issued |