Array
(
[id] => 939701
[patent_doc_number] => RE038894
[patent_country] => US
[patent_kind] => E1
[patent_issue_date] => 2005-11-29
[patent_title] => 'Method and apparatus for testing integrated circuits'
[patent_app_type] => reissue
[patent_app_number] => 08/715869
[patent_app_country] => US
[patent_app_date] => 1996-09-19
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 1634
[patent_no_of_claims] => 22
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/RE/038/RE038894.pdf
[firstpage_image] =>[orig_patent_app_number] => 08715869
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/715869 | Method and apparatus for testing integrated circuits | Sep 18, 1996 | Issued |