| Application number | Title of the application | Filing Date | Status |
|---|
Array
(
[id] => 7309211
[patent_doc_number] => 20040142517
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-07-22
[patent_title] => 'Hatted polysilicon gate structure for improving salicide performance and method of forming the same'
[patent_app_type] => new
[patent_app_number] => 10/347007
[patent_app_country] => US
[patent_app_date] => 2003-01-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 2625
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 66
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0142/20040142517.pdf
[firstpage_image] =>[orig_patent_app_number] => 10347007
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/347007 | Hatted polysilicon gate structure for improving salicide performance and method of forming the same | Jan 16, 2003 | Abandoned |
Array
(
[id] => 6851568
[patent_doc_number] => 20030143771
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-07-31
[patent_title] => 'Method of fabricating nitride semiconductor, method of fabricating nitride semiconductor device, nitride semiconductor device, semiconductor light emitting device and method of fabricating the same'
[patent_app_type] => new
[patent_app_number] => 10/345377
[patent_app_country] => US
[patent_app_date] => 2003-01-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 44
[patent_figures_cnt] => 44
[patent_no_of_words] => 25883
[patent_no_of_claims] => 99
[patent_no_of_ind_claims] => 17
[patent_words_short_claim] => 54
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0143/20030143771.pdf
[firstpage_image] =>[orig_patent_app_number] => 10345377
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/345377 | Method of fabricating nitride semiconductor, method of fabricating nitride semiconductor device, nitride semiconductor device, semiconductor light emitting device and method of fabricating the same | Jan 15, 2003 | Issued |
Array
(
[id] => 7629849
[patent_doc_number] => 06818507
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-11-16
[patent_title] => 'Method of manufacturing semiconductor device including memory region and logic circuit region'
[patent_app_type] => B2
[patent_app_number] => 10/342307
[patent_app_country] => US
[patent_app_date] => 2003-01-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 21
[patent_no_of_words] => 7797
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 38
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/818/06818507.pdf
[firstpage_image] =>[orig_patent_app_number] => 10342307
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/342307 | Method of manufacturing semiconductor device including memory region and logic circuit region | Jan 14, 2003 | Issued |
Array
(
[id] => 1149027
[patent_doc_number] => 06770495
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-08-03
[patent_title] => 'Method for revealing active regions in a SOI structure for DUT backside inspection'
[patent_app_type] => B1
[patent_app_number] => 10/346507
[patent_app_country] => US
[patent_app_date] => 2003-01-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 2
[patent_no_of_words] => 1212
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 68
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/770/06770495.pdf
[firstpage_image] =>[orig_patent_app_number] => 10346507
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/346507 | Method for revealing active regions in a SOI structure for DUT backside inspection | Jan 14, 2003 | Issued |
Array
(
[id] => 6801274
[patent_doc_number] => 20030096439
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-05-22
[patent_title] => 'Methods for forming index guided vertical cavity surface emitting lasers'
[patent_app_type] => new
[patent_app_number] => 10/339057
[patent_app_country] => US
[patent_app_date] => 2003-01-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 4429
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 3
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0096/20030096439.pdf
[firstpage_image] =>[orig_patent_app_number] => 10339057
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/339057 | Methods for forming index guided vertical cavity surface emitting lasers | Jan 6, 2003 | Issued |
Array
(
[id] => 1056372
[patent_doc_number] => 06855595
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-02-15
[patent_title] => 'Method for manufacturing a CMOS image sensor having a capacitor\'s top electrode in contact with a photo-sensing element'
[patent_app_type] => utility
[patent_app_number] => 10/326680
[patent_app_country] => US
[patent_app_date] => 2002-12-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 17
[patent_no_of_words] => 2803
[patent_no_of_claims] => 40
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 100
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/855/06855595.pdf
[firstpage_image] =>[orig_patent_app_number] => 10326680
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/326680 | Method for manufacturing a CMOS image sensor having a capacitor's top electrode in contact with a photo-sensing element | Dec 19, 2002 | Issued |
Array
(
[id] => 1073639
[patent_doc_number] => 06838304
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-01-04
[patent_title] => 'MEMS element manufacturing method'
[patent_app_type] => utility
[patent_app_number] => 10/468757
[patent_app_country] => US
[patent_app_date] => 2002-12-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 38
[patent_no_of_words] => 8014
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 120
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/838/06838304.pdf
[firstpage_image] =>[orig_patent_app_number] => 10468757
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/468757 | MEMS element manufacturing method | Dec 15, 2002 | Issued |
Array
(
[id] => 6792133
[patent_doc_number] => 20030087477
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-05-08
[patent_title] => 'Repairable flip clip semiconductor device with excellent packaging reliability and method of manufacturing same'
[patent_app_type] => new
[patent_app_number] => 10/317384
[patent_app_country] => US
[patent_app_date] => 2002-12-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3606
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 143
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0087/20030087477.pdf
[firstpage_image] =>[orig_patent_app_number] => 10317384
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/317384 | Repairable flip clip semiconductor device with excellent packaging reliability and method of manufacturing same | Dec 11, 2002 | Abandoned |
Array
(
[id] => 6813738
[patent_doc_number] => 20030073288
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-04-17
[patent_title] => 'Method of forming nitridated tunnel oxide barriers for flash memory technology circuitry and STI and LOCOS isolation'
[patent_app_type] => new
[patent_app_number] => 10/295738
[patent_app_country] => US
[patent_app_date] => 2002-11-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 2342
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 57
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0073/20030073288.pdf
[firstpage_image] =>[orig_patent_app_number] => 10295738
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/295738 | Method of forming nitridated tunnel oxide barriers for flash memory technology circuitry and STI and LOCOS isolation | Nov 14, 2002 | Issued |
Array
(
[id] => 6787767
[patent_doc_number] => 20030139006
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-07-24
[patent_title] => 'Method for producing capacitor structures'
[patent_app_type] => new
[patent_app_number] => 10/258927
[patent_app_country] => US
[patent_app_date] => 2002-10-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 5267
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 10
[patent_words_short_claim] => 11
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0139/20030139006.pdf
[firstpage_image] =>[orig_patent_app_number] => 10258927
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/258927 | Method for producing capacitor structures | Oct 27, 2002 | Abandoned |
Array
(
[id] => 6837189
[patent_doc_number] => 20030034529
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-02-20
[patent_title] => 'CMOS inverter and integrated circuits utilizing strained silicon surface channel MOSFETs'
[patent_app_type] => new
[patent_app_number] => 10/266339
[patent_app_country] => US
[patent_app_date] => 2002-10-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 5612
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 56
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0034/20030034529.pdf
[firstpage_image] =>[orig_patent_app_number] => 10266339
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/266339 | CMOS inverter and integrated circuits utilizing strained silicon surface channel MOSFETs | Oct 7, 2002 | Abandoned |
Array
(
[id] => 7964337
[patent_doc_number] => 06680258
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-01-20
[patent_title] => 'Method of forming an opening through an insulating layer of a semiconductor device'
[patent_app_type] => B1
[patent_app_number] => 10/261947
[patent_app_country] => US
[patent_app_date] => 2002-10-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 30
[patent_no_of_words] => 2745
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/680/06680258.pdf
[firstpage_image] =>[orig_patent_app_number] => 10261947
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/261947 | Method of forming an opening through an insulating layer of a semiconductor device | Oct 1, 2002 | Issued |
Array
(
[id] => 1245681
[patent_doc_number] => 06677201
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-01-13
[patent_title] => 'Method of fabricating thermal CVD oxynitride and BTBAS nitride sidewall spacer for metal oxide semiconductor transistors'
[patent_app_type] => B1
[patent_app_number] => 10/261407
[patent_app_country] => US
[patent_app_date] => 2002-10-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 7
[patent_no_of_words] => 2129
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 106
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/677/06677201.pdf
[firstpage_image] =>[orig_patent_app_number] => 10261407
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/261407 | Method of fabricating thermal CVD oxynitride and BTBAS nitride sidewall spacer for metal oxide semiconductor transistors | Sep 30, 2002 | Issued |
Array
(
[id] => 1280819
[patent_doc_number] => 06642079
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-11-04
[patent_title] => 'Process of fabricating flip chip interconnection structure'
[patent_app_type] => B1
[patent_app_number] => 10/065297
[patent_app_country] => US
[patent_app_date] => 2002-10-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 2979
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 171
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/642/06642079.pdf
[firstpage_image] =>[orig_patent_app_number] => 10065297
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/065297 | Process of fabricating flip chip interconnection structure | Sep 30, 2002 | Issued |
Array
(
[id] => 1253390
[patent_doc_number] => 06670274
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-12-30
[patent_title] => 'Method of forming a copper damascene structure comprising a recessed copper-oxide-free initial copper structure'
[patent_app_type] => B1
[patent_app_number] => 10/261967
[patent_app_country] => US
[patent_app_date] => 2002-10-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 1532
[patent_no_of_claims] => 51
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 174
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/670/06670274.pdf
[firstpage_image] =>[orig_patent_app_number] => 10261967
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/261967 | Method of forming a copper damascene structure comprising a recessed copper-oxide-free initial copper structure | Sep 30, 2002 | Issued |
Array
(
[id] => 6683381
[patent_doc_number] => 20030119245
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-06-26
[patent_title] => 'Semiconductor device having a trench isolation and method of fabricating the same'
[patent_app_type] => new
[patent_app_number] => 10/237022
[patent_app_country] => US
[patent_app_date] => 2002-09-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 62
[patent_figures_cnt] => 62
[patent_no_of_words] => 21354
[patent_no_of_claims] => 38
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0119/20030119245.pdf
[firstpage_image] =>[orig_patent_app_number] => 10237022
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/237022 | Semiconductor device having a trench isolation and method of fabricating the same | Sep 8, 2002 | Issued |
Array
(
[id] => 6811762
[patent_doc_number] => 20030071312
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-04-17
[patent_title] => 'Thin film semiconductor device having a gate electrode insulator formed through high-heat oxidization'
[patent_app_type] => new
[patent_app_number] => 10/236537
[patent_app_country] => US
[patent_app_date] => 2002-09-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5850
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 67
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0071/20030071312.pdf
[firstpage_image] =>[orig_patent_app_number] => 10236537
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/236537 | Thin film semiconductor device having a gate electrode insulator formed through high-heat oxidization | Sep 5, 2002 | Abandoned |
Array
(
[id] => 6792138
[patent_doc_number] => 20030087482
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-05-08
[patent_title] => 'Shallow trench contact structure to solve the problem or schottky diode leakage'
[patent_app_type] => new
[patent_app_number] => 10/236535
[patent_app_country] => US
[patent_app_date] => 2002-09-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 2119
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 69
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0087/20030087482.pdf
[firstpage_image] =>[orig_patent_app_number] => 10236535
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/236535 | Schottky diode having a shallow trench contact structure for preventing junction leakage | Sep 5, 2002 | Issued |
Array
(
[id] => 1152391
[patent_doc_number] => 06767836
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-07-27
[patent_title] => 'Method of cleaning a CVD reaction chamber using an active oxygen species'
[patent_app_type] => B2
[patent_app_number] => 10/235217
[patent_app_country] => US
[patent_app_date] => 2002-09-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 5261
[patent_no_of_claims] => 40
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 51
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/767/06767836.pdf
[firstpage_image] =>[orig_patent_app_number] => 10235217
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/235217 | Method of cleaning a CVD reaction chamber using an active oxygen species | Sep 3, 2002 | Issued |
Array
(
[id] => 1188846
[patent_doc_number] => 06734077
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-05-11
[patent_title] => 'Method for fabricating a trench capacitor for a semiconductor memory'
[patent_app_type] => B2
[patent_app_number] => 10/234547
[patent_app_country] => US
[patent_app_date] => 2002-09-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 21
[patent_no_of_words] => 3924
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 203
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/734/06734077.pdf
[firstpage_image] =>[orig_patent_app_number] => 10234547
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/234547 | Method for fabricating a trench capacitor for a semiconductor memory | Sep 3, 2002 | Issued |