Search

Kiet Tuan Nguyen

Examiner (ID: 15523, Phone: (571)272-2479 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
2878, 3621, 2881, 2506
Total Applications
3960
Issued Applications
3523
Pending Applications
215
Abandoned Applications
251

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 20495289 [patent_doc_number] => 12537165 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-01-27 [patent_title] => Adjustable exit angle source for ions and neutral particles [patent_app_type] => utility [patent_app_number] => 18/370158 [patent_app_country] => US [patent_app_date] => 2023-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 0 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18370158 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/370158
Adjustable exit angle source for ions and neutral particles Sep 18, 2023 Issued
Array ( [id] => 19038054 [patent_doc_number] => 20240087869 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-14 [patent_title] => SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANALYSIS USING SECONDARY ION MASS SPECTROMETRY [patent_app_type] => utility [patent_app_number] => 18/469517 [patent_app_country] => US [patent_app_date] => 2023-09-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10992 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => 0 [patent_words_short_claim] => 15 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18469517 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/469517
Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry Sep 17, 2023 Issued
Array ( [id] => 20507985 [patent_doc_number] => 12542267 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-02-03 [patent_title] => Determining an expected response of a mass spectrometer [patent_app_type] => utility [patent_app_number] => 18/466753 [patent_app_country] => US [patent_app_date] => 2023-09-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 16 [patent_no_of_words] => 9778 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 222 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18466753 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/466753
Determining an expected response of a mass spectrometer Sep 12, 2023 Issued
Array ( [id] => 18863324 [patent_doc_number] => 20230417760 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-28 [patent_title] => C PEPTIDE DETECTION BY MASS SPECTROMETRY [patent_app_type] => utility [patent_app_number] => 18/465292 [patent_app_country] => US [patent_app_date] => 2023-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11798 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18465292 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/465292
C peptide detection by mass spectrometry Sep 11, 2023 Issued
Array ( [id] => 19018294 [patent_doc_number] => 20240074465 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-07 [patent_title] => FOOD IRRADIATION DOSE UNIFORMITY [patent_app_type] => utility [patent_app_number] => 18/242499 [patent_app_country] => US [patent_app_date] => 2023-09-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10206 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18242499 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/242499
FOOD IRRADIATION DOSE UNIFORMITY Sep 4, 2023 Pending
Array ( [id] => 18867949 [patent_doc_number] => 20230422386 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-28 [patent_title] => MAGNETO-OPTICAL TRAP METHOD AND APPARATUS USING POSITIVE AND NEGATIVE G-FACTORS [patent_app_type] => utility [patent_app_number] => 18/461176 [patent_app_country] => US [patent_app_date] => 2023-09-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6762 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -2 [patent_words_short_claim] => 388 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18461176 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/461176
Magneto-optical trap method and apparatus using positive and negative g-factors Sep 4, 2023 Issued
Array ( [id] => 18865787 [patent_doc_number] => 20230420224 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-28 [patent_title] => OPERATING A GAS SUPPLY DEVICE FOR A PARTICLE BEAM DEVICE [patent_app_type] => utility [patent_app_number] => 18/230722 [patent_app_country] => US [patent_app_date] => 2023-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 17859 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18230722 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/230722
Operating a gas feed device for a particle beam apparatus Aug 6, 2023 Issued
Array ( [id] => 20455896 [patent_doc_number] => 12518956 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-01-06 [patent_title] => Time of Flight mass analyser and method of Time of Flight mass spectrometry [patent_app_type] => utility [patent_app_number] => 18/364400 [patent_app_country] => US [patent_app_date] => 2023-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 9842 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18364400 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/364400
Time of Flight mass analyser and method of Time of Flight mass spectrometry Aug 1, 2023 Issued
Array ( [id] => 20266965 [patent_doc_number] => 12437963 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-10-07 [patent_title] => Deep structure signal detection and enhancement by separation to upper (topography) and lower (bottom) areas for robust blind denoising self supervision (BDSS) [patent_app_type] => utility [patent_app_number] => 18/357686 [patent_app_country] => US [patent_app_date] => 2023-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 0 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18357686 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/357686
Deep structure signal detection and enhancement by separation to upper (topography) and lower (bottom) areas for robust blind denoising self supervision (BDSS) Jul 23, 2023 Issued
Array ( [id] => 20266962 [patent_doc_number] => 12437960 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-10-07 [patent_title] => Rotatable TEM grid holder for improved FIB thinning process [patent_app_type] => utility [patent_app_number] => 18/222280 [patent_app_country] => US [patent_app_date] => 2023-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 23 [patent_no_of_words] => 0 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18222280 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/222280
Rotatable TEM grid holder for improved FIB thinning process Jul 13, 2023 Issued
Array ( [id] => 18898536 [patent_doc_number] => 20240014021 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-11 [patent_title] => PROCESSING ION PEAK AREAS IN MASS SPECTROMETRY [patent_app_type] => utility [patent_app_number] => 18/218932 [patent_app_country] => US [patent_app_date] => 2023-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13136 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18218932 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/218932
Processing ion peak areas in mass spectrometry Jul 5, 2023 Issued
Array ( [id] => 18755269 [patent_doc_number] => 20230358696 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-09 [patent_title] => METHOD FOR CROSS-SECTION SAMPLE PREPARATION [patent_app_type] => utility [patent_app_number] => 18/347918 [patent_app_country] => US [patent_app_date] => 2023-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13474 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18347918 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/347918
Method for cross-section sample preparation Jul 5, 2023 Issued
Array ( [id] => 18833725 [patent_doc_number] => 20230402252 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-14 [patent_title] => Charged Particle Beam Device and Image Acquisition Method [patent_app_type] => utility [patent_app_number] => 18/208598 [patent_app_country] => US [patent_app_date] => 2023-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9278 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 203 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18208598 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/208598
Charged particle beam device and image acquisition method Jun 11, 2023 Issued
Array ( [id] => 20538681 [patent_doc_number] => 12555760 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-02-17 [patent_title] => Method for optimizing a parameter setting of at least one mass spectrometry device [patent_app_type] => utility [patent_app_number] => 18/333174 [patent_app_country] => US [patent_app_date] => 2023-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 7294 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18333174 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/333174
Method for optimizing a parameter setting of at least one mass spectrometry device Jun 11, 2023 Issued
Array ( [id] => 19634495 [patent_doc_number] => 20240412944 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-12 [patent_title] => AUTOFOCUS METHOD FOR SINGLE BEAM AND MULTI-BEAM SYSTEMS [patent_app_type] => utility [patent_app_number] => 18/207644 [patent_app_country] => US [patent_app_date] => 2023-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5862 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 52 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18207644 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/207644
Autofocus method for single beam and multi-beam systems Jun 7, 2023 Issued
Array ( [id] => 19029865 [patent_doc_number] => 11929229 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-12 [patent_title] => Semiconductor wafer [patent_app_type] => utility [patent_app_number] => 18/196548 [patent_app_country] => US [patent_app_date] => 2023-05-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 16 [patent_no_of_words] => 5047 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18196548 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/196548
Semiconductor wafer May 11, 2023 Issued
Array ( [id] => 19079327 [patent_doc_number] => 11948702 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-04-02 [patent_title] => Radiation source apparatus and method for using the same [patent_app_type] => utility [patent_app_number] => 18/312991 [patent_app_country] => US [patent_app_date] => 2023-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 14 [patent_no_of_words] => 8840 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18312991 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/312991
Radiation source apparatus and method for using the same May 4, 2023 Issued
Array ( [id] => 19559827 [patent_doc_number] => 20240371619 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-07 [patent_title] => PARALLEL PROCESSING AND HORIZONTAL SCALING FOR PEAK DETECTION [patent_app_type] => utility [patent_app_number] => 18/313241 [patent_app_country] => US [patent_app_date] => 2023-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9408 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18313241 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/313241
Parallel processing and horizontal scaling for peak detection May 4, 2023 Issued
Array ( [id] => 19558144 [patent_doc_number] => 20240369936 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-07 [patent_title] => EXTREME ULTRAVIOLET (EUV) RADIATION SOURCE APPARATUS, EUV LITHOGRAPHY SYSTEM, AND METHOD FOR GENERATING EXTREME ULTRAVIOLET RADIATION [patent_app_type] => utility [patent_app_number] => 18/312579 [patent_app_country] => US [patent_app_date] => 2023-05-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6786 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18312579 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/312579
Extreme ultraviolet (EUV) radiation source apparatus, EUV lithography system, and method for generating extreme ultraviolet radiation May 3, 2023 Issued
Array ( [id] => 20188326 [patent_doc_number] => 12399437 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-26 [patent_title] => Debris mitigation device and light source apparatus including the same [patent_app_type] => utility [patent_app_number] => 18/141327 [patent_app_country] => US [patent_app_date] => 2023-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 22 [patent_no_of_words] => 10692 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 189 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18141327 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/141327
Debris mitigation device and light source apparatus including the same Apr 27, 2023 Issued
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