
Kiet Tuan Nguyen
Examiner (ID: 15523, Phone: (571)272-2479 , Office: P/2881 )
| Most Active Art Unit | 2881 |
| Art Unit(s) | 2878, 3621, 2881, 2506 |
| Total Applications | 3960 |
| Issued Applications | 3523 |
| Pending Applications | 215 |
| Abandoned Applications | 251 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 11576792
[patent_doc_number] => 09632044
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2017-04-25
[patent_title] => 'Imaging bottom of high aspect ratio holes'
[patent_app_type] => utility
[patent_app_number] => 15/059063
[patent_app_country] => US
[patent_app_date] => 2016-03-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 4683
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 181
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15059063
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/059063 | Imaging bottom of high aspect ratio holes | Mar 1, 2016 | Issued |
Array
(
[id] => 11063613
[patent_doc_number] => 20160260575
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2016-09-08
[patent_title] => 'ELECTRON BEAM GENERATOR, IMAGE APPARATUS INCLUDING THE SAME AND OPTICAL APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 15/059199
[patent_app_country] => US
[patent_app_date] => 2016-03-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 3686
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15059199
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/059199 | Electron beam generator, image apparatus including the same and optical apparatus | Mar 1, 2016 | Issued |
Array
(
[id] => 11578645
[patent_doc_number] => 09633915
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2017-04-25
[patent_title] => 'Method of using dummy patterns for overlay target design and overlay control'
[patent_app_type] => utility
[patent_app_number] => 15/057727
[patent_app_country] => US
[patent_app_date] => 2016-03-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 2734
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 60
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15057727
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/057727 | Method of using dummy patterns for overlay target design and overlay control | Feb 29, 2016 | Issued |
Array
(
[id] => 11615395
[patent_doc_number] => 09653257
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-05-16
[patent_title] => 'Method and system for reducing charging artifacts in scanning electron microscopy images'
[patent_app_type] => utility
[patent_app_number] => 15/058062
[patent_app_country] => US
[patent_app_date] => 2016-03-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 6171
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 163
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15058062
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/058062 | Method and system for reducing charging artifacts in scanning electron microscopy images | Feb 29, 2016 | Issued |
Array
(
[id] => 11045311
[patent_doc_number] => 20160242268
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2016-08-18
[patent_title] => 'EXTREME ULTRAVIOLET SOURCE WITH MAGNETIC CUSP PLASMA CONTROL'
[patent_app_type] => utility
[patent_app_number] => 15/046604
[patent_app_country] => US
[patent_app_date] => 2016-02-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 6622
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15046604
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/046604 | Extreme ultraviolet source with magnetic cusp plasma control | Feb 17, 2016 | Issued |
Array
(
[id] => 11645017
[patent_doc_number] => 09666406
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2017-05-30
[patent_title] => 'Charged particle beam device, system for a charged particle beam device, and method for operating a charged particle beam device'
[patent_app_type] => utility
[patent_app_number] => 15/047007
[patent_app_country] => US
[patent_app_date] => 2016-02-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 8
[patent_no_of_words] => 7225
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 73
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15047007
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/047007 | Charged particle beam device, system for a charged particle beam device, and method for operating a charged particle beam device | Feb 17, 2016 | Issued |
Array
(
[id] => 11645016
[patent_doc_number] => 09666405
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2017-05-30
[patent_title] => 'System for imaging a signal charged particle beam, method for imaging a signal charged particle beam, and charged particle beam device'
[patent_app_type] => utility
[patent_app_number] => 15/046905
[patent_app_country] => US
[patent_app_date] => 2016-02-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 8
[patent_no_of_words] => 6935
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 156
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15046905
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/046905 | System for imaging a signal charged particle beam, method for imaging a signal charged particle beam, and charged particle beam device | Feb 17, 2016 | Issued |
Array
(
[id] => 11028640
[patent_doc_number] => 20160225596
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2016-08-04
[patent_title] => 'Method And Apparatus For Transporting Samples In A Mass Spectrometer'
[patent_app_type] => utility
[patent_app_number] => 15/044934
[patent_app_country] => US
[patent_app_date] => 2016-02-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 5916
[patent_no_of_claims] => 37
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15044934
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/044934 | Method and apparatus for transporting samples in a mass spectrometer | Feb 15, 2016 | Issued |
Array
(
[id] => 12162335
[patent_doc_number] => 20180033600
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2018-02-01
[patent_title] => 'DEVICE AND METHOD FOR ANALYSIS OF BIOFLUIDS BY ION GENERATION USING WETTED POROUS MATERIAL'
[patent_app_type] => utility
[patent_app_number] => 15/549948
[patent_app_country] => US
[patent_app_date] => 2016-02-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 26
[patent_figures_cnt] => 26
[patent_no_of_words] => 17928
[patent_no_of_claims] => 34
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15549948
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/549948 | Device and method for analysis of biofluids by ion generation using wetted porous material | Feb 9, 2016 | Issued |
Array
(
[id] => 13070917
[patent_doc_number] => 10056242
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2018-08-21
[patent_title] => Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
[patent_app_type] => utility
[patent_app_number] => 15/550014
[patent_app_country] => US
[patent_app_date] => 2016-02-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 20
[patent_no_of_words] => 10940
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 94
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15550014
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/550014 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | Feb 9, 2016 | Issued |
Array
(
[id] => 11201004
[patent_doc_number] => 09431223
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-08-30
[patent_title] => 'Imaging mass spectrometry method and device'
[patent_app_type] => utility
[patent_app_number] => 15/016736
[patent_app_country] => US
[patent_app_date] => 2016-02-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4966
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 118
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15016736
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/016736 | Imaging mass spectrometry method and device | Feb 4, 2016 | Issued |
Array
(
[id] => 12154621
[patent_doc_number] => 20180025885
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2018-01-25
[patent_title] => 'COMPOSITE CHARGED PARTICLE BEAM DEVICE'
[patent_app_type] => utility
[patent_app_number] => 15/548321
[patent_app_country] => US
[patent_app_date] => 2016-02-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 11058
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15548321
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/548321 | Composite charged particle beam device | Feb 3, 2016 | Issued |
Array
(
[id] => 12181529
[patent_doc_number] => 20180040465
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2018-02-08
[patent_title] => 'AN ION MIRROR, AN ION MIRROR ASSEMBLY AND AN ION TRAP'
[patent_app_type] => utility
[patent_app_number] => 15/547408
[patent_app_country] => US
[patent_app_date] => 2016-01-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 17
[patent_no_of_words] => 9734
[patent_no_of_claims] => 35
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15547408
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/547408 | Ion mirror, an ion mirror assembly and an ion trap | Jan 28, 2016 | Issued |
Array
(
[id] => 12047236
[patent_doc_number] => 09824846
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-11-21
[patent_title] => 'Dual material repeller'
[patent_app_type] => utility
[patent_app_number] => 15/007853
[patent_app_country] => US
[patent_app_date] => 2016-01-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 3925
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 53
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15007853
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/007853 | Dual material repeller | Jan 26, 2016 | Issued |
Array
(
[id] => 11787460
[patent_doc_number] => 09396919
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-07-19
[patent_title] => 'Collision cell'
[patent_app_type] => utility
[patent_app_number] => 15/005881
[patent_app_country] => US
[patent_app_date] => 2016-01-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 10
[patent_no_of_words] => 8802
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 206
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15005881
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/005881 | Collision cell | Jan 24, 2016 | Issued |
Array
(
[id] => 11826328
[patent_doc_number] => 20170215265
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-07-27
[patent_title] => 'System, Method and Apparatus for Target Material Debris Cleaning of EUV Vessel and EUV Collector'
[patent_app_type] => utility
[patent_app_number] => 15/003385
[patent_app_country] => US
[patent_app_date] => 2016-01-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 20
[patent_no_of_words] => 9714
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15003385
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/003385 | System, method and apparatus for target material debris cleaning of EUV vessel and EUV collector | Jan 20, 2016 | Issued |
Array
(
[id] => 11658362
[patent_doc_number] => 09671355
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-06-06
[patent_title] => 'Electron excited X-ray fluorescence device'
[patent_app_type] => utility
[patent_app_number] => 15/003571
[patent_app_country] => US
[patent_app_date] => 2016-01-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 10
[patent_no_of_words] => 2690
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 93
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15003571
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/003571 | Electron excited X-ray fluorescence device | Jan 20, 2016 | Issued |
Array
(
[id] => 11585729
[patent_doc_number] => 09640378
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-05-02
[patent_title] => 'Time-of-flight mass spectrometer'
[patent_app_type] => utility
[patent_app_number] => 15/001709
[patent_app_country] => US
[patent_app_date] => 2016-01-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 14
[patent_no_of_words] => 7801
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 228
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15001709
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/001709 | Time-of-flight mass spectrometer | Jan 19, 2016 | Issued |
Array
(
[id] => 11753307
[patent_doc_number] => 09711326
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2017-07-18
[patent_title] => 'Test structure for electron beam inspection and method for defect determination using electron beam inspection'
[patent_app_type] => utility
[patent_app_number] => 15/001249
[patent_app_country] => US
[patent_app_date] => 2016-01-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 3673
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 40
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15001249
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/001249 | Test structure for electron beam inspection and method for defect determination using electron beam inspection | Jan 19, 2016 | Issued |
Array
(
[id] => 14196919
[patent_doc_number] => 10265546
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2019-04-23
[patent_title] => Time-resolved pre-treatment portal dosimetry systems, devices, and methods
[patent_app_type] => utility
[patent_app_number] => 15/002205
[patent_app_country] => US
[patent_app_date] => 2016-01-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 12
[patent_no_of_words] => 7975
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 101
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15002205
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/002205 | Time-resolved pre-treatment portal dosimetry systems, devices, and methods | Jan 19, 2016 | Issued |