Kiet Tuan Nguyen

Array ( [id] => 6357423 [patent_doc_number] => 20100078556 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-01 [patent_title] => 'Electron Beam Apparatus And Method of Generating An Electron Beam Irradiation Pattern' [patent_app_type] => utility [patent_app_number] => 12/630378 [patent_app_country] => US [patent_app_date] => 2009-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 10875 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0078/20100078556.pdf [firstpage_image] =>[orig_patent_app_number] => 12630378 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8364032 [patent_doc_number] => 08253099 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-08-28 [patent_title] => 'Methods and devices for high throughput crystal structure analysis by electron diffraction' [patent_app_type] => utility [patent_app_number] => 13/127455 [patent_app_country] => US [patent_app_date] => 2009-11-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 20 [patent_no_of_words] => 13667 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 182 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13127455 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5932014 [patent_doc_number] => 20110210273 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-09-01 [patent_title] => 'UV LAMP' [patent_app_type] => utility [patent_app_number] => 13/128248 [patent_app_country] => US [patent_app_date] => 2009-11-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4272 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0210/20110210273.pdf [firstpage_image] =>[orig_patent_app_number] => 13128248 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6042153 [patent_doc_number] => 20110204230 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-08-25 [patent_title] => 'ELECTRON BEAM TYPE SUBSTRATE INSPECTING APPARATUS' [patent_app_type] => utility [patent_app_number] => 13/128188 [patent_app_country] => US [patent_app_date] => 2009-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8175 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0204/20110204230.pdf [firstpage_image] =>[orig_patent_app_number] => 13128188 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6042145 [patent_doc_number] => 20110204222 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-08-25 [patent_title] => 'METHOD OF CHARACTERIZING PHYTOCHEMICALS FROM TRIGONELLA FOENUM GRACEUM' [patent_app_type] => utility [patent_app_number] => 13/126642 [patent_app_country] => US [patent_app_date] => 2009-10-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 4780 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0204/20110204222.pdf [firstpage_image] =>[orig_patent_app_number] => 13126642 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6042151 [patent_doc_number] => 20110204228 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-08-25 [patent_title] => 'CHARGED PARTICLE BEAM APPARATUS' [patent_app_type] => utility [patent_app_number] => 13/126198 [patent_app_country] => US [patent_app_date] => 2009-10-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 12031 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0204/20110204228.pdf [firstpage_image] =>[orig_patent_app_number] => 13126198 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7558743 [patent_doc_number] => 20110272574 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-11-10 [patent_title] => 'SECURITY APPARATUS' [patent_app_type] => utility [patent_app_number] => 13/127996 [patent_app_country] => US [patent_app_date] => 2009-10-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4474 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0272/20110272574.pdf [firstpage_image] =>[orig_patent_app_number] => 13127996 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8969039 [patent_doc_number] => 08507853 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-08-13 [patent_title] => 'Method and system for determining depth profiling' [patent_app_type] => utility [patent_app_number] => 13/124224 [patent_app_country] => US [patent_app_date] => 2009-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 5678 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13124224 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8560455 [patent_doc_number] => 08334520 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-12-18 [patent_title] => 'Charged particle beam apparatus' [patent_app_type] => utility [patent_app_number] => 13/124599 [patent_app_country] => US [patent_app_date] => 2009-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 18 [patent_no_of_words] => 14592 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13124599 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8653364 [patent_doc_number] => 08373113 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-02-12 [patent_title] => 'Calibration standard member, method for manufacturing the member and scanning electronic microscope using the member' [patent_app_type] => utility [patent_app_number] => 13/127912 [patent_app_country] => US [patent_app_date] => 2009-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 25 [patent_no_of_words] => 11480 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13127912 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6058581 [patent_doc_number] => 20110198495 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-08-18 [patent_title] => 'IONIZATION METHOD AND APPARATUS USING A PROBE, AND ANALYTICAL METHOD AND APPARATUS' [patent_app_type] => utility [patent_app_number] => 13/125437 [patent_app_country] => US [patent_app_date] => 2009-10-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 10348 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0198/20110198495.pdf [firstpage_image] =>[orig_patent_app_number] => 13125437 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7558769 [patent_doc_number] => 20110272600 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-11-10 [patent_title] => 'Irradiation of at Least Two Target Volumes' [patent_app_type] => utility [patent_app_number] => 13/125941 [patent_app_country] => US [patent_app_date] => 2009-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7979 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0272/20110272600.pdf [firstpage_image] =>[orig_patent_app_number] => 13125941 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6573630 [patent_doc_number] => 20100096550 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-22 [patent_title] => 'PROJECTION ELECTRON BEAM APPARATUS AND DEFECT INSPECTION SYSTEM USING THE APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/580505 [patent_app_country] => US [patent_app_date] => 2009-10-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 59 [patent_figures_cnt] => 59 [patent_no_of_words] => 47515 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0096/20100096550.pdf [firstpage_image] =>[orig_patent_app_number] => 12580505 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6058606 [patent_doc_number] => 20110198512 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-08-18 [patent_title] => 'CHARGED CORPUSCULAR BEAM APPARATUS' [patent_app_type] => utility [patent_app_number] => 13/125586 [patent_app_country] => US [patent_app_date] => 2009-10-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4847 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0198/20110198512.pdf [firstpage_image] =>[orig_patent_app_number] => 13125586 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8538691 [patent_doc_number] => 08314412 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-11-20 [patent_title] => 'Grid and method of manufacturing a grid for selective transmission of electromagnetic radiation, particularly X-ray radiation for mammography applications' [patent_app_type] => utility [patent_app_number] => 13/122969 [patent_app_country] => US [patent_app_date] => 2009-10-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 5332 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13122969 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6335415 [patent_doc_number] => 20100019150 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-28 [patent_title] => 'Method And Apparatus For Reviewing Defects' [patent_app_type] => utility [patent_app_number] => 12/573479 [patent_app_country] => US [patent_app_date] => 2009-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8837 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0019/20100019150.pdf [firstpage_image] =>[orig_patent_app_number] => 12573479 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7504452 [patent_doc_number] => 08035081 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-10-11 [patent_title] => 'High precision electric gate for time-of-flight ion mass spectrometers' [patent_app_type] => utility [patent_app_number] => 12/570166 [patent_app_country] => US [patent_app_date] => 2009-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3988 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/035/08035081.pdf [firstpage_image] =>[orig_patent_app_number] => 12570166 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6357428 [patent_doc_number] => 20100078557 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-01 [patent_title] => 'ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/570112 [patent_app_country] => US [patent_app_date] => 2009-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5245 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0078/20100078557.pdf [firstpage_image] =>[orig_patent_app_number] => 12570112 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8533782 [patent_doc_number] => 08309938 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-11-13 [patent_title] => 'Ion beam incident angle detection assembly and method' [patent_app_type] => utility [patent_app_number] => 12/568781 [patent_app_country] => US [patent_app_date] => 2009-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 3597 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12568781 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8245189 [patent_doc_number] => 08203117 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-06-19 [patent_title] => 'Method and apparatus for embedded heater for desorption and ionization of analytes' [patent_app_type] => utility [patent_app_number] => 12/568929 [patent_app_country] => US [patent_app_date] => 2009-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 5433 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 39 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/203/08203117.pdf [firstpage_image] =>[orig_patent_app_number] => 12568929 [rel_patent_id] =>[rel_patent_doc_number] =>)