
Kin Chan Chen
Examiner (ID: 4953)
| Most Active Art Unit | 1765 |
| Art Unit(s) | 1792, 1765 |
| Total Applications | 758 |
| Issued Applications | 583 |
| Pending Applications | 32 |
| Abandoned Applications | 143 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6669030
[patent_doc_number] => 20030114014
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-06-19
[patent_title] => 'Photoresist stripping solution and a method of stripping photoresists using the same'
[patent_app_type] => new
[patent_app_number] => 10/208096
[patent_app_country] => US
[patent_app_date] => 2002-07-31
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0114/20030114014.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/208096 | Photoresist stripping solution and a method of stripping photoresists using the same | Jul 30, 2002 | Abandoned |
Array
(
[id] => 7400831
[patent_doc_number] => 20040023507
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[patent_kind] => A1
[patent_issue_date] => 2004-02-05
[patent_title] => 'Processing method'
[patent_app_type] => new
[patent_app_number] => 10/210757
[patent_app_country] => US
[patent_app_date] => 2002-07-31
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[pdf_file] => publications/A1/0023/20040023507.pdf
[firstpage_image] =>[orig_patent_app_number] => 10210757
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/210757 | Etching processing method for a material layer | Jul 30, 2002 | Issued |
Array
(
[id] => 931147
[patent_doc_number] => 06979651
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[patent_issue_date] => 2005-12-27
[patent_title] => 'Method for forming alignment features and back-side contacts with fewer lithography and etch steps'
[patent_app_type] => utility
[patent_app_number] => 10/207653
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[patent_app_date] => 2002-07-29
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/207653 | Method for forming alignment features and back-side contacts with fewer lithography and etch steps | Jul 28, 2002 | Issued |
Array
(
[id] => 6260717
[patent_doc_number] => 20020187638
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[patent_issue_date] => 2002-12-12
[patent_title] => 'Method for fabricating semiconductor device'
[patent_app_type] => new
[patent_app_number] => 10/206053
[patent_app_country] => US
[patent_app_date] => 2002-07-29
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 10206053
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/206053 | Method for fabricating semiconductor device | Jul 28, 2002 | Issued |
Array
(
[id] => 7399100
[patent_doc_number] => 20040018739
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[patent_kind] => A1
[patent_issue_date] => 2004-01-29
[patent_title] => 'Methods for etching using building blocks'
[patent_app_type] => new
[patent_app_number] => 10/206252
[patent_app_country] => US
[patent_app_date] => 2002-07-26
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 10206252
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/206252 | Methods for etching using building blocks | Jul 25, 2002 | Abandoned |
Array
(
[id] => 7399123
[patent_doc_number] => 20040018741
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-01-29
[patent_title] => 'Method For Enhancing Critical Dimension Uniformity After Etch'
[patent_app_type] => new
[patent_app_number] => 10/206634
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/206634 | Method For Enhancing Critical Dimension Uniformity After Etch | Jul 25, 2002 | Abandoned |
Array
(
[id] => 6651434
[patent_doc_number] => 20030008507
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[patent_issue_date] => 2003-01-09
[patent_title] => 'Method of monitoring a production process'
[patent_app_type] => new
[patent_app_number] => 10/205080
[patent_app_country] => US
[patent_app_date] => 2002-07-25
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0008/20030008507.pdf
[firstpage_image] =>[orig_patent_app_number] => 10205080
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/205080 | Method of monitoring a production process using a linear combination of measured variables with selected weights | Jul 24, 2002 | Issued |
| 10/030525 | Semiconductor device and method of manufacturing semiconductor device | Jul 23, 2002 | Abandoned |
Array
(
[id] => 7387888
[patent_doc_number] => 20040016904
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-01-29
[patent_title] => 'Composition and process for wet stripping removal of sacrificial anti-reflective material'
[patent_app_type] => new
[patent_app_number] => 10/201340
[patent_app_country] => US
[patent_app_date] => 2002-07-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
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[pdf_file] => publications/A1/0016/20040016904.pdf
[firstpage_image] =>[orig_patent_app_number] => 10201340
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/201340 | Composition and process for wet stripping removal of sacrificial anti-reflective material | Jul 22, 2002 | Issued |
Array
(
[id] => 1177621
[patent_doc_number] => 06743734
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-06-01
[patent_title] => 'Bi-layer resist process'
[patent_app_type] => B2
[patent_app_number] => 10/196291
[patent_app_country] => US
[patent_app_date] => 2002-07-17
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 10196291
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/196291 | Bi-layer resist process | Jul 16, 2002 | Issued |
Array
(
[id] => 7194080
[patent_doc_number] => 20050163931
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-07-28
[patent_title] => 'Orientation coating method of the top of micro tip'
[patent_app_type] => utility
[patent_app_number] => 10/508128
[patent_app_country] => US
[patent_app_date] => 2002-07-12
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0163/20050163931.pdf
[firstpage_image] =>[orig_patent_app_number] => 10508128
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/508128 | Orientation coating method of the top of micro tip | Jul 11, 2002 | Abandoned |
Array
(
[id] => 6447619
[patent_doc_number] => 20020177316
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-11-28
[patent_title] => 'Slurry and method for chemical mechanical polishing of copper'
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[patent_app_number] => 10/193794
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/193794 | Slurry and method for chemical mechanical polishing of copper | Jul 10, 2002 | Abandoned |
Array
(
[id] => 1119882
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[patent_issue_date] => 2004-09-28
[patent_title] => 'Partial via hard mask open on low-k dual damascene etch with dual hard mask (DHM) approach'
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Array
(
[id] => 1050086
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[patent_title] => 'Method and system for forming a semiconductor device'
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Array
(
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Array
(
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[patent_title] => 'Method for fabricating fine features by jet-printing and surface treatment'
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Array
(
[id] => 7409717
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[patent_title] => 'Method for etching object to be processed'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/486363 | Method for etching object to be processed | Jun 9, 2002 | Issued |
Array
(
[id] => 6676858
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[patent_title] => 'Metal oxide coated carbon black for CMP'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/164916 | Meta oxide coated carbon black for CMP | Jun 5, 2002 | Issued |
Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/152775 | Method for fabricating semiconductor device comprising forming holes in a multi-layer insulating film | May 22, 2002 | Issued |
Array
(
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[patent_title] => 'Method to prevent electrical shorts between adjacent metal lines'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/153347 | Method to prevent electrical shorts between adjacent metal lines | May 20, 2002 | Issued |