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Kin Chan Chen

Examiner (ID: 4953)

Most Active Art Unit
1765
Art Unit(s)
1792, 1765
Total Applications
758
Issued Applications
583
Pending Applications
32
Abandoned Applications
143

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 1462663 [patent_doc_number] => 06350697 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-02-26 [patent_title] => 'Method of cleaning and conditioning plasma reaction chamber' [patent_app_type] => B1 [patent_app_number] => 09/469286 [patent_app_country] => US [patent_app_date] => 1999-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 19 [patent_no_of_words] => 4489 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/350/06350697.pdf [firstpage_image] =>[orig_patent_app_number] => 09469286 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/469286
Method of cleaning and conditioning plasma reaction chamber Dec 21, 1999 Issued
Array ( [id] => 4325514 [patent_doc_number] => 06329299 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-12-11 [patent_title] => 'Compositions and methods for the selective etching of tantalum-containing films for wafer reclamation' [patent_app_type] => 1 [patent_app_number] => 9/470153 [patent_app_country] => US [patent_app_date] => 1999-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 11169 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/329/06329299.pdf [firstpage_image] =>[orig_patent_app_number] => 470153 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/470153
Compositions and methods for the selective etching of tantalum-containing films for wafer reclamation Dec 21, 1999 Issued
Array ( [id] => 1291192 [patent_doc_number] => 06630405 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-10-07 [patent_title] => 'Method of gate patterning for sub-0.1 m technology' [patent_app_type] => B1 [patent_app_number] => 09/467136 [patent_app_country] => US [patent_app_date] => 1999-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 1353 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/630/06630405.pdf [firstpage_image] =>[orig_patent_app_number] => 09467136 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/467136
Method of gate patterning for sub-0.1 m technology Dec 19, 1999 Issued
Array ( [id] => 1602654 [patent_doc_number] => 06432833 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-08-13 [patent_title] => 'Method of forming a self aligned contact opening' [patent_app_type] => B1 [patent_app_number] => 09/468239 [patent_app_country] => US [patent_app_date] => 1999-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2445 [patent_no_of_claims] => 60 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/432/06432833.pdf [firstpage_image] =>[orig_patent_app_number] => 09468239 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/468239
Method of forming a self aligned contact opening Dec 19, 1999 Issued
Array ( [id] => 1092918 [patent_doc_number] => 06825117 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-11-30 [patent_title] => 'High PH slurry for chemical mechanical polishing of copper' [patent_app_type] => B2 [patent_app_number] => 09/461158 [patent_app_country] => US [patent_app_date] => 1999-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3934 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 45 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/825/06825117.pdf [firstpage_image] =>[orig_patent_app_number] => 09461158 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/461158
High PH slurry for chemical mechanical polishing of copper Dec 13, 1999 Issued
Array ( [id] => 4409360 [patent_doc_number] => 06228776 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-05-08 [patent_title] => 'Ashing process by adjusting etching endpoint and orderly stepped positioning silicon wafer' [patent_app_type] => 1 [patent_app_number] => 9/455924 [patent_app_country] => US [patent_app_date] => 1999-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2061 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/228/06228776.pdf [firstpage_image] =>[orig_patent_app_number] => 455924 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/455924
Ashing process by adjusting etching endpoint and orderly stepped positioning silicon wafer Dec 6, 1999 Issued
Array ( [id] => 4262261 [patent_doc_number] => 06245144 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-12 [patent_title] => 'Doping control in selective area growth (SAG) of InP epitaxy in the fabrication of solid state semiconductor lasers' [patent_app_type] => 1 [patent_app_number] => 9/455136 [patent_app_country] => US [patent_app_date] => 1999-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2041 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 237 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/245/06245144.pdf [firstpage_image] =>[orig_patent_app_number] => 455136 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/455136
Doping control in selective area growth (SAG) of InP epitaxy in the fabrication of solid state semiconductor lasers Dec 5, 1999 Issued
Array ( [id] => 4381942 [patent_doc_number] => 06261958 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-17 [patent_title] => 'Method for performing chemical-mechanical polishing' [patent_app_type] => 1 [patent_app_number] => 9/450485 [patent_app_country] => US [patent_app_date] => 1999-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2694 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/261/06261958.pdf [firstpage_image] =>[orig_patent_app_number] => 450485 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/450485
Method for performing chemical-mechanical polishing Nov 28, 1999 Issued
Array ( [id] => 4401155 [patent_doc_number] => 06264741 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-24 [patent_title] => 'Self-assembly of nanocomposite materials' [patent_app_type] => 1 [patent_app_number] => 9/449036 [patent_app_country] => US [patent_app_date] => 1999-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3703 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/264/06264741.pdf [firstpage_image] =>[orig_patent_app_number] => 449036 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/449036
Self-assembly of nanocomposite materials Nov 23, 1999 Issued
Array ( [id] => 1523766 [patent_doc_number] => 06352927 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-03-05 [patent_title] => 'Semiconductor wafer and method for fabrication thereof' [patent_app_type] => B2 [patent_app_number] => 09/447309 [patent_app_country] => US [patent_app_date] => 1999-11-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4342 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/352/06352927.pdf [firstpage_image] =>[orig_patent_app_number] => 09447309 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/447309
Semiconductor wafer and method for fabrication thereof Nov 21, 1999 Issued
Array ( [id] => 1578320 [patent_doc_number] => 06448182 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-09-10 [patent_title] => 'Stabilization of peroxygen-containing slurries used in a chemical mechanical planarization' [patent_app_type] => B1 [patent_app_number] => 09/447172 [patent_app_country] => US [patent_app_date] => 1999-11-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2230 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/448/06448182.pdf [firstpage_image] =>[orig_patent_app_number] => 09447172 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/447172
Stabilization of peroxygen-containing slurries used in a chemical mechanical planarization Nov 21, 1999 Issued
Array ( [id] => 5828838 [patent_doc_number] => 20020068460 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-06-06 [patent_title] => 'METHOD OF PLANARIZING POLYSILLICON PLUG' [patent_app_type] => new [patent_app_number] => 09/440904 [patent_app_country] => US [patent_app_date] => 1999-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1398 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0068/20020068460.pdf [firstpage_image] =>[orig_patent_app_number] => 09440904 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/440904
Method of planarizing polysillicon plug Nov 15, 1999 Issued
Array ( [id] => 1123473 [patent_doc_number] => 06794294 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-09-21 [patent_title] => 'Etch process that resists notching at electrode bottom' [patent_app_type] => B1 [patent_app_number] => 09/437006 [patent_app_country] => US [patent_app_date] => 1999-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3096 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 177 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/794/06794294.pdf [firstpage_image] =>[orig_patent_app_number] => 09437006 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/437006
Etch process that resists notching at electrode bottom Nov 8, 1999 Issued
Array ( [id] => 1595280 [patent_doc_number] => 06492186 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-12-10 [patent_title] => 'Method for detecting an endpoint for an oxygen free plasma process' [patent_app_type] => B1 [patent_app_number] => 09/434617 [patent_app_country] => US [patent_app_date] => 1999-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 7513 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/492/06492186.pdf [firstpage_image] =>[orig_patent_app_number] => 09434617 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/434617
Method for detecting an endpoint for an oxygen free plasma process Nov 4, 1999 Issued
Array ( [id] => 1528164 [patent_doc_number] => 06479395 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-11-12 [patent_title] => 'Methods for forming openings in a substrate and apparatuses with these openings and methods for creating assemblies with openings' [patent_app_type] => B1 [patent_app_number] => 09/432512 [patent_app_country] => US [patent_app_date] => 1999-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 60 [patent_no_of_words] => 12873 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/479/06479395.pdf [firstpage_image] =>[orig_patent_app_number] => 09432512 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/432512
Methods for forming openings in a substrate and apparatuses with these openings and methods for creating assemblies with openings Nov 1, 1999 Issued
Array ( [id] => 4348670 [patent_doc_number] => 06214732 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-04-10 [patent_title] => 'Chemical mechanical polishing endpoint detection by monitoring component activity in effluent slurry' [patent_app_type] => 1 [patent_app_number] => 9/431198 [patent_app_country] => US [patent_app_date] => 1999-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 7119 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/214/06214732.pdf [firstpage_image] =>[orig_patent_app_number] => 431198 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/431198
Chemical mechanical polishing endpoint detection by monitoring component activity in effluent slurry Oct 31, 1999 Issued
09/428342 COMPOSITIONS AND METHODS FOR THE SELECTIVE ETCHING OF POLYSILICON FOR WAFER RECLAMATION Oct 26, 1999 Abandoned
Array ( [id] => 5824864 [patent_doc_number] => 20020066408 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-06-06 [patent_title] => 'DOMED WAFER REACTOR VESSEL WINDOW WITH REDUCED STRESS AT ATMOSPHERIC AND ABOVE ATMOSPHERIC PRESSURES' [patent_app_type] => new [patent_app_number] => 09/426218 [patent_app_country] => US [patent_app_date] => 1999-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3039 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 25 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0066/20020066408.pdf [firstpage_image] =>[orig_patent_app_number] => 09426218 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/426218
Domed wafer reactor vessel window with reduced stress at atmospheric and above atmospheric pressures Oct 21, 1999 Issued
Array ( [id] => 4376042 [patent_doc_number] => 06294106 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-25 [patent_title] => 'Slurries of abrasive inorganic oxide particles and method for adjusting the abrasiveness of the particles' [patent_app_type] => 1 [patent_app_number] => 9/422384 [patent_app_country] => US [patent_app_date] => 1999-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 5224 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/294/06294106.pdf [firstpage_image] =>[orig_patent_app_number] => 422384 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/422384
Slurries of abrasive inorganic oxide particles and method for adjusting the abrasiveness of the particles Oct 20, 1999 Issued
Array ( [id] => 1231455 [patent_doc_number] => 06693035 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-02-17 [patent_title] => 'Methods to control film removal rates for improved polishing in metal CMP' [patent_app_type] => B1 [patent_app_number] => 09/420682 [patent_app_country] => US [patent_app_date] => 1999-10-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4287 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/693/06693035.pdf [firstpage_image] =>[orig_patent_app_number] => 09420682 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/420682
Methods to control film removal rates for improved polishing in metal CMP Oct 18, 1999 Issued
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