| Application number | Title of the application | Filing Date | Status |
|---|
Array
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[patent_title] => 'Step and repeat apparatus having enhanced accuracy and increased throughput'
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[patent_app_number] => 8/261630
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/261630 | Step and repeat apparatus having enhanced accuracy and increased throughput | Jun 16, 1994 | Issued |
Array
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[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-10-10
[patent_title] => 'Point-diffraction interferometer utilizing separate reference and signal beam paths'
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[patent_app_number] => 8/258196
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[firstpage_image] =>[orig_patent_app_number] => 258196
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/258196 | Point-diffraction interferometer utilizing separate reference and signal beam paths | Jun 9, 1994 | Issued |
Array
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[patent_doc_number] => 05598270
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-01-28
[patent_title] => 'Sensor device and position determination process and their use for the control of an insertion robot'
[patent_app_type] => 1
[patent_app_number] => 8/190086
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/190086 | Sensor device and position determination process and their use for the control of an insertion robot | Jun 5, 1994 | Issued |
Array
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[patent_doc_number] => 05465147
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-07
[patent_title] => 'Method and apparatus for acquiring images using a ccd detector array and no transverse scanner'
[patent_app_type] => 1
[patent_app_number] => 8/253059
[patent_app_country] => US
[patent_app_date] => 1994-06-02
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[firstpage_image] =>[orig_patent_app_number] => 253059
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/253059 | Method and apparatus for acquiring images using a ccd detector array and no transverse scanner | Jun 1, 1994 | Issued |
| 08/252945 | LASER ALIGNMENT DEVICE AND METHOD USING GREEN LIGHT | Jun 1, 1994 | Abandoned |
| 08/250666 | APPARATUS FOR DETECTING RELATIVE MOVEMENT WHEREIN A DETECTING MEANS IS POSITIONED IN A REGION OF NATURAL INTERFERENCE ADJACENT TO A GRATING ELEMENT | May 26, 1994 | Abandoned |
Array
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[patent_kind] => NA
[patent_issue_date] => 2000-08-01
[patent_title] => 'Laser speckle strain and deformation sensor using linear array image cross-correlation method for specifically arranged triple-beam triple-camera configuration'
[patent_app_type] => 1
[patent_app_number] => 8/250489
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Array
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[patent_kind] => NA
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/231936 | Apparatus and method for nondestructive testing using additive-subtractive phase-modulated interferometry | Apr 24, 1994 | Issued |
Array
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[id] => 3483545
[patent_doc_number] => 05432602
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-07-11
[patent_title] => 'Light wavelength measuring apparatus with light modulation'
[patent_app_type] => 1
[patent_app_number] => 8/211717
[patent_app_country] => US
[patent_app_date] => 1994-04-25
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[firstpage_image] =>[orig_patent_app_number] => 211717
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/211717 | Light wavelength measuring apparatus with light modulation | Apr 24, 1994 | Issued |
| 08/232394 | FOURIER SPECTROMETER ARRANGEMENT AND METHOD OF OPERATING A FOURIER SPECTROMETER | Apr 24, 1994 | Abandoned |
Array
(
[id] => 3588595
[patent_doc_number] => 05499096
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-03-12
[patent_title] => 'Optical instrument and measurement for measuring displacement of scale using different order diffraction of a diffraction grating'
[patent_app_type] => 1
[patent_app_number] => 8/227128
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Array
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[id] => 3597892
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[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-12-17
[patent_title] => 'Ultrashort pulsewidth laser ranging system employing a time gate producing an autocorrelation and method therefore'
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[patent_app_number] => 8/221516
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/221516 | Ultrashort pulsewidth laser ranging system employing a time gate producing an autocorrelation and method therefore | Mar 31, 1994 | Issued |
| 08/221790 | DIFFERENTIAL RANGING MEASUREMENT SYSTEM AND METHOD UTILIZING ULTRASHORT PULSES | Mar 31, 1994 | Abandoned |
Array
(
[id] => 3111137
[patent_doc_number] => 05448355
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[patent_kind] => NA
[patent_issue_date] => 1995-09-05
[patent_title] => 'System for measuring tilt of image plane of optical system using diffracted light'
[patent_app_type] => 1
[patent_app_number] => 8/220682
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/220682 | System for measuring tilt of image plane of optical system using diffracted light | Mar 30, 1994 | Issued |
Array
(
[id] => 3599178
[patent_doc_number] => 05488475
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-01-30
[patent_title] => 'Active fiber cavity strain sensor with temperature independence'
[patent_app_type] => 1
[patent_app_number] => 8/220855
[patent_app_country] => US
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Array
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[patent_kind] => NA
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Array
(
[id] => 3502431
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[patent_kind] => NA
[patent_issue_date] => 1996-04-16
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[patent_app_type] => 1
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/218741 | Laser interferometer strain sensor with adjustable feedback amplification in the form of a saw-tooth pattern | Mar 27, 1994 | Issued |
| 08/215566 | ENCODING APPARATUS FOR MAKING MEASUREMENTS OF TWO-DIMENSIONAL DISPLACEMENT OF AN OBJECT | Mar 21, 1994 | Abandoned |
| 08/210968 | DIRECT RETICLE TO WAFER ALIGNMENT USING FLUORESCENCE FOR INTEGRATED CIRCUIT LITHOGRAPHY | Mar 20, 1994 | Abandoned |
Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/214805 | Interferometer with alignment assembly and with processor for linearizing fringes for determining the wavelength of laser light | Mar 15, 1994 | Issued |