
Laura Mary Menz
Examiner (ID: 7325, Phone: (571)272-1697 , Office: P/2813 )
| Most Active Art Unit | 2813 |
| Art Unit(s) | 2813 |
| Total Applications | 2324 |
| Issued Applications | 1995 |
| Pending Applications | 138 |
| Abandoned Applications | 216 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4949464
[patent_doc_number] => 20080305590
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-12-11
[patent_title] => 'HIGH PERFORMANCE CMOS DEVICES AND METHODS FOR MAKING SAME'
[patent_app_type] => utility
[patent_app_number] => 12/191868
[patent_app_country] => US
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Array
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[patent_doc_number] => 08440515
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[patent_title] => 'Method of forming a field effect transistor'
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Array
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[patent_title] => 'Enhanced on-chip decoupling capacitors and method of making same'
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Array
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[patent_doc_number] => 20080290473
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[patent_issue_date] => 2008-11-27
[patent_title] => 'METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE'
[patent_app_type] => utility
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Array
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Array
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[patent_title] => 'Controlled alignment of catalytically grown nanostructures in a large-scale synthesis process'
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Array
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[patent_title] => 'SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR'
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Array
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[patent_issue_date] => 2012-05-22
[patent_title] => 'Double-talk detector with accuracy and speed of detection improved and a method therefor'
[patent_app_type] => utility
[patent_app_number] => 12/219486
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/219486 | Double-talk detector with accuracy and speed of detection improved and a method therefor | Jul 22, 2008 | Issued |
Array
(
[id] => 8421714
[patent_doc_number] => 08278202
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Array
(
[id] => 5503345
[patent_doc_number] => 20090164033
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[patent_kind] => A1
[patent_issue_date] => 2009-06-25
[patent_title] => 'Sound effect sensing turntable for a digital music broadcaster'
[patent_app_type] => utility
[patent_app_number] => 12/219252
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Array
(
[id] => 4836884
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[patent_title] => 'Semiconductor device including a planarized surface and method thereof'
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Array
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/132014 | Test structure for monitoring process characteristics for forming embedded semiconductor alloys in drain/source regions | Jun 2, 2008 | Issued |