
Laura Mary Menz
Examiner (ID: 7325, Phone: (571)272-1697 , Office: P/2813 )
| Most Active Art Unit | 2813 |
| Art Unit(s) | 2813 |
| Total Applications | 2324 |
| Issued Applications | 1995 |
| Pending Applications | 138 |
| Abandoned Applications | 216 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5611670
[patent_doc_number] => 20060113594
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-06-01
[patent_title] => 'Soi wafer and production method therefor'
[patent_app_type] => utility
[patent_app_number] => 10/542376
[patent_app_country] => US
[patent_app_date] => 2004-01-22
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0113/20060113594.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/542376 | Soi wafer and a method for producing the same | Jan 21, 2004 | Issued |
Array
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[patent_kind] => A1
[patent_issue_date] => 2004-08-05
[patent_title] => 'Semiconductor integrated circuit device and a method of manufacturing the same'
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Array
(
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[patent_kind] => B2
[patent_issue_date] => 2005-10-04
[patent_title] => 'Low-voltage and interface damage-free polymer memory device'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/762955 | Low-voltage and interface damage-free polymer memory device | Jan 20, 2004 | Issued |
Array
(
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[patent_doc_number] => 07550370
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-06-23
[patent_title] => 'Method of forming thin SGOI wafers with high relaxation and low stacking fault defect density'
[patent_app_type] => utility
[patent_app_number] => 10/597066
[patent_app_country] => US
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Array
(
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[patent_title] => 'Method of manufacturing silicon optoelectronic device, silicon optoelectronic device manufactured by the method, and image input and/or output apparatus using the silicon optoelectronic device'
[patent_app_type] => utility
[patent_app_number] => 10/758136
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Array
(
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Array
(
[id] => 403882
[patent_doc_number] => 07288014
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2007-10-30
[patent_title] => 'Design, fabrication, testing, and conditioning of micro-components for use in a light-emitting panel'
[patent_app_type] => utility
[patent_app_number] => 10/756266
[patent_app_country] => US
[patent_app_date] => 2004-01-14
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Array
(
[id] => 7287230
[patent_doc_number] => 20040147065
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-07-29
[patent_title] => 'Semiconductor device and manufacturing method thereof'
[patent_app_type] => new
[patent_app_number] => 10/756455
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Array
(
[id] => 7309260
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[patent_issue_date] => 2004-07-22
[patent_title] => 'Methods of forming materials comprising tungsten and nitrogen, and methods of forming capacitors'
[patent_app_type] => new
[patent_app_number] => 10/755001
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/755001 | Methods of forming materials comprising tungsten and nitrogen, and methods of forming capacitors | Jan 8, 2004 | Abandoned |
Array
(
[id] => 7429523
[patent_doc_number] => 20040266113
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-12-30
[patent_title] => 'Post high voltage gate oxide pattern high-vacuum outgas surface treatment'
[patent_app_type] => new
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Array
(
[id] => 7677570
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[patent_title] => 'Semiconductor device manufacturing method'
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Array
(
[id] => 869542
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Array
(
[id] => 7318783
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Array
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[patent_title] => 'Body contact formation in partially depleted silicon on insulator device'
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Array
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Array
(
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/728215 | Novel method to deposit carbon doped SiO2 films with improved film quality | Dec 3, 2003 | Abandoned |
Array
(
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