
Layla G. Lauchman
Examiner (ID: 13898)
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2877, IPLA, PCTL |
| Total Applications | 1134 |
| Issued Applications | 942 |
| Pending Applications | 94 |
| Abandoned Applications | 103 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4868286
[patent_doc_number] => 20080147345
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-06-19
[patent_title] => 'Remote sensing digital angle gauge'
[patent_app_type] => utility
[patent_app_number] => 11/638531
[patent_app_country] => US
[patent_app_date] => 2006-12-14
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[pdf_file] => publications/A1/0147/20080147345.pdf
[firstpage_image] =>[orig_patent_app_number] => 11638531
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/638531 | Remote sensing digital angle gauge | Dec 13, 2006 | Issued |
Array
(
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[patent_doc_number] => 08055099
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-11-08
[patent_title] => 'Exposure method and exposure device'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/295925 | Exposure method and exposure device | Dec 7, 2006 | Issued |
Array
(
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[patent_title] => 'Deviation angle self compensating substantially achromatic retarder'
[patent_app_type] => utility
[patent_app_number] => 11/633138
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[patent_app_date] => 2006-12-04
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[firstpage_image] =>[orig_patent_app_number] => 11633138
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/633138 | Deviation angle self compensating substantially achromatic retarder | Dec 3, 2006 | Issued |
Array
(
[id] => 240380
[patent_doc_number] => 07593102
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-09-22
[patent_title] => 'Polarization evaluation mask, polarization evaluation method, and polarization determination device'
[patent_app_type] => utility
[patent_app_number] => 11/605331
[patent_app_country] => US
[patent_app_date] => 2006-11-29
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/605331 | Polarization evaluation mask, polarization evaluation method, and polarization determination device | Nov 28, 2006 | Issued |
Array
(
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[patent_issue_date] => 2010-11-16
[patent_title] => 'Optical analysis system and optical train'
[patent_app_type] => utility
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[firstpage_image] =>[orig_patent_app_number] => 12094467
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/094467 | Optical analysis system and optical train | Nov 26, 2006 | Issued |
Array
(
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[patent_doc_number] => 20090219512
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[patent_issue_date] => 2009-09-03
[patent_title] => 'OPTICAL ANALYSIS SYSTEM AND ELEMENTS TO ISOLATE SPECTRAL REGION'
[patent_app_type] => utility
[patent_app_number] => 12/094475
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[firstpage_image] =>[orig_patent_app_number] => 12094475
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/094475 | Optical analysis system and elements to isolate spectral region | Nov 26, 2006 | Issued |
Array
(
[id] => 5359139
[patent_doc_number] => 20090033933
[patent_country] => US
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[patent_issue_date] => 2009-02-05
[patent_title] => 'NOVEL MULTIVARIATE OPTICAL ELEMENTS FOR OPTICAL ANALYSIS SYSTEM'
[patent_app_type] => utility
[patent_app_number] => 12/094471
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[patent_app_date] => 2006-11-27
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0033/20090033933.pdf
[firstpage_image] =>[orig_patent_app_number] => 12094471
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/094471 | Multivariate optical elements for optical analysis system | Nov 26, 2006 | Issued |
Array
(
[id] => 300668
[patent_doc_number] => 07538873
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-05-26
[patent_title] => 'Method for simulating the movement of particles'
[patent_app_type] => utility
[patent_app_number] => 11/559333
[patent_app_country] => US
[patent_app_date] => 2006-11-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] => patents/07/538/07538873.pdf
[firstpage_image] =>[orig_patent_app_number] => 11559333
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/559333 | Method for simulating the movement of particles | Nov 12, 2006 | Issued |
Array
(
[id] => 293191
[patent_doc_number] => 07545488
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-06-09
[patent_title] => 'Apparatus for implementing a light-emitting diode meter'
[patent_app_type] => utility
[patent_app_number] => 11/558495
[patent_app_country] => US
[patent_app_date] => 2006-11-10
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/558495 | Apparatus for implementing a light-emitting diode meter | Nov 9, 2006 | Issued |
Array
(
[id] => 4822652
[patent_doc_number] => 20080123096
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-29
[patent_title] => 'Optical system for alignment assembly of field emission display panel'
[patent_app_type] => utility
[patent_app_number] => 11/594206
[patent_app_country] => US
[patent_app_date] => 2006-11-08
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[pdf_file] => publications/A1/0123/20080123096.pdf
[firstpage_image] =>[orig_patent_app_number] => 11594206
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/594206 | Optical system for alignment assembly of field emission display panel | Nov 7, 2006 | Abandoned |
Array
(
[id] => 134990
[patent_doc_number] => 07697134
[patent_country] => US
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[patent_issue_date] => 2010-04-13
[patent_title] => 'Correlation spectrometer'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/593386 | Correlation spectrometer | Nov 5, 2006 | Issued |
Array
(
[id] => 5223793
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Array
(
[id] => 275112
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Array
(
[id] => 5181621
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[patent_title] => 'Method for marking defect and device therefor'
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Array
(
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[patent_title] => 'PAPER SHEET RECOGNIZING METHOD AND APPARATUS'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/446853 | Paper sheet recognizing method and apparatus | Oct 23, 2006 | Issued |
Array
(
[id] => 323486
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[patent_title] => 'Temperature controlled lens'
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Array
(
[id] => 4914029
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[patent_title] => 'Optical gratings, lithography tools including such optical gratings and methods for using same for alignment'
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Array
(
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Array
(
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/541957 | Miniaturized system and method for measuring optical characteristics | Oct 1, 2006 | Issued |