Layla G. Lauchman

Array ( [id] => 240382 [patent_doc_number] => 07593104 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-09-22 [patent_title] => 'Method for manufacturing optical module, positioning apparatus, evaluation method and evaluation apparatus for evaluating optical module' [patent_app_type] => utility [patent_app_number] => 11/536768 [patent_app_country] => US [patent_app_date] => 2006-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 25 [patent_no_of_words] => 10246 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/593/07593104.pdf [firstpage_image] =>[orig_patent_app_number] => 11536768 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4937345 [patent_doc_number] => 20080074661 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-27 [patent_title] => 'Online analyte detection by surface enhanced Raman scattering (SERS)' [patent_app_type] => utility [patent_app_number] => 11/524489 [patent_app_country] => US [patent_app_date] => 2006-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 8023 [patent_no_of_claims] => 44 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0074/20080074661.pdf [firstpage_image] =>[orig_patent_app_number] => 11524489 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4993182 [patent_doc_number] => 20070008527 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-11 [patent_title] => 'Atomic absorption spectrometer' [patent_app_type] => utility [patent_app_number] => 11/522573 [patent_app_country] => US [patent_app_date] => 2006-09-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4712 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0008/20070008527.pdf [firstpage_image] =>[orig_patent_app_number] => 11522573 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 841840 [patent_doc_number] => 07391514 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-06-24 [patent_title] => 'Colorimeter' [patent_app_type] => utility [patent_app_number] => 11/521036 [patent_app_country] => US [patent_app_date] => 2006-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 10 [patent_no_of_words] => 2597 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/391/07391514.pdf [firstpage_image] =>[orig_patent_app_number] => 11521036 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 874444 [patent_doc_number] => 07362441 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-04-22 [patent_title] => 'Modulated reflectance measurement system using UV probe' [patent_app_type] => utility [patent_app_number] => 11/520512 [patent_app_country] => US [patent_app_date] => 2006-09-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3683 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/362/07362441.pdf [firstpage_image] =>[orig_patent_app_number] => 11520512 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4993180 [patent_doc_number] => 20070008525 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-11 [patent_title] => 'Method for Raman imaging of semiconductor materials' [patent_app_type] => utility [patent_app_number] => 11/520348 [patent_app_country] => US [patent_app_date] => 2006-09-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4072 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0008/20070008525.pdf [firstpage_image] =>[orig_patent_app_number] => 11520348 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5039026 [patent_doc_number] => 20070091308 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-26 [patent_title] => 'SYSTEM FOR REAL-TIME FLUORESCENT DETERMINATION OF TRACE ELEMENTS' [patent_app_type] => utility [patent_app_number] => 11/531469 [patent_app_country] => US [patent_app_date] => 2006-09-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3227 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0091/20070091308.pdf [firstpage_image] =>[orig_patent_app_number] => 11531469 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 278843 [patent_doc_number] => 07557923 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-07-07 [patent_title] => 'Method and system for in situ spectroscopic evaluation of an object' [patent_app_type] => utility [patent_app_number] => 11/519269 [patent_app_country] => US [patent_app_date] => 2006-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7222 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/557/07557923.pdf [firstpage_image] =>[orig_patent_app_number] => 11519269 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 253485 [patent_doc_number] => 07580122 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-08-25 [patent_title] => 'Image inspection method by polarized compensation for deformation of lens' [patent_app_type] => utility [patent_app_number] => 11/519477 [patent_app_country] => US [patent_app_date] => 2006-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 3651 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/580/07580122.pdf [firstpage_image] =>[orig_patent_app_number] => 11519477 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4821849 [patent_doc_number] => 20080122709 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-29 [patent_title] => 'Optical Method of Multi-Band Mixing' [patent_app_type] => utility [patent_app_number] => 11/530469 [patent_app_country] => US [patent_app_date] => 2006-09-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 2511 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0122/20080122709.pdf [firstpage_image] =>[orig_patent_app_number] => 11530469 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4801502 [patent_doc_number] => 20080013089 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-17 [patent_title] => 'Positioning method, processing system, measurement method of substrate loading repeatability, position measurement method, exposure method, substrate processing apparatus, measurement method, and measurement apparatus' [patent_app_type] => utility [patent_app_number] => 11/517512 [patent_app_country] => US [patent_app_date] => 2006-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 33 [patent_figures_cnt] => 33 [patent_no_of_words] => 45954 [patent_no_of_claims] => 52 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0013/20080013089.pdf [firstpage_image] =>[orig_patent_app_number] => 11517512 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4668179 [patent_doc_number] => 20080043239 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-21 [patent_title] => 'Method and apparatus for angular-resolved spectroscopic lithography characterization' [patent_app_type] => utility [patent_app_number] => 11/504106 [patent_app_country] => US [patent_app_date] => 2006-08-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5452 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0043/20080043239.pdf [firstpage_image] =>[orig_patent_app_number] => 11504106 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7599070 [patent_doc_number] => 07583379 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-09-01 [patent_title] => 'Surface enhanced raman spectroscopy (SERS) systems and methods of use thereof' [patent_app_type] => utility [patent_app_number] => 11/495980 [patent_app_country] => US [patent_app_date] => 2006-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 27 [patent_no_of_words] => 15117 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/583/07583379.pdf [firstpage_image] =>[orig_patent_app_number] => 11495980 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4655915 [patent_doc_number] => 20080024776 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-31 [patent_title] => 'Controllable surface enhanced Raman spectroscopy' [patent_app_type] => utility [patent_app_number] => 11/493477 [patent_app_country] => US [patent_app_date] => 2006-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4360 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20080024776.pdf [firstpage_image] =>[orig_patent_app_number] => 11493477 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5731213 [patent_doc_number] => 20060256327 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-16 [patent_title] => 'System for Detecting Anomalies and/or Features of a Surface' [patent_app_type] => utility [patent_app_number] => 11/459586 [patent_app_country] => US [patent_app_date] => 2006-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 8652 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0256/20060256327.pdf [firstpage_image] =>[orig_patent_app_number] => 11459586 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5731208 [patent_doc_number] => 20060256322 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-16 [patent_title] => 'Estimating overlay error and optical aberrations' [patent_app_type] => utility [patent_app_number] => 11/490890 [patent_app_country] => US [patent_app_date] => 2006-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 10037 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0256/20060256322.pdf [firstpage_image] =>[orig_patent_app_number] => 11490890 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 603270 [patent_doc_number] => 07433037 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-10-07 [patent_title] => 'System for measuring periodic structures' [patent_app_type] => utility [patent_app_number] => 11/458934 [patent_app_country] => US [patent_app_date] => 2006-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 15 [patent_no_of_words] => 6167 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/433/07433037.pdf [firstpage_image] =>[orig_patent_app_number] => 11458934 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 178803 [patent_doc_number] => 07656514 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-02-02 [patent_title] => 'Method and apparatus for evaluating semiconductor layers' [patent_app_type] => utility [patent_app_number] => 11/486271 [patent_app_country] => US [patent_app_date] => 2006-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 26 [patent_no_of_words] => 9540 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/656/07656514.pdf [firstpage_image] =>[orig_patent_app_number] => 11486271 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 364385 [patent_doc_number] => 07483135 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-01-27 [patent_title] => 'Confocal spectrometer with astigmatic aperturing' [patent_app_type] => utility [patent_app_number] => 11/486882 [patent_app_country] => US [patent_app_date] => 2006-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 2998 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/483/07483135.pdf [firstpage_image] =>[orig_patent_app_number] => 11486882 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4725203 [patent_doc_number] => 20080204744 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-28 [patent_title] => 'High Speed, Optically-Multiplexed, Hyperspectral Imagers and Methods Thereof' [patent_app_type] => utility [patent_app_number] => 11/995362 [patent_app_country] => US [patent_app_date] => 2006-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2353 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 12 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0204/20080204744.pdf [firstpage_image] =>[orig_patent_app_number] => 11995362 [rel_patent_id] =>[rel_patent_doc_number] =>)