Search

Lee E. Rodak

Examiner (ID: 582, Phone: (571)270-5628 , Office: P/2868 )

Most Active Art Unit
2868
Art Unit(s)
2868, 2858
Total Applications
400
Issued Applications
294
Pending Applications
1
Abandoned Applications
105

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18911342 [patent_doc_number] => 11874319 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-01-16 [patent_title] => Inspection apparatus and control method for inspection apparatus [patent_app_type] => utility [patent_app_number] => 17/376751 [patent_app_country] => US [patent_app_date] => 2021-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4215 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 218 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17376751 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/376751
Inspection apparatus and control method for inspection apparatus Jul 14, 2021 Issued
Array ( [id] => 18479313 [patent_doc_number] => 11693047 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-07-04 [patent_title] => Cryogenic wafer test system [patent_app_type] => utility [patent_app_number] => 17/366316 [patent_app_country] => US [patent_app_date] => 2021-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 4839 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17366316 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/366316
Cryogenic wafer test system Jul 1, 2021 Issued
Array ( [id] => 17736032 [patent_doc_number] => 20220221491 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-14 [patent_title] => PROBE CARD DEVICE [patent_app_type] => utility [patent_app_number] => 17/364841 [patent_app_country] => US [patent_app_date] => 2021-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1579 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -4 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17364841 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/364841
PROBE CARD DEVICE Jun 29, 2021 Abandoned
Array ( [id] => 17736031 [patent_doc_number] => 20220221490 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-14 [patent_title] => TEST PROBE MODULE [patent_app_type] => utility [patent_app_number] => 17/364828 [patent_app_country] => US [patent_app_date] => 2021-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2000 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -4 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17364828 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/364828
TEST PROBE MODULE Jun 29, 2021 Abandoned
Array ( [id] => 17750886 [patent_doc_number] => 20220229091 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-21 [patent_title] => PROBE TIP ASSEMBLY [patent_app_type] => utility [patent_app_number] => 17/360260 [patent_app_country] => US [patent_app_date] => 2021-06-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6281 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17360260 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/360260
Probe tip assembly for testing optical components Jun 27, 2021 Issued
Array ( [id] => 17260063 [patent_doc_number] => 20210373048 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-12-02 [patent_title] => PROBE HEAD WITH LINEAR PROBE [patent_app_type] => utility [patent_app_number] => 17/329465 [patent_app_country] => US [patent_app_date] => 2021-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8906 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 574 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17329465 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/329465
Probe head with linear probe May 24, 2021 Issued
Array ( [id] => 17083245 [patent_doc_number] => 20210278251 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-09-09 [patent_title] => System, Method And Object For High Accuracy Magnetic Position Sensing [patent_app_type] => utility [patent_app_number] => 17/328529 [patent_app_country] => US [patent_app_date] => 2021-05-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4682 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17328529 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/328529
System, method and object for high accuracy magnetic position sensing May 23, 2021 Issued
Array ( [id] => 17939714 [patent_doc_number] => 11474162 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-10-18 [patent_title] => Method and apparatus for electrical line testing [patent_app_type] => utility [patent_app_number] => 17/316859 [patent_app_country] => US [patent_app_date] => 2021-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 18819 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 386 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17316859 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/316859
Method and apparatus for electrical line testing May 10, 2021 Issued
Array ( [id] => 18780207 [patent_doc_number] => 11821918 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-11-21 [patent_title] => Buckling beam probe arrays and methods for making such arrays including forming probes with lateral positions matching guide plate hole positions [patent_app_type] => utility [patent_app_number] => 17/240962 [patent_app_country] => US [patent_app_date] => 2021-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 32 [patent_figures_cnt] => 117 [patent_no_of_words] => 15814 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 369 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17240962 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/240962
Buckling beam probe arrays and methods for making such arrays including forming probes with lateral positions matching guide plate hole positions Apr 25, 2021 Issued
Array ( [id] => 17143082 [patent_doc_number] => 20210311095 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-10-07 [patent_title] => PROBE CARD AND PROBE MODULE THEREOF [patent_app_type] => utility [patent_app_number] => 17/221368 [patent_app_country] => US [patent_app_date] => 2021-04-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5155 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17221368 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/221368
Probe card and probe module thereof Apr 1, 2021 Issued
Array ( [id] => 18855082 [patent_doc_number] => 11852656 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-12-26 [patent_title] => Probe head and probe card having same [patent_app_type] => utility [patent_app_number] => 17/214785 [patent_app_country] => US [patent_app_date] => 2021-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 27 [patent_no_of_words] => 11154 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17214785 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/214785
Probe head and probe card having same Mar 25, 2021 Issued
Array ( [id] => 17785603 [patent_doc_number] => 11408720 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-08-09 [patent_title] => Device and method for measuring thickness of dielectric layer in circuit board [patent_app_type] => utility [patent_app_number] => 17/209738 [patent_app_country] => US [patent_app_date] => 2021-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2974 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 194 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17209738 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/209738
Device and method for measuring thickness of dielectric layer in circuit board Mar 22, 2021 Issued
Array ( [id] => 19014207 [patent_doc_number] => 11921131 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-05 [patent_title] => Method for manufacturing a measurement probe, and measurement probe [patent_app_type] => utility [patent_app_number] => 17/205661 [patent_app_country] => US [patent_app_date] => 2021-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5191 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 155 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17205661 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/205661
Method for manufacturing a measurement probe, and measurement probe Mar 17, 2021 Issued
Array ( [id] => 17728876 [patent_doc_number] => 11385260 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-07-12 [patent_title] => Probe card holding device and inspection device [patent_app_type] => utility [patent_app_number] => 17/166147 [patent_app_country] => US [patent_app_date] => 2021-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 3895 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 200 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17166147 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/166147
Probe card holding device and inspection device Feb 2, 2021 Issued
Array ( [id] => 17010774 [patent_doc_number] => 20210241935 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-08-05 [patent_title] => CLAD WIRE AND METHOD FOR PRODUCING CLAD WIRES [patent_app_type] => utility [patent_app_number] => 17/248602 [patent_app_country] => US [patent_app_date] => 2021-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7597 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17248602 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/248602
Clad wire and method for producing clad wires Jan 28, 2021 Issued
17/139940 Compliant Pin Probes with Flat Extension Springs, Methods for Making, and Methods for Using Dec 30, 2020
Array ( [id] => 17127742 [patent_doc_number] => 20210302511 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-09-30 [patent_title] => MAGNETIC SENSOR AND ITS MANUFACTURING METHOD [patent_app_type] => utility [patent_app_number] => 17/131142 [patent_app_country] => US [patent_app_date] => 2020-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9257 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 199 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17131142 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/131142
Magnetic sensor and its manufacturing method Dec 21, 2020 Issued
Array ( [id] => 18470341 [patent_doc_number] => 20230204626 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-29 [patent_title] => Pin-Type Probes for Contacting Electronic Circuits and Methods for Making Such Probes [patent_app_type] => utility [patent_app_number] => 17/124417 [patent_app_country] => US [patent_app_date] => 2020-12-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14437 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17124417 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/124417
Pin-Type Probes for Contacting Electronic Circuits and Methods for Making Such Probes Dec 15, 2020 Abandoned
Array ( [id] => 16902321 [patent_doc_number] => 20210181237 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-06-17 [patent_title] => POSITIONABLE PROBE CARD AND MANUFACTURING METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 17/118564 [patent_app_country] => US [patent_app_date] => 2020-12-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5187 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17118564 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/118564
Positionable probe card and manufacturing method thereof Dec 9, 2020 Issued
Array ( [id] => 17658504 [patent_doc_number] => 20220178969 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-06-09 [patent_title] => PROBE DEVICE AND METHOD OF ASSEMBLING THE SAME [patent_app_type] => utility [patent_app_number] => 17/111036 [patent_app_country] => US [patent_app_date] => 2020-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4152 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17111036 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/111036
PROBE DEVICE AND METHOD OF ASSEMBLING THE SAME Dec 2, 2020 Abandoned
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