Leslie C. Pascal

Array ( [id] => 2738925 [patent_doc_number] => 05051690 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-09-24 [patent_title] => 'Apparatus and method for detecting vertically propagated defects in integrated circuits' [patent_app_type] => 1 [patent_app_number] => 7/357546 [patent_app_country] => US [patent_app_date] => 1989-05-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 24 [patent_no_of_words] => 8290 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 257 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/051/05051690.pdf [firstpage_image] =>[orig_patent_app_number] => 357546 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2698330 [patent_doc_number] => 05019772 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-05-28 [patent_title] => 'Test selection techniques' [patent_app_type] => 1 [patent_app_number] => 7/355589 [patent_app_country] => US [patent_app_date] => 1989-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 4175 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/019/05019772.pdf [firstpage_image] =>[orig_patent_app_number] => 355589 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2751937 [patent_doc_number] => 05015943 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-05-14 [patent_title] => 'High power, high sensitivity microwave calorimeter' [patent_app_type] => 1 [patent_app_number] => 7/354559 [patent_app_country] => US [patent_app_date] => 1989-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2914 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/015/05015943.pdf [firstpage_image] =>[orig_patent_app_number] => 354559 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2754053 [patent_doc_number] => 05030907 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-07-09 [patent_title] => 'CAD driven microprobe integrated circuit tester' [patent_app_type] => 1 [patent_app_number] => 7/354268 [patent_app_country] => US [patent_app_date] => 1989-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 11 [patent_no_of_words] => 7751 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 184 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/030/05030907.pdf [firstpage_image] =>[orig_patent_app_number] => 354268 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2638914 [patent_doc_number] => 04952872 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-08-28 [patent_title] => 'Apparatus for electrically testing printed circuit boards having contact pads in an extremely fine grid' [patent_app_type] => 1 [patent_app_number] => 7/354225 [patent_app_country] => US [patent_app_date] => 1989-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3272 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 173 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/952/04952872.pdf [firstpage_image] =>[orig_patent_app_number] => 354225 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2775552 [patent_doc_number] => 04985673 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-01-15 [patent_title] => 'Method and system for inspecting plural semiconductor devices' [patent_app_type] => 1 [patent_app_number] => 7/353764 [patent_app_country] => US [patent_app_date] => 1989-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 2444 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 360 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/985/04985673.pdf [firstpage_image] =>[orig_patent_app_number] => 353764 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2631738 [patent_doc_number] => 04967146 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-10-30 [patent_title] => 'Semiconductor chip production and testing processes' [patent_app_type] => 1 [patent_app_number] => 7/351638 [patent_app_country] => US [patent_app_date] => 1989-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 2795 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/967/04967146.pdf [firstpage_image] =>[orig_patent_app_number] => 351638 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2711477 [patent_doc_number] => 05068603 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-11-26 [patent_title] => 'Structure and method for producing mask-programmed integrated circuits which are pin compatible substitutes for memory-configured logic arrays' [patent_app_type] => 1 [patent_app_number] => 7/351888 [patent_app_country] => US [patent_app_date] => 1989-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 42 [patent_figures_cnt] => 50 [patent_no_of_words] => 22375 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/068/05068603.pdf [firstpage_image] =>[orig_patent_app_number] => 351888 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2939546 [patent_doc_number] => 05220280 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-06-15 [patent_title] => 'Method and an apparatus for testing the assembly of a plurality of electrical components on a substrate' [patent_app_type] => 1 [patent_app_number] => 7/350489 [patent_app_country] => US [patent_app_date] => 1989-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 7 [patent_no_of_words] => 2682 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 224 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/220/05220280.pdf [firstpage_image] =>[orig_patent_app_number] => 350489 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2692329 [patent_doc_number] => 05049812 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-09-17 [patent_title] => 'Device for the electric characterization of samples and application to electric mapping of large area semiconductor samples' [patent_app_type] => 1 [patent_app_number] => 7/490558 [patent_app_country] => US [patent_app_date] => 1989-05-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 2740 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/049/05049812.pdf [firstpage_image] =>[orig_patent_app_number] => 490558 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2593118 [patent_doc_number] => 04928059 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-05-22 [patent_title] => 'Sinusoidal current sense and scaling circuit' [patent_app_type] => 1 [patent_app_number] => 7/345939 [patent_app_country] => US [patent_app_date] => 1989-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 4 [patent_no_of_words] => 1637 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 189 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/928/04928059.pdf [firstpage_image] =>[orig_patent_app_number] => 345939 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2673962 [patent_doc_number] => 04999571 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-03-12 [patent_title] => 'Current and/or voltage detector for a distribution system' [patent_app_type] => 1 [patent_app_number] => 7/340934 [patent_app_country] => US [patent_app_date] => 1989-04-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3502 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 190 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/999/04999571.pdf [firstpage_image] =>[orig_patent_app_number] => 340934 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2603204 [patent_doc_number] => 04922196 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-05-01 [patent_title] => 'Beam-blanking apparatus for stroboscopic electron beam instruments' [patent_app_type] => 1 [patent_app_number] => 7/342629 [patent_app_country] => US [patent_app_date] => 1989-04-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 2954 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 367 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/922/04922196.pdf [firstpage_image] =>[orig_patent_app_number] => 342629 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2712210 [patent_doc_number] => 05014002 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-05-07 [patent_title] => 'ATE jumper programmable interface board' [patent_app_type] => 1 [patent_app_number] => 7/340109 [patent_app_country] => US [patent_app_date] => 1989-04-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 17 [patent_no_of_words] => 4224 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 349 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/014/05014002.pdf [firstpage_image] =>[orig_patent_app_number] => 340109 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2573709 [patent_doc_number] => 04901010 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-02-13 [patent_title] => 'Current-measuring device' [patent_app_type] => 1 [patent_app_number] => 7/338050 [patent_app_country] => US [patent_app_date] => 1989-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 8 [patent_no_of_words] => 2719 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/901/04901010.pdf [firstpage_image] =>[orig_patent_app_number] => 338050 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2771401 [patent_doc_number] => 05006792 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-04-09 [patent_title] => 'Flip-chip test socket adaptor and method' [patent_app_type] => 1 [patent_app_number] => 7/330839 [patent_app_country] => US [patent_app_date] => 1989-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 10 [patent_no_of_words] => 2727 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/006/05006792.pdf [firstpage_image] =>[orig_patent_app_number] => 330839 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2634118 [patent_doc_number] => 04916386 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-04-10 [patent_title] => 'Microwave wattage indicator' [patent_app_type] => 1 [patent_app_number] => 7/325918 [patent_app_country] => US [patent_app_date] => 1989-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2606 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 173 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/916/04916386.pdf [firstpage_image] =>[orig_patent_app_number] => 325918 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2721944 [patent_doc_number] => 05008611 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-04-16 [patent_title] => 'Method of eliminating the effects of birefringence from the detection of electric current using Faraday rotation' [patent_app_type] => 1 [patent_app_number] => 7/323599 [patent_app_country] => US [patent_app_date] => 1989-03-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 18 [patent_no_of_words] => 8284 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 304 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/008/05008611.pdf [firstpage_image] =>[orig_patent_app_number] => 323599 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2761132 [patent_doc_number] => 05043655 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-08-27 [patent_title] => 'Current sensing buffer for digital signal line testing' [patent_app_type] => 1 [patent_app_number] => 7/323938 [patent_app_country] => US [patent_app_date] => 1989-03-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 5534 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/043/05043655.pdf [firstpage_image] =>[orig_patent_app_number] => 323938 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2522696 [patent_doc_number] => 04870356 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-09-26 [patent_title] => 'Multi-component test fixture' [patent_app_type] => 1 [patent_app_number] => 7/320926 [patent_app_country] => US [patent_app_date] => 1989-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 14 [patent_no_of_words] => 3601 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/870/04870356.pdf [firstpage_image] =>[orig_patent_app_number] => 320926 [rel_patent_id] =>[rel_patent_doc_number] =>)