Search

Leslie C. Pascal

Examiner (ID: 1794, Phone: (571)272-3032 , Office: P/2636 )

Most Active Art Unit
2613
Art Unit(s)
2608, 2612, 2633, 2603, 2636, 2733, 2606, 2883, 2874, 2613, 2616, 2637, 2607
Total Applications
2247
Issued Applications
1891
Pending Applications
73
Abandoned Applications
293

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 2522499 [patent_doc_number] => 04870345 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-09-26 [patent_title] => 'Semiconductor intergrated circuit device' [patent_app_type] => 1 [patent_app_number] => 7/081095 [patent_app_country] => US [patent_app_date] => 1987-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 14 [patent_no_of_words] => 8216 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 217 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/870/04870345.pdf [firstpage_image] =>[orig_patent_app_number] => 081095 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/081095
Semiconductor intergrated circuit device Aug 2, 1987 Issued
Array ( [id] => 2642674 [patent_doc_number] => 04914385 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-04-03 [patent_title] => 'Current detector' [patent_app_type] => 1 [patent_app_number] => 7/077934 [patent_app_country] => US [patent_app_date] => 1987-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2377 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 20 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/914/04914385.pdf [firstpage_image] =>[orig_patent_app_number] => 077934 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/077934
Current detector Jul 26, 1987 Issued
Array ( [id] => 2494680 [patent_doc_number] => 04859938 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-08-22 [patent_title] => 'Novel technique to detect oxydonor generation in IC fabrication' [patent_app_type] => 1 [patent_app_number] => 7/078094 [patent_app_country] => US [patent_app_date] => 1987-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 15 [patent_no_of_words] => 3956 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/859/04859938.pdf [firstpage_image] =>[orig_patent_app_number] => 078094 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/078094
Novel technique to detect oxydonor generation in IC fabrication Jul 26, 1987 Issued
Array ( [id] => 2513037 [patent_doc_number] => 04795974 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-01-03 [patent_title] => 'Digital energy meter' [patent_app_type] => 1 [patent_app_number] => 7/077579 [patent_app_country] => US [patent_app_date] => 1987-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 2257 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 304 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/795/04795974.pdf [firstpage_image] =>[orig_patent_app_number] => 077579 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/077579
Digital energy meter Jul 23, 1987 Issued
Array ( [id] => 2567515 [patent_doc_number] => 04835469 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-05-30 [patent_title] => 'Integrated circuit clip for circuit analyzer' [patent_app_type] => 1 [patent_app_number] => 7/077648 [patent_app_country] => US [patent_app_date] => 1987-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2662 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 15 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/835/04835469.pdf [firstpage_image] =>[orig_patent_app_number] => 077648 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/077648
Integrated circuit clip for circuit analyzer Jul 23, 1987 Issued
Array ( [id] => 2393095 [patent_doc_number] => 04764720 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-08-16 [patent_title] => 'Apparatus and method for measuring variable frequency power' [patent_app_type] => 1 [patent_app_number] => 7/077009 [patent_app_country] => US [patent_app_date] => 1987-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2746 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 320 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/764/04764720.pdf [firstpage_image] =>[orig_patent_app_number] => 077009 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/077009
Apparatus and method for measuring variable frequency power Jul 21, 1987 Issued
Array ( [id] => 2516642 [patent_doc_number] => 04841241 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-06-20 [patent_title] => 'Testing device for both-sided contacting of component-equipped printed circuit boards' [patent_app_type] => 1 [patent_app_number] => 7/075994 [patent_app_country] => US [patent_app_date] => 1987-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2408 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/841/04841241.pdf [firstpage_image] =>[orig_patent_app_number] => 075994 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/075994
Testing device for both-sided contacting of component-equipped printed circuit boards Jul 20, 1987 Issued
Array ( [id] => 2497203 [patent_doc_number] => 04825155 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-04-25 [patent_title] => 'X-band logic test jig' [patent_app_type] => 1 [patent_app_number] => 7/075714 [patent_app_country] => US [patent_app_date] => 1987-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 3197 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/825/04825155.pdf [firstpage_image] =>[orig_patent_app_number] => 075714 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/075714
X-band logic test jig Jul 19, 1987 Issued
Array ( [id] => 2507799 [patent_doc_number] => 04799021 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-01-17 [patent_title] => 'Method and apparatus for testing EPROM type semiconductor devices during burn-in' [patent_app_type] => 1 [patent_app_number] => 7/073654 [patent_app_country] => US [patent_app_date] => 1987-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3474 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 396 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/799/04799021.pdf [firstpage_image] =>[orig_patent_app_number] => 073654 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/073654
Method and apparatus for testing EPROM type semiconductor devices during burn-in Jul 14, 1987 Issued
07/063658 METHOD AND APPARATUS OF TESTING PRINTED CIRCUIT BOARDS AND ASSEMBLY EMPLOYABLE THEREWITH Jun 17, 1987 Abandoned
Array ( [id] => 2624988 [patent_doc_number] => 04894610 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-01-16 [patent_title] => 'Current-transformer arrangement for an electrostatic meter' [patent_app_type] => 1 [patent_app_number] => 7/057918 [patent_app_country] => US [patent_app_date] => 1987-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 15 [patent_no_of_words] => 3593 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 222 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/894/04894610.pdf [firstpage_image] =>[orig_patent_app_number] => 057918 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/057918
Current-transformer arrangement for an electrostatic meter Jun 11, 1987 Issued
Array ( [id] => 2607494 [patent_doc_number] => 04912399 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-03-27 [patent_title] => 'Multiple lead probe for integrated circuits in wafer form' [patent_app_type] => 1 [patent_app_number] => 7/059903 [patent_app_country] => US [patent_app_date] => 1987-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 4 [patent_no_of_words] => 3944 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 305 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/912/04912399.pdf [firstpage_image] =>[orig_patent_app_number] => 059903 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/059903
Multiple lead probe for integrated circuits in wafer form Jun 8, 1987 Issued
Array ( [id] => 2591082 [patent_doc_number] => 04908570 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-03-13 [patent_title] => 'Method of measuring FET noise parameters' [patent_app_type] => 1 [patent_app_number] => 7/056848 [patent_app_country] => US [patent_app_date] => 1987-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 5249 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/908/04908570.pdf [firstpage_image] =>[orig_patent_app_number] => 056848 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/056848
Method of measuring FET noise parameters May 31, 1987 Issued
Array ( [id] => 2613605 [patent_doc_number] => 04902969 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-02-20 [patent_title] => 'Automated burn-in system' [patent_app_type] => 1 [patent_app_number] => 7/057255 [patent_app_country] => US [patent_app_date] => 1987-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 42 [patent_figures_cnt] => 54 [patent_no_of_words] => 16623 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/902/04902969.pdf [firstpage_image] =>[orig_patent_app_number] => 057255 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/057255
Automated burn-in system May 31, 1987 Issued
Array ( [id] => 2558343 [patent_doc_number] => 04803423 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-02-07 [patent_title] => 'Input circuit for a probe of a logic analyser and probe and logic analyser provided with such a circuit' [patent_app_type] => 1 [patent_app_number] => 7/055659 [patent_app_country] => US [patent_app_date] => 1987-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 3056 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/803/04803423.pdf [firstpage_image] =>[orig_patent_app_number] => 055659 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/055659
Input circuit for a probe of a logic analyser and probe and logic analyser provided with such a circuit May 27, 1987 Issued
Array ( [id] => 2447798 [patent_doc_number] => 04779041 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-10-18 [patent_title] => 'Integrated circuit transfer test device system' [patent_app_type] => 1 [patent_app_number] => 7/052528 [patent_app_country] => US [patent_app_date] => 1987-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2023 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/779/04779041.pdf [firstpage_image] =>[orig_patent_app_number] => 052528 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/052528
Integrated circuit transfer test device system May 19, 1987 Issued
Array ( [id] => 2522993 [patent_doc_number] => 04855672 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-08-08 [patent_title] => 'Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same' [patent_app_type] => 1 [patent_app_number] => 7/051888 [patent_app_country] => US [patent_app_date] => 1987-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 2885 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/855/04855672.pdf [firstpage_image] =>[orig_patent_app_number] => 051888 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/051888
Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same May 17, 1987 Issued
Array ( [id] => 2418236 [patent_doc_number] => 04786863 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-11-22 [patent_title] => 'Solid state watthour meter with switched-capacitor integration' [patent_app_type] => 1 [patent_app_number] => 7/050628 [patent_app_country] => US [patent_app_date] => 1987-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 4691 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 250 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/786/04786863.pdf [firstpage_image] =>[orig_patent_app_number] => 050628 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/050628
Solid state watthour meter with switched-capacitor integration May 14, 1987 Issued
Array ( [id] => 2507507 [patent_doc_number] => 04799005 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-01-17 [patent_title] => 'Electrical power line parameter measurement apparatus and systems, including compact, line-mounted modules' [patent_app_type] => 1 [patent_app_number] => 7/048579 [patent_app_country] => US [patent_app_date] => 1987-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 22 [patent_no_of_words] => 8586 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 185 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/799/04799005.pdf [firstpage_image] =>[orig_patent_app_number] => 048579 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/048579
Electrical power line parameter measurement apparatus and systems, including compact, line-mounted modules May 10, 1987 Issued
Array ( [id] => 2567774 [patent_doc_number] => 04857838 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-08-15 [patent_title] => 'Apparatus for testing electronic components, in particular IC\'s' [patent_app_type] => 1 [patent_app_number] => 7/045429 [patent_app_country] => US [patent_app_date] => 1987-05-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2096 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 244 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/857/04857838.pdf [firstpage_image] =>[orig_patent_app_number] => 045429 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/045429
Apparatus for testing electronic components, in particular IC's May 3, 1987 Issued
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