
Lien M. Ngo
Examiner (ID: 13892, Phone: (571)272-4545 , Office: P/3754 )
| Most Active Art Unit | 3754 |
| Art Unit(s) | 3727, 3731, 3754 |
| Total Applications | 2364 |
| Issued Applications | 1588 |
| Pending Applications | 131 |
| Abandoned Applications | 652 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 8018527
[patent_doc_number] => 08138771
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-03-20
[patent_title] => 'Touch controller with read-out line'
[patent_app_type] => utility
[patent_app_number] => 12/315856
[patent_app_country] => US
[patent_app_date] => 2008-12-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 11
[patent_no_of_words] => 21492
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[pdf_file] => patents/08/138/08138771.pdf
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Array
(
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[patent_doc_number] => 08054070
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[patent_kind] => B1
[patent_issue_date] => 2011-11-08
[patent_title] => 'Nanomagnet-based magnetic anomaly detector'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/328065 | Nanomagnet-based magnetic anomaly detector | Dec 3, 2008 | Issued |
Array
(
[id] => 8245418
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[patent_kind] => B2
[patent_issue_date] => 2012-06-19
[patent_title] => 'Storage battery and battery tester'
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[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/328022 | Storage battery and battery tester | Dec 3, 2008 | Issued |
Array
(
[id] => 4576735
[patent_doc_number] => 07859276
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[patent_kind] => B1
[patent_issue_date] => 2010-12-28
[patent_title] => 'Non-destructive validation of semiconductor devices'
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[patent_app_country] => US
[patent_app_date] => 2008-12-02
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/326224 | Non-destructive validation of semiconductor devices | Dec 1, 2008 | Issued |
Array
(
[id] => 4624980
[patent_doc_number] => 08004282
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[patent_issue_date] => 2011-08-23
[patent_title] => 'Method of measuring and imaging RXO (near wellbore resistivity) using transient EM'
[patent_app_type] => utility
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[pdf_file] => patents/08/004/08004282.pdf
[firstpage_image] =>[orig_patent_app_number] => 12325841
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/325841 | Method of measuring and imaging RXO (near wellbore resistivity) using transient EM | Nov 30, 2008 | Issued |
Array
(
[id] => 6554412
[patent_doc_number] => 20100127754
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[patent_issue_date] => 2010-05-27
[patent_title] => 'POWER MEASUREMENT CIRCUIT'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/277811 | POWER MEASUREMENT CIRCUIT | Nov 24, 2008 | Abandoned |
Array
(
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[patent_title] => 'VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TEST APPARATUS'
[patent_app_type] => utility
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Array
(
[id] => 33980
[patent_doc_number] => 07791364
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[patent_issue_date] => 2010-09-07
[patent_title] => 'Electronic device probe card with improved probe grouping'
[patent_app_type] => utility
[patent_app_number] => 12/269822
[patent_app_country] => US
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Array
(
[id] => 5262717
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[patent_title] => 'VOLTAGE DETECTING CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME'
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Array
(
[id] => 104183
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[patent_title] => 'Probe apparatus and probing method'
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Array
(
[id] => 5294276
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[patent_title] => 'Methods of Retaining Semiconductor Component Configurations within Sockets'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/208456 | Methods of retaining semiconductor component configurations within sockets | Sep 10, 2008 | Issued |
Array
(
[id] => 5294273
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/208183 | Systems and methods for testing packaged microelectronic devices | Sep 9, 2008 | Issued |
Array
(
[id] => 6568123
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Array
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Array
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Array
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[id] => 35013
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[patent_title] => 'Test stage for a carrier having printhead integrated circuitry thereon'
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Array
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Array
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Array
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