Search

Lien M. Ngo

Examiner (ID: 13892, Phone: (571)272-4545 , Office: P/3754 )

Most Active Art Unit
3754
Art Unit(s)
3727, 3731, 3754
Total Applications
2364
Issued Applications
1588
Pending Applications
131
Abandoned Applications
652

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 8018527 [patent_doc_number] => 08138771 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-03-20 [patent_title] => 'Touch controller with read-out line' [patent_app_type] => utility [patent_app_number] => 12/315856 [patent_app_country] => US [patent_app_date] => 2008-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 21492 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/138/08138771.pdf [firstpage_image] =>[orig_patent_app_number] => 12315856 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/315856
Touch controller with read-out line Dec 4, 2008 Issued
Array ( [id] => 7546096 [patent_doc_number] => 08054070 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-11-08 [patent_title] => 'Nanomagnet-based magnetic anomaly detector' [patent_app_type] => utility [patent_app_number] => 12/328065 [patent_app_country] => US [patent_app_date] => 2008-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4185 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/054/08054070.pdf [firstpage_image] =>[orig_patent_app_number] => 12328065 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/328065
Nanomagnet-based magnetic anomaly detector Dec 3, 2008 Issued
Array ( [id] => 8245418 [patent_doc_number] => 08203345 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-06-19 [patent_title] => 'Storage battery and battery tester' [patent_app_type] => utility [patent_app_number] => 12/328022 [patent_app_country] => US [patent_app_date] => 2008-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4664 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/203/08203345.pdf [firstpage_image] =>[orig_patent_app_number] => 12328022 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/328022
Storage battery and battery tester Dec 3, 2008 Issued
Array ( [id] => 4576735 [patent_doc_number] => 07859276 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-12-28 [patent_title] => 'Non-destructive validation of semiconductor devices' [patent_app_type] => utility [patent_app_number] => 12/326224 [patent_app_country] => US [patent_app_date] => 2008-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 14 [patent_no_of_words] => 2819 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/859/07859276.pdf [firstpage_image] =>[orig_patent_app_number] => 12326224 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/326224
Non-destructive validation of semiconductor devices Dec 1, 2008 Issued
Array ( [id] => 4624980 [patent_doc_number] => 08004282 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-08-23 [patent_title] => 'Method of measuring and imaging RXO (near wellbore resistivity) using transient EM' [patent_app_type] => utility [patent_app_number] => 12/325841 [patent_app_country] => US [patent_app_date] => 2008-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 3584 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/004/08004282.pdf [firstpage_image] =>[orig_patent_app_number] => 12325841 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/325841
Method of measuring and imaging RXO (near wellbore resistivity) using transient EM Nov 30, 2008 Issued
Array ( [id] => 6554412 [patent_doc_number] => 20100127754 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-05-27 [patent_title] => 'POWER MEASUREMENT CIRCUIT' [patent_app_type] => utility [patent_app_number] => 12/277811 [patent_app_country] => US [patent_app_date] => 2008-11-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3330 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0127/20100127754.pdf [firstpage_image] =>[orig_patent_app_number] => 12277811 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/277811
POWER MEASUREMENT CIRCUIT Nov 24, 2008 Abandoned
Array ( [id] => 5269027 [patent_doc_number] => 20090072802 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-03-19 [patent_title] => 'VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TEST APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/269634 [patent_app_country] => US [patent_app_date] => 2008-11-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6993 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0072/20090072802.pdf [firstpage_image] =>[orig_patent_app_number] => 12269634 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/269634
Voltage generating apparatus, current generating apparatus, and test apparatus Nov 11, 2008 Issued
Array ( [id] => 33980 [patent_doc_number] => 07791364 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-09-07 [patent_title] => 'Electronic device probe card with improved probe grouping' [patent_app_type] => utility [patent_app_number] => 12/269822 [patent_app_country] => US [patent_app_date] => 2008-11-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 16 [patent_no_of_words] => 6931 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 334 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/791/07791364.pdf [firstpage_image] =>[orig_patent_app_number] => 12269822 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/269822
Electronic device probe card with improved probe grouping Nov 11, 2008 Issued
Array ( [id] => 5262717 [patent_doc_number] => 20090115402 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-05-07 [patent_title] => 'VOLTAGE DETECTING CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/259923 [patent_app_country] => US [patent_app_date] => 2008-10-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 7239 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0115/20090115402.pdf [firstpage_image] =>[orig_patent_app_number] => 12259923 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/259923
Voltage detecting circuit and semiconductor device including the same Oct 27, 2008 Issued
Array ( [id] => 104183 [patent_doc_number] => 07724007 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-05-25 [patent_title] => 'Probe apparatus and probing method' [patent_app_type] => utility [patent_app_number] => 12/237920 [patent_app_country] => US [patent_app_date] => 2008-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 37 [patent_no_of_words] => 12056 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 277 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/724/07724007.pdf [firstpage_image] =>[orig_patent_app_number] => 12237920 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/237920
Probe apparatus and probing method Sep 24, 2008 Issued
Array ( [id] => 5294276 [patent_doc_number] => 20090009202 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-08 [patent_title] => 'Methods of Retaining Semiconductor Component Configurations within Sockets' [patent_app_type] => utility [patent_app_number] => 12/208456 [patent_app_country] => US [patent_app_date] => 2008-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 5666 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0009/20090009202.pdf [firstpage_image] =>[orig_patent_app_number] => 12208456 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/208456
Methods of retaining semiconductor component configurations within sockets Sep 10, 2008 Issued
Array ( [id] => 5294273 [patent_doc_number] => 20090009199 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-08 [patent_title] => 'SYSTEMS AND METHODS FOR TESTING PACKAGED MICROELECTRONIC DEVICES' [patent_app_type] => utility [patent_app_number] => 12/208183 [patent_app_country] => US [patent_app_date] => 2008-09-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4644 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0009/20090009199.pdf [firstpage_image] =>[orig_patent_app_number] => 12208183 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/208183
Systems and methods for testing packaged microelectronic devices Sep 9, 2008 Issued
Array ( [id] => 6568123 [patent_doc_number] => 20100060304 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-03-11 [patent_title] => 'PROBE WITH PRINTED TIP' [patent_app_type] => utility [patent_app_number] => 12/206620 [patent_app_country] => US [patent_app_date] => 2008-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 2994 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0060/20100060304.pdf [firstpage_image] =>[orig_patent_app_number] => 12206620 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/206620
Probe with printed tip Sep 7, 2008 Issued
Array ( [id] => 6596322 [patent_doc_number] => 20100001776 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-07 [patent_title] => 'DIFFERENTIAL SIGNAL TRANSMITTING APPARATUS AND A TEST APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/204814 [patent_app_country] => US [patent_app_date] => 2008-09-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 7916 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20100001776.pdf [firstpage_image] =>[orig_patent_app_number] => 12204814 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/204814
Differential signal transmitting apparatus and a test apparatus Sep 4, 2008 Issued
Array ( [id] => 4463174 [patent_doc_number] => 07880490 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-02-01 [patent_title] => 'Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same' [patent_app_type] => utility [patent_app_number] => 12/200716 [patent_app_country] => US [patent_app_date] => 2008-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 24 [patent_no_of_words] => 4881 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 188 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/880/07880490.pdf [firstpage_image] =>[orig_patent_app_number] => 12200716 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/200716
Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same Aug 27, 2008 Issued
Array ( [id] => 35013 [patent_doc_number] => 07786723 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-08-31 [patent_title] => 'Test stage for a carrier having printhead integrated circuitry thereon' [patent_app_type] => utility [patent_app_number] => 12/193722 [patent_app_country] => US [patent_app_date] => 2008-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 7056 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/786/07786723.pdf [firstpage_image] =>[orig_patent_app_number] => 12193722 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/193722
Test stage for a carrier having printhead integrated circuitry thereon Aug 18, 2008 Issued
Array ( [id] => 6551517 [patent_doc_number] => 20100045313 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-25 [patent_title] => 'METHOD FOR TESTING INTEGRATED CIRCUITS MOUNTED ON A CARRIER' [patent_app_type] => utility [patent_app_number] => 12/193721 [patent_app_country] => US [patent_app_date] => 2008-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 6869 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20100045313.pdf [firstpage_image] =>[orig_patent_app_number] => 12193721 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/193721
Method for testing integrated circuits mounted on a carrier Aug 18, 2008 Issued
Array ( [id] => 4446286 [patent_doc_number] => 07863890 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-01-04 [patent_title] => 'Apparatus for testing integrated circuitry' [patent_app_type] => utility [patent_app_number] => 12/193720 [patent_app_country] => US [patent_app_date] => 2008-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 7027 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/863/07863890.pdf [firstpage_image] =>[orig_patent_app_number] => 12193720 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/193720
Apparatus for testing integrated circuitry Aug 18, 2008 Issued
Array ( [id] => 6027790 [patent_doc_number] => 20110080188 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-04-07 [patent_title] => 'Universal test fixture for high-power packaged transistors and diodes' [patent_app_type] => utility [patent_app_number] => 12/221451 [patent_app_country] => US [patent_app_date] => 2008-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4714 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0080/20110080188.pdf [firstpage_image] =>[orig_patent_app_number] => 12221451 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/221451
Universal test fixture for high-power packaged transistors and diodes Jul 31, 2008 Issued
Array ( [id] => 5444605 [patent_doc_number] => 20090045831 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-19 [patent_title] => 'CONTACT WITH PLURAL BEAMS' [patent_app_type] => utility [patent_app_number] => 12/184617 [patent_app_country] => US [patent_app_date] => 2008-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5451 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20090045831.pdf [firstpage_image] =>[orig_patent_app_number] => 12184617 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/184617
Contact with plural beams Jul 31, 2008 Issued
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