
Lien M. Ngo
Examiner (ID: 13892, Phone: (571)272-4545 , Office: P/3754 )
| Most Active Art Unit | 3754 |
| Art Unit(s) | 3727, 3731, 3754 |
| Total Applications | 2364 |
| Issued Applications | 1588 |
| Pending Applications | 131 |
| Abandoned Applications | 652 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4737641
[patent_doc_number] => 20080231293
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[patent_issue_date] => 2008-09-25
[patent_title] => 'DEVICE AND METHOD FOR ELECTRICAL CONTACTING FOR TESTING SEMICONDUCTOR DEVICES'
[patent_app_type] => utility
[patent_app_number] => 12/051015
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Array
(
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[patent_doc_number] => 20080150567
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[patent_issue_date] => 2008-06-26
[patent_title] => 'INTEGRATED CIRCUIT PROBING APPARATUS HAVING A TEMPERATURE-ADJUSTING MECHANISM'
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Array
(
[id] => 8846997
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[patent_title] => 'Probe card for a semiconductor wafer'
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Array
(
[id] => 256874
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[patent_issue_date] => 2009-08-18
[patent_title] => 'Surface mount package fault detection apparatus'
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Array
(
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Array
(
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[patent_title] => 'Contact insert for a microcircuit test socket'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/024622 | Contact insert for a microcircuit test socket | Jan 31, 2008 | Issued |
Array
(
[id] => 4806225
[patent_doc_number] => 20080169803
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Array
(
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[patent_issue_date] => 2013-08-27
[patent_title] => 'Method for self-monitoring of breakdown in semiconductor components and semiconductor component constructed thereof'
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Array
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[id] => 5341012
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[patent_issue_date] => 2009-07-16
[patent_title] => 'System for Monitoring Individual Photovoltaic Modules'
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Array
(
[id] => 4673858
[patent_doc_number] => 20080211486
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[patent_kind] => A1
[patent_issue_date] => 2008-09-04
[patent_title] => 'AUTO-HANDLER COMPRISING PUSHERS EACH INCLUDING PELTIER DEVICE'
[patent_app_type] => utility
[patent_app_number] => 11/965324
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Array
(
[id] => 6551635
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/521470 | Test head positioning system and method | Dec 25, 2007 | Issued |
Array
(
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Array
(
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Array
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Array
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Array
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Array
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Array
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[patent_title] => 'Systems Configured for Utilizing Two or More Multiple Different Semiconductor Components Configurations, Methods of Providing Semicondutor Components within Sockets, and Methods of Retaining Semiconductor Component Configurations within Sockets'
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