
Lien M. Ngo
Examiner (ID: 13892, Phone: (571)272-4545 , Office: P/3754 )
| Most Active Art Unit | 3754 |
| Art Unit(s) | 3727, 3731, 3754 |
| Total Applications | 2364 |
| Issued Applications | 1588 |
| Pending Applications | 131 |
| Abandoned Applications | 652 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6575502
[patent_doc_number] => 20100321002
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-12-23
[patent_title] => 'INTEGRATED SENSOR WITH CAPACITIVE COUPLING REJECTION TO THE MECHANICAL GROUND'
[patent_app_type] => utility
[patent_app_number] => 12/521709
[patent_app_country] => US
[patent_app_date] => 2007-12-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] => publications/A1/0321/20100321002.pdf
[firstpage_image] =>[orig_patent_app_number] => 12521709
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/521709 | Integrated sensor with capacitive coupling rejection to the mechanical ground | Dec 2, 2007 | Issued |
Array
(
[id] => 4708715
[patent_doc_number] => 20080297241
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-12-04
[patent_title] => 'APPLICATION-SPECIFIC INTEGRATED CIRCUIT WITH AUTOMATIC TIME-CONSTANT MATCHING'
[patent_app_type] => utility
[patent_app_number] => 11/935421
[patent_app_country] => US
[patent_app_date] => 2007-11-06
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0297/20080297241.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/935421 | Application-specific integrated circuit with automatic time-constant matching | Nov 5, 2007 | Issued |
Array
(
[id] => 7713901
[patent_doc_number] => 08093919
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-01-10
[patent_title] => 'Test circuit, method, and semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 12/514364
[patent_app_country] => US
[patent_app_date] => 2007-11-06
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/514364 | Test circuit, method, and semiconductor device | Nov 5, 2007 | Issued |
Array
(
[id] => 4702292
[patent_doc_number] => 20080061814
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-03-13
[patent_title] => 'Electronic Component Test System'
[patent_app_type] => utility
[patent_app_number] => 11/935042
[patent_app_country] => US
[patent_app_date] => 2007-11-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[firstpage_image] =>[orig_patent_app_number] => 11935042
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/935042 | Electronic Component Test System | Nov 4, 2007 | Abandoned |
Array
(
[id] => 7764082
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[patent_title] => 'Circuit and method for parallel testing and semiconductor device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/514363 | Circuit and method for parallel testing and semiconductor device | Nov 1, 2007 | Issued |
Array
(
[id] => 4789917
[patent_doc_number] => 20080290890
[patent_country] => US
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[patent_issue_date] => 2008-11-27
[patent_title] => 'TESTING SYSTEM FOR TESTING ELECTRONIC ASSEMBLY'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/875127 | TESTING SYSTEM FOR TESTING ELECTRONIC ASSEMBLY | Oct 18, 2007 | Abandoned |
Array
(
[id] => 6378709
[patent_doc_number] => 20100301892
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-12-02
[patent_title] => 'Electrostatic discharge withstand voltage evaluating device and electrostatic discharge withstand voltage evaluating method'
[patent_app_type] => utility
[patent_app_number] => 12/311857
[patent_app_country] => US
[patent_app_date] => 2007-10-17
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/311857 | Electrostatic discharge withstand voltage evaluating device and electrostatic discharge withstand voltage evaluating method | Oct 16, 2007 | Issued |
Array
(
[id] => 5426288
[patent_doc_number] => 20090085598
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-04-02
[patent_title] => 'INTEGRATED CIRCUIT TEST SYSTEM AND METHOD WITH TEST DRIVER SHARING'
[patent_app_type] => utility
[patent_app_number] => 11/863920
[patent_app_country] => US
[patent_app_date] => 2007-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[pdf_file] => publications/A1/0085/20090085598.pdf
[firstpage_image] =>[orig_patent_app_number] => 11863920
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/863920 | INTEGRATED CIRCUIT TEST SYSTEM AND METHOD WITH TEST DRIVER SHARING | Sep 27, 2007 | Abandoned |
Array
(
[id] => 4897313
[patent_doc_number] => 20080116926
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-22
[patent_title] => 'SEMICONDUCTOR PROBE HAVING RESISTIVE TIP AND METHOD OF FABRICATING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 11/861417
[patent_app_country] => US
[patent_app_date] => 2007-09-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
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[pdf_file] => publications/A1/0116/20080116926.pdf
[firstpage_image] =>[orig_patent_app_number] => 11861417
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/861417 | Semiconductor probe having resistive tip and method of fabricating the same | Sep 25, 2007 | Issued |
Array
(
[id] => 4539578
[patent_doc_number] => 07888955
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-02-15
[patent_title] => 'Method and apparatus for testing devices using serially controlled resources'
[patent_app_type] => utility
[patent_app_number] => 11/861223
[patent_app_country] => US
[patent_app_date] => 2007-09-25
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Array
(
[id] => 4749720
[patent_doc_number] => 20080157791
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[patent_kind] => A1
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[patent_title] => 'STIFFENER ASSEMBLY FOR USE WITH TESTING DEVICES'
[patent_app_type] => utility
[patent_app_number] => 11/860406
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[patent_app_date] => 2007-09-24
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/860406 | Stiffener assembly for use with testing devices | Sep 23, 2007 | Issued |
Array
(
[id] => 114193
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[patent_kind] => B2
[patent_issue_date] => 2010-05-11
[patent_title] => 'Adaptor for electrical connector'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/858123 | Adaptor for electrical connector | Sep 19, 2007 | Issued |
Array
(
[id] => 4877473
[patent_doc_number] => 20080150856
[patent_country] => US
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[patent_title] => 'LIQUID CRYSTAL DISPLAY, CONNECTOR AND METHOD OF TESTING THE LIQUID CRYSTAL DISPLAY'
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Array
(
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Array
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Array
(
[id] => 6579214
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Array
(
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Array
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Array
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Array
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