
Lien M. Ngo
Examiner (ID: 13892, Phone: (571)272-4545 , Office: P/3754 )
| Most Active Art Unit | 3754 |
| Art Unit(s) | 3727, 3731, 3754 |
| Total Applications | 2364 |
| Issued Applications | 1588 |
| Pending Applications | 131 |
| Abandoned Applications | 652 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 334776
[patent_doc_number] => 07508188
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-03-24
[patent_title] => 'On-chip current sensing methods and systems'
[patent_app_type] => utility
[patent_app_number] => 11/707023
[patent_app_country] => US
[patent_app_date] => 2007-02-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 4834
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 93
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/508/07508188.pdf
[firstpage_image] =>[orig_patent_app_number] => 11707023
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/707023 | On-chip current sensing methods and systems | Feb 15, 2007 | Issued |
Array
(
[id] => 4811095
[patent_doc_number] => 20080191726
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-08-14
[patent_title] => 'Cantilever-type probe card for high frequency application'
[patent_app_type] => utility
[patent_app_number] => 11/705523
[patent_app_country] => US
[patent_app_date] => 2007-02-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[pdf_file] => publications/A1/0191/20080191726.pdf
[firstpage_image] =>[orig_patent_app_number] => 11705523
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/705523 | Cantilever-type probe card for high frequency application | Feb 12, 2007 | Issued |
Array
(
[id] => 4560098
[patent_doc_number] => 07821278
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-10-26
[patent_title] => 'Method and device for testing of non-componented circuit boards'
[patent_app_type] => utility
[patent_app_number] => 12/097819
[patent_app_country] => US
[patent_app_date] => 2007-01-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 5133
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/821/07821278.pdf
[firstpage_image] =>[orig_patent_app_number] => 12097819
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/097819 | Method and device for testing of non-componented circuit boards | Jan 25, 2007 | Issued |
Array
(
[id] => 240107
[patent_doc_number] => 07592827
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2009-09-22
[patent_title] => 'Apparatus and method for electrical detection and localization of shorts in metal interconnect lines'
[patent_app_type] => utility
[patent_app_number] => 11/622924
[patent_app_country] => US
[patent_app_date] => 2007-01-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 5572
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/592/07592827.pdf
[firstpage_image] =>[orig_patent_app_number] => 11622924
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/622924 | Apparatus and method for electrical detection and localization of shorts in metal interconnect lines | Jan 11, 2007 | Issued |
Array
(
[id] => 5197118
[patent_doc_number] => 20070296436
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-12-27
[patent_title] => 'ELECTRICAL TEST PROBES WITH A CONTACT ELEMENT, METHODS OF MAKING AND USING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 11/621717
[patent_app_country] => US
[patent_app_date] => 2007-01-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[pdf_file] => publications/A1/0296/20070296436.pdf
[firstpage_image] =>[orig_patent_app_number] => 11621717
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/621717 | Electrical test probes with a contact element, methods of making and using the same | Jan 9, 2007 | Issued |
Array
(
[id] => 4749719
[patent_doc_number] => 20080157790
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-07-03
[patent_title] => 'STIFFENER ASSEMBLY FOR USE WITH TESTING DEVICES'
[patent_app_type] => utility
[patent_app_number] => 11/617929
[patent_app_country] => US
[patent_app_date] => 2006-12-29
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0157/20080157790.pdf
[firstpage_image] =>[orig_patent_app_number] => 11617929
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/617929 | Stiffener assembly for use with testing devices | Dec 28, 2006 | Issued |
Array
(
[id] => 5024258
[patent_doc_number] => 20070150224
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-06-28
[patent_title] => 'Evaluation of an output signal of a device under test'
[patent_app_type] => utility
[patent_app_number] => 11/647118
[patent_app_country] => US
[patent_app_date] => 2006-12-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[pdf_file] => publications/A1/0150/20070150224.pdf
[firstpage_image] =>[orig_patent_app_number] => 11647118
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/647118 | Evaluation of an output signal of a device under test | Dec 27, 2006 | Issued |
Array
(
[id] => 4624972
[patent_doc_number] => 08004274
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-08-23
[patent_title] => 'Inductive position sensor'
[patent_app_type] => utility
[patent_app_number] => 12/097682
[patent_app_country] => US
[patent_app_date] => 2006-12-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[pdf_file] => patents/08/004/08004274.pdf
[firstpage_image] =>[orig_patent_app_number] => 12097682
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/097682 | Inductive position sensor | Dec 17, 2006 | Issued |
Array
(
[id] => 4864302
[patent_doc_number] => 20080143361
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-06-19
[patent_title] => 'Automated loader for removing and inserting removable devices to improve load time for automated test equipment'
[patent_app_type] => utility
[patent_app_number] => 11/639770
[patent_app_country] => US
[patent_app_date] => 2006-12-15
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[firstpage_image] =>[orig_patent_app_number] => 11639770
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/639770 | Automated loader for removing and inserting removable devices to improve load time for automated test equipment | Dec 14, 2006 | Issued |
Array
(
[id] => 4864301
[patent_doc_number] => 20080143360
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-06-19
[patent_title] => 'Method and apparatus for improving load time for automated test equipment'
[patent_app_type] => utility
[patent_app_number] => 11/639769
[patent_app_country] => US
[patent_app_date] => 2006-12-15
[patent_effective_date] => 0000-00-00
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Array
(
[id] => 7801730
[patent_doc_number] => 08130005
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-03-06
[patent_title] => 'Electrical guard structures for protecting a signal trace from electrical interference'
[patent_app_type] => utility
[patent_app_number] => 11/610925
[patent_app_country] => US
[patent_app_date] => 2006-12-14
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/08/130/08130005.pdf
[firstpage_image] =>[orig_patent_app_number] => 11610925
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/610925 | Electrical guard structures for protecting a signal trace from electrical interference | Dec 13, 2006 | Issued |
Array
(
[id] => 304098
[patent_doc_number] => 07535239
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2009-05-19
[patent_title] => 'Probe card configured for interchangeable heads'
[patent_app_type] => utility
[patent_app_number] => 11/639627
[patent_app_country] => US
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[pdf_file] => patents/07/535/07535239.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/639627 | Probe card configured for interchangeable heads | Dec 13, 2006 | Issued |
Array
(
[id] => 4731722
[patent_doc_number] => 20080048700
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-28
[patent_title] => 'INTEGRATED CIRCUIT PROBING APPARATUS HAVING A TEMPERATURE-ADJUSTING MECHANISM'
[patent_app_type] => utility
[patent_app_number] => 11/609558
[patent_app_country] => US
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[firstpage_image] =>[orig_patent_app_number] => 11609558
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/609558 | Integrated circuit probing apparatus having a temperature-adjusting mechanism | Dec 11, 2006 | Issued |
Array
(
[id] => 5026591
[patent_doc_number] => 20070268037
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-11-22
[patent_title] => 'CIRCUIT TESTING APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 11/608226
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[firstpage_image] =>[orig_patent_app_number] => 11608226
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/608226 | CIRCUIT TESTING APPARATUS | Dec 6, 2006 | Abandoned |
Array
(
[id] => 5157895
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[patent_title] => 'Apparatus for testing semiconductor test system and method thereof'
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Array
(
[id] => 590303
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Array
(
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Array
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/603227 | Harmonics measurement instrument with in-situ calibration | Nov 19, 2006 | Issued |
Array
(
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[firstpage_image] =>[orig_patent_app_number] => 11600149
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/600149 | Inspection device and inspection method | Nov 15, 2006 | Issued |