Search

Lien M. Ngo

Examiner (ID: 13892, Phone: (571)272-4545 , Office: P/3754 )

Most Active Art Unit
3754
Art Unit(s)
3727, 3731, 3754
Total Applications
2364
Issued Applications
1588
Pending Applications
131
Abandoned Applications
652

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5152438 [patent_doc_number] => 20070035320 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-15 [patent_title] => 'Semiconductor integrated circuit which can be burn-in-tested even when packaged and method of burn-in-testing semiconductor integrated circuit even when the semiconductor integrated circuit is packaged' [patent_app_type] => utility [patent_app_number] => 11/498928 [patent_app_country] => US [patent_app_date] => 2006-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3961 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0035/20070035320.pdf [firstpage_image] =>[orig_patent_app_number] => 11498928 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/498928
Semiconductor integrated circuit which can be burn-in-tested even when packaged and method of burn-in-testing semiconductor integrated circuit even when the semiconductor integrated circuit is packaged Aug 2, 2006 Issued
Array ( [id] => 5251013 [patent_doc_number] => 20070132469 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-06-14 [patent_title] => 'Inspection device and method' [patent_app_type] => utility [patent_app_number] => 11/498169 [patent_app_country] => US [patent_app_date] => 2006-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4403 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0132/20070132469.pdf [firstpage_image] =>[orig_patent_app_number] => 11498169 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/498169
Inspection device and method Aug 2, 2006 Abandoned
Array ( [id] => 436369 [patent_doc_number] => 07262627 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-08-28 [patent_title] => 'Measuring apparatus, measuring method, and test apparatus' [patent_app_type] => utility [patent_app_number] => 11/497506 [patent_app_country] => US [patent_app_date] => 2006-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 7819 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/262/07262627.pdf [firstpage_image] =>[orig_patent_app_number] => 11497506 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/497506
Measuring apparatus, measuring method, and test apparatus Jul 31, 2006 Issued
Array ( [id] => 5048290 [patent_doc_number] => 20070028834 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-08 [patent_title] => 'Wafer holder for wafer prober and wafer prober equipped with same' [patent_app_type] => utility [patent_app_number] => 11/496022 [patent_app_country] => US [patent_app_date] => 2006-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 11609 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0028/20070028834.pdf [firstpage_image] =>[orig_patent_app_number] => 11496022 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/496022
Wafer holder for wafer prober and wafer prober equipped with same Jul 30, 2006 Abandoned
Array ( [id] => 915677 [patent_doc_number] => 07327158 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-02-05 [patent_title] => 'Array testing method using electric bias stress for TFT array' [patent_app_type] => utility [patent_app_number] => 11/461381 [patent_app_country] => US [patent_app_date] => 2006-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 13 [patent_no_of_words] => 2741 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/327/07327158.pdf [firstpage_image] =>[orig_patent_app_number] => 11461381 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/461381
Array testing method using electric bias stress for TFT array Jul 30, 2006 Issued
Array ( [id] => 5444603 [patent_doc_number] => 20090045829 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-19 [patent_title] => 'Wafer holder for wafer prober and wafer prober equipped with same' [patent_app_type] => utility [patent_app_number] => 11/496019 [patent_app_country] => US [patent_app_date] => 2006-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 11985 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20090045829.pdf [firstpage_image] =>[orig_patent_app_number] => 11496019 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/496019
Wafer holder for wafer prober and wafer prober equipped with same Jul 30, 2006 Abandoned
Array ( [id] => 4655290 [patent_doc_number] => 20080024150 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-31 [patent_title] => 'SURFACE MOUNT PACKAGE FAULT DETECTION APPARATUS' [patent_app_type] => utility [patent_app_number] => 11/494502 [patent_app_country] => US [patent_app_date] => 2006-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3617 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20080024150.pdf [firstpage_image] =>[orig_patent_app_number] => 11494502 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/494502
Surface mount package fault detection apparatus Jul 27, 2006 Issued
Array ( [id] => 6568062 [patent_doc_number] => 20100060294 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-03-11 [patent_title] => 'Timing generator and semiconductor test apparatus' [patent_app_type] => utility [patent_app_number] => 11/989713 [patent_app_country] => US [patent_app_date] => 2006-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6720 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0060/20100060294.pdf [firstpage_image] =>[orig_patent_app_number] => 11989713 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/989713
Timing generator and semiconductor test apparatus Jul 27, 2006 Issued
Array ( [id] => 5202833 [patent_doc_number] => 20070024312 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-01 [patent_title] => 'Device and method for the testing of integrated semiconductor circuits on wafers' [patent_app_type] => utility [patent_app_number] => 11/493628 [patent_app_country] => US [patent_app_date] => 2006-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2710 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20070024312.pdf [firstpage_image] =>[orig_patent_app_number] => 11493628 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/493628
Device and method for the testing of integrated semiconductor circuits on wafers Jul 26, 2006 Abandoned
Array ( [id] => 6257252 [patent_doc_number] => 20100295571 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-25 [patent_title] => 'Device and Method for Configuring a Semiconductor Circuit' [patent_app_type] => utility [patent_app_number] => 11/990095 [patent_app_country] => US [patent_app_date] => 2006-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6073 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0295/20100295571.pdf [firstpage_image] =>[orig_patent_app_number] => 11990095 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/990095
Device and Method for Configuring a Semiconductor Circuit Jul 26, 2006 Abandoned
Array ( [id] => 5202821 [patent_doc_number] => 20070024300 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-01 [patent_title] => 'Method for manufacturing integrated circuit, measurement apparatus for integrated circuit, and wafer' [patent_app_type] => utility [patent_app_number] => 11/493424 [patent_app_country] => US [patent_app_date] => 2006-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2675 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20070024300.pdf [firstpage_image] =>[orig_patent_app_number] => 11493424 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/493424
Method for testing integrated circuit, and wafer Jul 25, 2006 Issued
Array ( [id] => 5600025 [patent_doc_number] => 20060290370 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-28 [patent_title] => 'TEMPERATURE CONTROL IN IC SOCKETS' [patent_app_type] => utility [patent_app_number] => 11/459288 [patent_app_country] => US [patent_app_date] => 2006-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2866 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20060290370.pdf [firstpage_image] =>[orig_patent_app_number] => 11459288 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/459288
TEMPERATURE CONTROL IN IC SOCKETS Jul 20, 2006 Abandoned
Array ( [id] => 5240184 [patent_doc_number] => 20070018675 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-25 [patent_title] => 'SEMICONDUCTOR WAFER EXAMINATION METHOD AND SEMICONDUCTOR CHIP MANUFACTURING METHOD' [patent_app_type] => utility [patent_app_number] => 11/458781 [patent_app_country] => US [patent_app_date] => 2006-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2689 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0018/20070018675.pdf [firstpage_image] =>[orig_patent_app_number] => 11458781 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/458781
SEMICONDUCTOR WAFER EXAMINATION METHOD AND SEMICONDUCTOR CHIP MANUFACTURING METHOD Jul 19, 2006 Abandoned
Array ( [id] => 821030 [patent_doc_number] => 07408365 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-08-05 [patent_title] => 'Image sensor testing method and apparatus' [patent_app_type] => utility [patent_app_number] => 11/486106 [patent_app_country] => US [patent_app_date] => 2006-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 6583 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/408/07408365.pdf [firstpage_image] =>[orig_patent_app_number] => 11486106 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/486106
Image sensor testing method and apparatus Jul 13, 2006 Issued
Array ( [id] => 394435 [patent_doc_number] => 07298136 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-11-20 [patent_title] => 'Magnetically coupled electrical test lead' [patent_app_type] => utility [patent_app_number] => 11/456048 [patent_app_country] => US [patent_app_date] => 2006-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 30 [patent_no_of_words] => 6441 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/298/07298136.pdf [firstpage_image] =>[orig_patent_app_number] => 11456048 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/456048
Magnetically coupled electrical test lead Jul 5, 2006 Issued
Array ( [id] => 292843 [patent_doc_number] => 07545138 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-06-09 [patent_title] => 'Precision, temperature-compensated, shielded current measurement device' [patent_app_type] => utility [patent_app_number] => 11/456007 [patent_app_country] => US [patent_app_date] => 2006-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 18 [patent_no_of_words] => 8531 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 45 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/545/07545138.pdf [firstpage_image] =>[orig_patent_app_number] => 11456007 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/456007
Precision, temperature-compensated, shielded current measurement device Jul 5, 2006 Issued
Array ( [id] => 6225836 [patent_doc_number] => 20100182037 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-07-22 [patent_title] => 'Diagnostic Method For Load-Testing Self-Excited Three-Phase Generators in a Motor Vehicle' [patent_app_type] => utility [patent_app_number] => 11/995395 [patent_app_country] => US [patent_app_date] => 2006-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2407 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0182/20100182037.pdf [firstpage_image] =>[orig_patent_app_number] => 11995395 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/995395
Diagnostic Method For Load-Testing Self-Excited Three-Phase Generators in a Motor Vehicle Jun 30, 2006 Abandoned
Array ( [id] => 5139496 [patent_doc_number] => 20070001712 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-04 [patent_title] => 'Hi-pot testing device with transfer table automatically connecting to testing signal generator' [patent_app_type] => utility [patent_app_number] => 11/478704 [patent_app_country] => US [patent_app_date] => 2006-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2225 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20070001712.pdf [firstpage_image] =>[orig_patent_app_number] => 11478704 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/478704
Hi-pot testing device with transfer table automatically connecting to testing signal generator Jun 29, 2006 Issued
Array ( [id] => 901186 [patent_doc_number] => 07339366 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-04 [patent_title] => 'Directional coupler for a accurate power detection' [patent_app_type] => utility [patent_app_number] => 11/475783 [patent_app_country] => US [patent_app_date] => 2006-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2008 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/339/07339366.pdf [firstpage_image] =>[orig_patent_app_number] => 11475783 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/475783
Directional coupler for a accurate power detection Jun 26, 2006 Issued
Array ( [id] => 5197082 [patent_doc_number] => 20070296400 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-27 [patent_title] => 'VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TEST APPARATUS' [patent_app_type] => utility [patent_app_number] => 11/475577 [patent_app_country] => US [patent_app_date] => 2006-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6989 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0296/20070296400.pdf [firstpage_image] =>[orig_patent_app_number] => 11475577 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/475577
Voltage generating apparatus, current generating apparatus, and test apparatus Jun 26, 2006 Issued
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