
Lien M. Ngo
Examiner (ID: 13892, Phone: (571)272-4545 , Office: P/3754 )
| Most Active Art Unit | 3754 |
| Art Unit(s) | 3727, 3731, 3754 |
| Total Applications | 2364 |
| Issued Applications | 1588 |
| Pending Applications | 131 |
| Abandoned Applications | 652 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5646422
[patent_doc_number] => 20060132154
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-06-22
[patent_title] => 'Wafer Burn-In and Test Employing Detachable Cartridge'
[patent_app_type] => utility
[patent_app_number] => 11/276314
[patent_app_country] => US
[patent_app_date] => 2006-02-23
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/276314 | Wafer burn-in and text employing detachable cartridge | Feb 22, 2006 | Issued |
Array
(
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[patent_doc_number] => 07436196
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[patent_kind] => B2
[patent_issue_date] => 2008-10-14
[patent_title] => 'Method and apparatus for measuring die-level integrated circuit power variations'
[patent_app_type] => utility
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[patent_app_date] => 2006-02-15
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[firstpage_image] =>[orig_patent_app_number] => 11354721
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/354721 | Method and apparatus for measuring die-level integrated circuit power variations | Feb 14, 2006 | Issued |
Array
(
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[patent_issue_date] => 2006-08-24
[patent_title] => 'Test kit semiconductor package and method of testing semiconductor package using the same'
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[patent_app_number] => 11/347569
[patent_app_country] => US
[patent_app_date] => 2006-02-06
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Array
(
[id] => 896561
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[patent_issue_date] => 2008-03-11
[patent_title] => 'Temperature compensation circuit and testing apparatus'
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[patent_app_country] => US
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[firstpage_image] =>[orig_patent_app_number] => 11343900
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/343900 | Temperature compensation circuit and testing apparatus | Jan 30, 2006 | Issued |
Array
(
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[patent_title] => 'Built-in self test for system in package'
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Array
(
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[patent_doc_number] => 20060148111
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[patent_issue_date] => 2006-07-06
[patent_title] => 'Method for automatic measurement of failure in subthreshold region of metal-oxide-semiconductor transistor'
[patent_app_type] => utility
[patent_app_number] => 11/320682
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Array
(
[id] => 5649195
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[patent_title] => 'Method for forming a metal contact in a semiconductor device having a barrier metal layer formed by homogeneous deposition'
[patent_app_type] => utility
[patent_app_number] => 11/316632
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/316632 | Method for forming a metal contact in a semiconductor device having a barrier metal layer formed by homogeneous deposition | Dec 19, 2005 | Abandoned |
Array
(
[id] => 123117
[patent_doc_number] => 07710136
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[patent_kind] => B2
[patent_issue_date] => 2010-05-04
[patent_title] => 'Intergrated circuit self-test architecture'
[patent_app_type] => utility
[patent_app_number] => 11/720317
[patent_app_country] => US
[patent_app_date] => 2005-11-23
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[firstpage_image] =>[orig_patent_app_number] => 11720317
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/720317 | Intergrated circuit self-test architecture | Nov 22, 2005 | Issued |
Array
(
[id] => 4904135
[patent_doc_number] => 20080113548
[patent_country] => US
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[patent_issue_date] => 2008-05-15
[patent_title] => 'Measuring Tip for High-Frequency Measurement'
[patent_app_type] => utility
[patent_app_number] => 11/721628
[patent_app_country] => US
[patent_app_date] => 2005-11-21
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/721628 | Measuring tip for high-frequency measurement | Nov 20, 2005 | Issued |
Array
(
[id] => 5214099
[patent_doc_number] => 20070103179
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-05-10
[patent_title] => 'SOCKET BASE ADAPTABLE TO A LOAD BOARD FOR TESTING IC'
[patent_app_type] => utility
[patent_app_number] => 11/164104
[patent_app_country] => US
[patent_app_date] => 2005-11-10
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/164104 | SOCKET BASE ADAPTABLE TO A LOAD BOARD FOR TESTING IC | Nov 9, 2005 | Abandoned |
Array
(
[id] => 5746065
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[patent_title] => 'Low power and proximity AC current sensor'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/268808 | Low power and proximity AC current sensor | Nov 6, 2005 | Abandoned |
Array
(
[id] => 5805032
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[patent_title] => 'Substrate testing apparatus with full contact configuration'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/250526 | Substrate testing apparatus with full contact configuration | Oct 16, 2005 | Abandoned |
Array
(
[id] => 5168136
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[patent_title] => 'Testing apparatus and method for solar cells'
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Array
(
[id] => 5008603
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[patent_title] => 'Method For Evaluating Semiconductor Wafer And Apparatus For Evaluating Semiconductor Wafer'
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Array
(
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Array
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[patent_title] => 'Apparatus for measuring electric characteristics of semiconductor'
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/180247 | Integrated circuit tester with high bandwidth probe assembly | Jul 11, 2005 | Abandoned |
Array
(
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Array
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Array
(
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[patent_title] => 'Imaging test socket, system, and method of testing an image sensor device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/140720 | Imaging test socket, system, and method of testing an image sensor device | May 30, 2005 | Abandoned |