Search

Lien M. Ngo

Examiner (ID: 13892, Phone: (571)272-4545 , Office: P/3754 )

Most Active Art Unit
3754
Art Unit(s)
3727, 3731, 3754
Total Applications
2364
Issued Applications
1588
Pending Applications
131
Abandoned Applications
652

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5646422 [patent_doc_number] => 20060132154 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-22 [patent_title] => 'Wafer Burn-In and Test Employing Detachable Cartridge' [patent_app_type] => utility [patent_app_number] => 11/276314 [patent_app_country] => US [patent_app_date] => 2006-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 13782 [patent_no_of_claims] => 62 [patent_no_of_ind_claims] => 48 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0132/20060132154.pdf [firstpage_image] =>[orig_patent_app_number] => 11276314 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/276314
Wafer burn-in and text employing detachable cartridge Feb 22, 2006 Issued
Array ( [id] => 594066 [patent_doc_number] => 07436196 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-10-14 [patent_title] => 'Method and apparatus for measuring die-level integrated circuit power variations' [patent_app_type] => utility [patent_app_number] => 11/354721 [patent_app_country] => US [patent_app_date] => 2006-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 2539 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 173 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/436/07436196.pdf [firstpage_image] =>[orig_patent_app_number] => 11354721 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/354721
Method and apparatus for measuring die-level integrated circuit power variations Feb 14, 2006 Issued
Array ( [id] => 5618114 [patent_doc_number] => 20060187647 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-24 [patent_title] => 'Test kit semiconductor package and method of testing semiconductor package using the same' [patent_app_type] => utility [patent_app_number] => 11/347569 [patent_app_country] => US [patent_app_date] => 2006-02-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 3633 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0187/20060187647.pdf [firstpage_image] =>[orig_patent_app_number] => 11347569 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/347569
Test kit semiconductor package and method of testing semiconductor package using the same Feb 5, 2006 Abandoned
Array ( [id] => 896561 [patent_doc_number] => 07342407 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-11 [patent_title] => 'Temperature compensation circuit and testing apparatus' [patent_app_type] => utility [patent_app_number] => 11/343900 [patent_app_country] => US [patent_app_date] => 2006-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4754 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 162 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/342/07342407.pdf [firstpage_image] =>[orig_patent_app_number] => 11343900 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/343900
Temperature compensation circuit and testing apparatus Jan 30, 2006 Issued
Array ( [id] => 837500 [patent_doc_number] => 07394272 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-07-01 [patent_title] => 'Built-in self test for system in package' [patent_app_type] => utility [patent_app_number] => 11/306773 [patent_app_country] => US [patent_app_date] => 2006-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1923 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/394/07394272.pdf [firstpage_image] =>[orig_patent_app_number] => 11306773 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/306773
Built-in self test for system in package Jan 10, 2006 Issued
Array ( [id] => 5631641 [patent_doc_number] => 20060148111 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-07-06 [patent_title] => 'Method for automatic measurement of failure in subthreshold region of metal-oxide-semiconductor transistor' [patent_app_type] => utility [patent_app_number] => 11/320682 [patent_app_country] => US [patent_app_date] => 2005-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1346 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0148/20060148111.pdf [firstpage_image] =>[orig_patent_app_number] => 11320682 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/320682
Method for automatic measurement of failure in subthreshold region of metal-oxide-semiconductor transistor Dec 29, 2005 Issued
Array ( [id] => 5649195 [patent_doc_number] => 20060134930 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-22 [patent_title] => 'Method for forming a metal contact in a semiconductor device having a barrier metal layer formed by homogeneous deposition' [patent_app_type] => utility [patent_app_number] => 11/316632 [patent_app_country] => US [patent_app_date] => 2005-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2243 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0134/20060134930.pdf [firstpage_image] =>[orig_patent_app_number] => 11316632 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/316632
Method for forming a metal contact in a semiconductor device having a barrier metal layer formed by homogeneous deposition Dec 19, 2005 Abandoned
Array ( [id] => 123117 [patent_doc_number] => 07710136 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-05-04 [patent_title] => 'Intergrated circuit self-test architecture' [patent_app_type] => utility [patent_app_number] => 11/720317 [patent_app_country] => US [patent_app_date] => 2005-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 1928 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/710/07710136.pdf [firstpage_image] =>[orig_patent_app_number] => 11720317 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/720317
Intergrated circuit self-test architecture Nov 22, 2005 Issued
Array ( [id] => 4904135 [patent_doc_number] => 20080113548 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-15 [patent_title] => 'Measuring Tip for High-Frequency Measurement' [patent_app_type] => utility [patent_app_number] => 11/721628 [patent_app_country] => US [patent_app_date] => 2005-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2101 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0113/20080113548.pdf [firstpage_image] =>[orig_patent_app_number] => 11721628 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/721628
Measuring tip for high-frequency measurement Nov 20, 2005 Issued
Array ( [id] => 5214099 [patent_doc_number] => 20070103179 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-05-10 [patent_title] => 'SOCKET BASE ADAPTABLE TO A LOAD BOARD FOR TESTING IC' [patent_app_type] => utility [patent_app_number] => 11/164104 [patent_app_country] => US [patent_app_date] => 2005-11-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 1969 [patent_no_of_claims] => 47 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0103/20070103179.pdf [firstpage_image] =>[orig_patent_app_number] => 11164104 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/164104
SOCKET BASE ADAPTABLE TO A LOAD BOARD FOR TESTING IC Nov 9, 2005 Abandoned
Array ( [id] => 5746065 [patent_doc_number] => 20060108995 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-25 [patent_title] => 'Low power and proximity AC current sensor' [patent_app_type] => utility [patent_app_number] => 11/268808 [patent_app_country] => US [patent_app_date] => 2005-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 3977 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0108/20060108995.pdf [firstpage_image] =>[orig_patent_app_number] => 11268808 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/268808
Low power and proximity AC current sensor Nov 6, 2005 Abandoned
Array ( [id] => 5805032 [patent_doc_number] => 20060091384 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-04 [patent_title] => 'Substrate testing apparatus with full contact configuration' [patent_app_type] => utility [patent_app_number] => 11/250526 [patent_app_country] => US [patent_app_date] => 2005-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2007 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0091/20060091384.pdf [firstpage_image] =>[orig_patent_app_number] => 11250526 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/250526
Substrate testing apparatus with full contact configuration Oct 16, 2005 Abandoned
Array ( [id] => 5168136 [patent_doc_number] => 20070068567 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-03-29 [patent_title] => 'Testing apparatus and method for solar cells' [patent_app_type] => utility [patent_app_number] => 11/234828 [patent_app_country] => US [patent_app_date] => 2005-09-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5708 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0068/20070068567.pdf [firstpage_image] =>[orig_patent_app_number] => 11234828 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/234828
Testing apparatus and method for solar cells Sep 22, 2005 Abandoned
Array ( [id] => 5008603 [patent_doc_number] => 20070279080 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-06 [patent_title] => 'Method For Evaluating Semiconductor Wafer And Apparatus For Evaluating Semiconductor Wafer' [patent_app_type] => utility [patent_app_number] => 11/661276 [patent_app_country] => US [patent_app_date] => 2005-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4301 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 11661276 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/661276
Method for evaluating semiconductor wafer and apparatus for evaluating semiconductor wafer Sep 11, 2005 Issued
Array ( [id] => 889567 [patent_doc_number] => 07348786 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-25 [patent_title] => 'Probe module for testing chips with electrical and optical input/output interconnects, methods of use, and methods of fabrication' [patent_app_type] => utility [patent_app_number] => 11/216645 [patent_app_country] => US [patent_app_date] => 2005-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 48 [patent_no_of_words] => 9327 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/348/07348786.pdf [firstpage_image] =>[orig_patent_app_number] => 11216645 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/216645
Probe module for testing chips with electrical and optical input/output interconnects, methods of use, and methods of fabrication Aug 30, 2005 Issued
Array ( [id] => 260541 [patent_doc_number] => 07573271 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-08-11 [patent_title] => 'Apparatus for measuring electric characteristics of semiconductor' [patent_app_type] => utility [patent_app_number] => 11/661219 [patent_app_country] => US [patent_app_date] => 2005-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 12 [patent_no_of_words] => 5899 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 185 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/573/07573271.pdf [firstpage_image] =>[orig_patent_app_number] => 11661219 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/661219
Apparatus for measuring electric characteristics of semiconductor Aug 24, 2005 Issued
Array ( [id] => 5997770 [patent_doc_number] => 20110115512 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-19 [patent_title] => 'Integrated circuit tester with high bandwidth probe assembly' [patent_app_type] => utility [patent_app_number] => 11/180247 [patent_app_country] => US [patent_app_date] => 2005-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6074 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0115/20110115512.pdf [firstpage_image] =>[orig_patent_app_number] => 11180247 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/180247
Integrated circuit tester with high bandwidth probe assembly Jul 11, 2005 Abandoned
Array ( [id] => 440445 [patent_doc_number] => 07259547 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-08-21 [patent_title] => 'System and method to use dynamic feedback of analog to digital converter sample rate to adaptively lock the sample rate to input frequency' [patent_app_type] => utility [patent_app_number] => 11/165726 [patent_app_country] => US [patent_app_date] => 2005-06-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5733 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/259/07259547.pdf [firstpage_image] =>[orig_patent_app_number] => 11165726 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/165726
System and method to use dynamic feedback of analog to digital converter sample rate to adaptively lock the sample rate to input frequency Jun 23, 2005 Issued
Array ( [id] => 5893688 [patent_doc_number] => 20060002226 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-01-05 [patent_title] => 'Semiconductor memory device' [patent_app_type] => utility [patent_app_number] => 11/159026 [patent_app_country] => US [patent_app_date] => 2005-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5955 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0002/20060002226.pdf [firstpage_image] =>[orig_patent_app_number] => 11159026 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/159026
Semiconductor memory device Jun 21, 2005 Issued
Array ( [id] => 5686316 [patent_doc_number] => 20060284631 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-21 [patent_title] => 'Imaging test socket, system, and method of testing an image sensor device' [patent_app_type] => utility [patent_app_number] => 11/140720 [patent_app_country] => US [patent_app_date] => 2005-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4701 [patent_no_of_claims] => 51 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0284/20060284631.pdf [firstpage_image] =>[orig_patent_app_number] => 11140720 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/140720
Imaging test socket, system, and method of testing an image sensor device May 30, 2005 Abandoned
Menu