
Lien M. Ngo
Examiner (ID: 13892, Phone: (571)272-4545 , Office: P/3754 )
| Most Active Art Unit | 3754 |
| Art Unit(s) | 3727, 3731, 3754 |
| Total Applications | 2364 |
| Issued Applications | 1588 |
| Pending Applications | 131 |
| Abandoned Applications | 652 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 901251
[patent_doc_number] => 07339391
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-03-04
[patent_title] => 'Defect detection method'
[patent_app_type] => utility
[patent_app_number] => 10/908828
[patent_app_country] => US
[patent_app_date] => 2005-05-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 2786
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 84
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/339/07339391.pdf
[firstpage_image] =>[orig_patent_app_number] => 10908828
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/908828 | Defect detection method | May 26, 2005 | Issued |
Array
(
[id] => 821034
[patent_doc_number] => 07408369
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-08-05
[patent_title] => 'System and method for determining thermal shutdown characteristics'
[patent_app_type] => utility
[patent_app_number] => 11/122624
[patent_app_country] => US
[patent_app_date] => 2005-05-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 7135
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 135
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/408/07408369.pdf
[firstpage_image] =>[orig_patent_app_number] => 11122624
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/122624 | System and method for determining thermal shutdown characteristics | May 4, 2005 | Issued |
Array
(
[id] => 4655291
[patent_doc_number] => 20080024151
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-31
[patent_title] => 'Socket For Connecting Ball-Grid-Array Integrated Circuit Device To Test Circuit'
[patent_app_type] => utility
[patent_app_number] => 11/569418
[patent_app_country] => US
[patent_app_date] => 2005-04-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 4042
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0024/20080024151.pdf
[firstpage_image] =>[orig_patent_app_number] => 11569418
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/569418 | Socket for connecting ball-grid-array integrated circuit device to test circuit | Apr 12, 2005 | Issued |
Array
(
[id] => 837506
[patent_doc_number] => 07394275
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2008-07-01
[patent_title] => 'Systems and methods for generating and evaluating high frequency, low voltage swing signals at in-circuit testing'
[patent_app_type] => utility
[patent_app_number] => 11/092423
[patent_app_country] => US
[patent_app_date] => 2005-03-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3714
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 75
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/394/07394275.pdf
[firstpage_image] =>[orig_patent_app_number] => 11092423
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/092423 | Systems and methods for generating and evaluating high frequency, low voltage swing signals at in-circuit testing | Mar 28, 2005 | Issued |
Array
(
[id] => 458092
[patent_doc_number] => 07245119
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-07-17
[patent_title] => 'fixture for manual functional testing of wireless devices'
[patent_app_type] => utility
[patent_app_number] => 11/072224
[patent_app_country] => US
[patent_app_date] => 2005-03-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 5153
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 166
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/245/07245119.pdf
[firstpage_image] =>[orig_patent_app_number] => 11072224
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/072224 | fixture for manual functional testing of wireless devices | Mar 6, 2005 | Issued |
Array
(
[id] => 185935
[patent_doc_number] => 07649369
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-01-19
[patent_title] => 'Probe and method of manufacturing probe'
[patent_app_type] => utility
[patent_app_number] => 10/591645
[patent_app_country] => US
[patent_app_date] => 2005-03-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 8
[patent_no_of_words] => 3445
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 193
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/649/07649369.pdf
[firstpage_image] =>[orig_patent_app_number] => 10591645
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/591645 | Probe and method of manufacturing probe | Mar 2, 2005 | Issued |
Array
(
[id] => 5703069
[patent_doc_number] => 20060192116
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-08-31
[patent_title] => 'Charged particle beam device probe operation'
[patent_app_type] => utility
[patent_app_number] => 11/064127
[patent_app_country] => US
[patent_app_date] => 2005-02-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 21422
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0192/20060192116.pdf
[firstpage_image] =>[orig_patent_app_number] => 11064127
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/064127 | Charged particle beam device probe operation | Feb 22, 2005 | Issued |
Array
(
[id] => 5228566
[patent_doc_number] => 20070290673
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-12-20
[patent_title] => 'Portable Electric Testing Equipment'
[patent_app_type] => utility
[patent_app_number] => 10/581021
[patent_app_country] => US
[patent_app_date] => 2004-11-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 2281
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0290/20070290673.pdf
[firstpage_image] =>[orig_patent_app_number] => 10581021
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/581021 | Portable Electric Testing Equipment | Nov 25, 2004 | Abandoned |
Array
(
[id] => 5217896
[patent_doc_number] => 20070159207
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-07-12
[patent_title] => 'Device and method for analyzing a sample plate'
[patent_app_type] => utility
[patent_app_number] => 10/582122
[patent_app_country] => US
[patent_app_date] => 2004-11-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 8648
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0159/20070159207.pdf
[firstpage_image] =>[orig_patent_app_number] => 10582122
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/582122 | Device and method for analyzing a sample plate | Nov 17, 2004 | Issued |
Array
(
[id] => 5139485
[patent_doc_number] => 20070001701
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-01-04
[patent_title] => 'Circuit board inspection device'
[patent_app_type] => utility
[patent_app_number] => 10/573473
[patent_app_country] => US
[patent_app_date] => 2004-09-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 21343
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0001/20070001701.pdf
[firstpage_image] =>[orig_patent_app_number] => 10573473
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/573473 | Circuit board inspection device | Sep 26, 2004 | Abandoned |
Array
(
[id] => 5156086
[patent_doc_number] => 20070038969
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-02-15
[patent_title] => 'Electronic ultimate defects analyzer detecting all defects in pcb/mcm'
[patent_app_type] => utility
[patent_app_number] => 10/595166
[patent_app_country] => US
[patent_app_date] => 2004-09-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 2976
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0038/20070038969.pdf
[firstpage_image] =>[orig_patent_app_number] => 10595166
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/595166 | Electronic ultimate defects analyzer detecting all defects in pcb/mcm | Sep 13, 2004 | Abandoned |
Array
(
[id] => 7597151
[patent_doc_number] => 07619427
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-11-17
[patent_title] => 'Temperature control device and temperature control method'
[patent_app_type] => utility
[patent_app_number] => 10/568623
[patent_app_country] => US
[patent_app_date] => 2004-08-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 10420
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 151
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/619/07619427.pdf
[firstpage_image] =>[orig_patent_app_number] => 10568623
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/568623 | Temperature control device and temperature control method | Aug 17, 2004 | Issued |
| 09/601013 | Device for testing the electromagnetic compatibility of systems having large dimensions | Jul 25, 2000 | Abandoned |