Lien M. Ngo

Array ( [id] => 8871323 [patent_doc_number] => 08466702 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-06-18 [patent_title] => 'Test system and substrate unit for testing' [patent_app_type] => utility [patent_app_number] => 12/953352 [patent_app_country] => US [patent_app_date] => 2010-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 5319 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12953352 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6004702 [patent_doc_number] => 20110057662 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-10 [patent_title] => 'Arc Detector And Associated Method For Detecting Undesired Arcs' [patent_app_type] => utility [patent_app_number] => 12/909674 [patent_app_country] => US [patent_app_date] => 2010-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3321 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0057/20110057662.pdf [firstpage_image] =>[orig_patent_app_number] => 12909674 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8933378 [patent_doc_number] => 08493083 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-07-23 [patent_title] => 'Test apparatus, test method and computer readable medium' [patent_app_type] => utility [patent_app_number] => 12/869545 [patent_app_country] => US [patent_app_date] => 2010-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 12591 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12869545 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4622312 [patent_doc_number] => RE042637 [patent_country] => US [patent_kind] => E1 [patent_issue_date] => 2011-08-23 [patent_title] => 'Probe card' [patent_app_type] => reissue [patent_app_number] => 12/806046 [patent_app_country] => US [patent_app_date] => 2010-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 8135 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 248 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/RE/042/RE042637.pdf [firstpage_image] =>[orig_patent_app_number] => 12806046 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6193606 [patent_doc_number] => 20110025360 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-03 [patent_title] => 'SEMICONDUCTOR INTEGRATED CIRCUIT TEST DEVICE' [patent_app_type] => utility [patent_app_number] => 12/838967 [patent_app_country] => US [patent_app_date] => 2010-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6923 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0025/20110025360.pdf [firstpage_image] =>[orig_patent_app_number] => 12838967 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9324285 [patent_doc_number] => 08659312 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-02-25 [patent_title] => 'Probe card and semiconductor wafer inspection method using the same' [patent_app_type] => utility [patent_app_number] => 12/838849 [patent_app_country] => US [patent_app_date] => 2010-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 22 [patent_no_of_words] => 11841 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 225 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12838849 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6146212 [patent_doc_number] => 20110018580 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-27 [patent_title] => 'POWER SUPPLY APPARATUS, POWER SUPPLY UNIT DIAGNOSTIC APPARATUS, AND METHOD FOR CONTROLLING POWER SUPPLY APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/837611 [patent_app_country] => US [patent_app_date] => 2010-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7261 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0018/20110018580.pdf [firstpage_image] =>[orig_patent_app_number] => 12837611 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9060684 [patent_doc_number] => 08547123 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-10-01 [patent_title] => 'Storage device testing system with a conductive heating assembly' [patent_app_type] => utility [patent_app_number] => 12/836915 [patent_app_country] => US [patent_app_date] => 2010-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 59 [patent_figures_cnt] => 59 [patent_no_of_words] => 11811 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12836915 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8785331 [patent_doc_number] => 08432178 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-04-30 [patent_title] => 'Testing device and method thereof' [patent_app_type] => utility [patent_app_number] => 12/826911 [patent_app_country] => US [patent_app_date] => 2010-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1439 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 189 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12826911 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7667254 [patent_doc_number] => 20110316523 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-12-29 [patent_title] => 'AVOMETER' [patent_app_type] => utility [patent_app_number] => 12/825994 [patent_app_country] => US [patent_app_date] => 2010-06-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1083 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12825994 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8534109 [patent_doc_number] => 08310267 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-11-13 [patent_title] => 'Semiconductor integrated circuit, and method for testing semiconductor integrated circuit' [patent_app_type] => utility [patent_app_number] => 12/823674 [patent_app_country] => US [patent_app_date] => 2010-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 4166 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12823674 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8739028 [patent_doc_number] => 08410803 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-04-02 [patent_title] => 'Test apparatus of semiconductor device and method thereof' [patent_app_type] => utility [patent_app_number] => 12/820623 [patent_app_country] => US [patent_app_date] => 2010-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 14 [patent_no_of_words] => 4252 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12820623 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6099719 [patent_doc_number] => 20110163774 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-07-07 [patent_title] => 'PROBE CARD' [patent_app_type] => utility [patent_app_number] => 12/819460 [patent_app_country] => US [patent_app_date] => 2010-06-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6985 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0163/20110163774.pdf [firstpage_image] =>[orig_patent_app_number] => 12819460 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8578528 [patent_doc_number] => 08344744 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-01-01 [patent_title] => 'Probe station for on-wafer-measurement under EMI-shielding' [patent_app_type] => utility [patent_app_number] => 12/818442 [patent_app_country] => US [patent_app_date] => 2010-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3733 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12818442 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6146208 [patent_doc_number] => 20110018576 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-27 [patent_title] => 'METHOD AND DEVICE FOR TESTING SEMICONDUCTOR' [patent_app_type] => utility [patent_app_number] => 12/818857 [patent_app_country] => US [patent_app_date] => 2010-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3545 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0018/20110018576.pdf [firstpage_image] =>[orig_patent_app_number] => 12818857 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6538981 [patent_doc_number] => 20100271060 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-10-28 [patent_title] => 'MEMBRANE PROBING METHOD USING IMPROVED CONTACT' [patent_app_type] => utility [patent_app_number] => 12/818521 [patent_app_country] => US [patent_app_date] => 2010-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 9642 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0271/20100271060.pdf [firstpage_image] =>[orig_patent_app_number] => 12818521 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8544215 [patent_doc_number] => 08319510 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-11-27 [patent_title] => 'Pre-alignment method of semiconductor wafer and computer-readable recording medium having pre-alignment program recorded thereon' [patent_app_type] => utility [patent_app_number] => 12/817876 [patent_app_country] => US [patent_app_date] => 2010-06-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 4390 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 270 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12817876 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6178634 [patent_doc_number] => 20110121852 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-26 [patent_title] => 'PROBE CARD AND TEST APPARATUS INCLUDING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/817826 [patent_app_country] => US [patent_app_date] => 2010-06-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 12295 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0121/20110121852.pdf [firstpage_image] =>[orig_patent_app_number] => 12817826 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6378694 [patent_doc_number] => 20100301889 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-12-02 [patent_title] => 'CIRCUIT BOARD UNIT AND TESTING APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/784333 [patent_app_country] => US [patent_app_date] => 2010-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 11500 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0301/20100301889.pdf [firstpage_image] =>[orig_patent_app_number] => 12784333 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8956740 [patent_doc_number] => 08502522 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-08-06 [patent_title] => 'Multi-level triggering circuit' [patent_app_type] => utility [patent_app_number] => 12/769075 [patent_app_country] => US [patent_app_date] => 2010-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4250 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12769075 [rel_patent_id] =>[rel_patent_doc_number] =>)