Search

Lien M. Ngo

Examiner (ID: 13892, Phone: (571)272-4545 , Office: P/3754 )

Most Active Art Unit
3754
Art Unit(s)
3727, 3731, 3754
Total Applications
2364
Issued Applications
1588
Pending Applications
131
Abandoned Applications
652

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6553976 [patent_doc_number] => 20100127721 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-05-27 [patent_title] => 'TEST PROBE STRUCTURE' [patent_app_type] => utility [patent_app_number] => 12/433217 [patent_app_country] => US [patent_app_date] => 2009-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3664 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0127/20100127721.pdf [firstpage_image] =>[orig_patent_app_number] => 12433217 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/433217
Test probe structure Apr 29, 2009 Issued
Array ( [id] => 5456431 [patent_doc_number] => 20090256583 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-10-15 [patent_title] => 'Vertical Microprobes for Contacting Electronic Components and Method for Making Such Probes' [patent_app_type] => utility [patent_app_number] => 12/429110 [patent_app_country] => US [patent_app_date] => 2009-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 25 [patent_no_of_words] => 13204 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0256/20090256583.pdf [firstpage_image] =>[orig_patent_app_number] => 12429110 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/429110
Vertical Microprobes for Contacting Electronic Components and Method for Making Such Probes Apr 22, 2009 Abandoned
Array ( [id] => 7535858 [patent_doc_number] => 08049492 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-11-01 [patent_title] => 'Position measuring apparatus' [patent_app_type] => utility [patent_app_number] => 12/384372 [patent_app_country] => US [patent_app_date] => 2009-04-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2425 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/049/08049492.pdf [firstpage_image] =>[orig_patent_app_number] => 12384372 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/384372
Position measuring apparatus Apr 1, 2009 Issued
Array ( [id] => 6287191 [patent_doc_number] => 20100237875 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-23 [patent_title] => 'Unified brake and light tester' [patent_app_type] => utility [patent_app_number] => 12/382522 [patent_app_country] => US [patent_app_date] => 2009-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2650 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0237/20100237875.pdf [firstpage_image] =>[orig_patent_app_number] => 12382522 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/382522
Unified brake and light tester Mar 17, 2009 Abandoned
Array ( [id] => 9047474 [patent_doc_number] => 08542028 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-09-24 [patent_title] => 'Inspection circuit, electro-optic device, and electronic apparatus' [patent_app_type] => utility [patent_app_number] => 12/405368 [patent_app_country] => US [patent_app_date] => 2009-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 8223 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 209 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12405368 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/405368
Inspection circuit, electro-optic device, and electronic apparatus Mar 16, 2009 Issued
Array ( [id] => 5401782 [patent_doc_number] => 20090237095 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-09-24 [patent_title] => 'METHOD AND DEVICE FOR MEASURING POWDER PROPERTIES' [patent_app_type] => utility [patent_app_number] => 12/403702 [patent_app_country] => US [patent_app_date] => 2009-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5312 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0237/20090237095.pdf [firstpage_image] =>[orig_patent_app_number] => 12403702 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/403702
Method and device for measuring powder properties Mar 12, 2009 Issued
Array ( [id] => 5340979 [patent_doc_number] => 20090179629 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-16 [patent_title] => 'On-chip current sensing methods and systems' [patent_app_type] => utility [patent_app_number] => 12/382286 [patent_app_country] => US [patent_app_date] => 2009-03-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4855 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0179/20090179629.pdf [firstpage_image] =>[orig_patent_app_number] => 12382286 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/382286
On-chip current sensing methods and systems Mar 11, 2009 Issued
Array ( [id] => 4477862 [patent_doc_number] => 07868631 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-01-11 [patent_title] => 'Solar cell testing apparatus' [patent_app_type] => utility [patent_app_number] => 12/395712 [patent_app_country] => US [patent_app_date] => 2009-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3381 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/868/07868631.pdf [firstpage_image] =>[orig_patent_app_number] => 12395712 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/395712
Solar cell testing apparatus Mar 1, 2009 Issued
Array ( [id] => 5512502 [patent_doc_number] => 20090212806 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-08-27 [patent_title] => 'System for Making Contact Between a Transmit/Receive Module and a Testing Device' [patent_app_type] => utility [patent_app_number] => 12/392712 [patent_app_country] => US [patent_app_date] => 2009-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2912 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0212/20090212806.pdf [firstpage_image] =>[orig_patent_app_number] => 12392712 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/392712
System for making contact between a transmit/receive module and a testing device Feb 24, 2009 Issued
Array ( [id] => 4576794 [patent_doc_number] => 07859283 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-12-28 [patent_title] => 'Probe apparatus, probing method, and storage medium' [patent_app_type] => utility [patent_app_number] => 12/389913 [patent_app_country] => US [patent_app_date] => 2009-02-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 35 [patent_no_of_words] => 7403 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 306 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/859/07859283.pdf [firstpage_image] =>[orig_patent_app_number] => 12389913 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/389913
Probe apparatus, probing method, and storage medium Feb 19, 2009 Issued
Array ( [id] => 8422470 [patent_doc_number] => 08278959 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-10-02 [patent_title] => 'Method and system for measuring laser induced phenomena changes in a semiconductor device' [patent_app_type] => utility [patent_app_number] => 12/372914 [patent_app_country] => US [patent_app_date] => 2009-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3130 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12372914 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/372914
Method and system for measuring laser induced phenomena changes in a semiconductor device Feb 17, 2009 Issued
Array ( [id] => 4528290 [patent_doc_number] => 07952378 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-05-31 [patent_title] => 'Tunable stress technique for reliability degradation measurement' [patent_app_type] => utility [patent_app_number] => 12/358510 [patent_app_country] => US [patent_app_date] => 2009-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 5726 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/952/07952378.pdf [firstpage_image] =>[orig_patent_app_number] => 12358510 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/358510
Tunable stress technique for reliability degradation measurement Jan 22, 2009 Issued
Array ( [id] => 6193604 [patent_doc_number] => 20110025358 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-03 [patent_title] => 'PROBE UNIT' [patent_app_type] => utility [patent_app_number] => 12/735598 [patent_app_country] => US [patent_app_date] => 2009-01-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5288 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0025/20110025358.pdf [firstpage_image] =>[orig_patent_app_number] => 12735598 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/735598
Probe unit Jan 21, 2009 Issued
Array ( [id] => 6305833 [patent_doc_number] => 20100109661 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-05-06 [patent_title] => 'HALL-EFFECT SWITCH CIRCUIT ALLOWING LOW VOLTAGE OPERATION' [patent_app_type] => utility [patent_app_number] => 12/355042 [patent_app_country] => US [patent_app_date] => 2009-01-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2553 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20100109661.pdf [firstpage_image] =>[orig_patent_app_number] => 12355042 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/355042
Hall-effect switch circuit allowing low voltage operation Jan 15, 2009 Issued
Array ( [id] => 124532 [patent_doc_number] => 07705623 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-04-27 [patent_title] => 'Method and device for detecting interlaminar short circuits' [patent_app_type] => utility [patent_app_number] => 12/352923 [patent_app_country] => US [patent_app_date] => 2009-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 6365 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/705/07705623.pdf [firstpage_image] =>[orig_patent_app_number] => 12352923 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/352923
Method and device for detecting interlaminar short circuits Jan 12, 2009 Issued
Array ( [id] => 5328384 [patent_doc_number] => 20090108861 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-30 [patent_title] => 'STIFFENER ASSEMBLY FOR USE WITH TESTING DEVICES' [patent_app_type] => utility [patent_app_number] => 12/345740 [patent_app_country] => US [patent_app_date] => 2008-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5404 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0108/20090108861.pdf [firstpage_image] =>[orig_patent_app_number] => 12345740 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/345740
Stiffener assembly for use with testing devices Dec 29, 2008 Issued
Array ( [id] => 4436180 [patent_doc_number] => 07898277 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-03-01 [patent_title] => 'Hot-electronic injection testing of transistors on a wafer' [patent_app_type] => utility [patent_app_number] => 12/344016 [patent_app_country] => US [patent_app_date] => 2008-12-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3499 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 235 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/898/07898277.pdf [firstpage_image] =>[orig_patent_app_number] => 12344016 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/344016
Hot-electronic injection testing of transistors on a wafer Dec 23, 2008 Issued
Array ( [id] => 6282601 [patent_doc_number] => 20100156519 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-24 [patent_title] => 'ELECTRICAL SYSTEM, VOLTAGE REFERENCE GENERATION CIRCUIT, AND CALIBRATION METHOD OF THE CIRCUIT' [patent_app_type] => utility [patent_app_number] => 12/340110 [patent_app_country] => US [patent_app_date] => 2008-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3871 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0156/20100156519.pdf [firstpage_image] =>[orig_patent_app_number] => 12340110 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/340110
Electrical system, voltage reference generation circuit, and calibration method of the circuit Dec 18, 2008 Issued
Array ( [id] => 7535853 [patent_doc_number] => 08049487 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-11-01 [patent_title] => 'Power measurement circuit' [patent_app_type] => utility [patent_app_number] => 12/338235 [patent_app_country] => US [patent_app_date] => 2008-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 19 [patent_no_of_words] => 3671 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/049/08049487.pdf [firstpage_image] =>[orig_patent_app_number] => 12338235 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/338235
Power measurement circuit Dec 17, 2008 Issued
Array ( [id] => 5432508 [patent_doc_number] => 20090167094 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-02 [patent_title] => 'VOLTAGE ADJUSTING CIRCUITS AND VOLTAGE ADJUSTING METHODS' [patent_app_type] => utility [patent_app_number] => 12/335062 [patent_app_country] => US [patent_app_date] => 2008-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3061 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0167/20090167094.pdf [firstpage_image] =>[orig_patent_app_number] => 12335062 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/335062
Voltage adjusting circuits and voltage adjusting methods Dec 14, 2008 Issued
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